Dan A. Steigerwald

High dislocation densities in high efficiency GaN‐based light‐emitting diodes

The electrical, optical, and structural properties of light emitting diodes (LEDs) fabricated from the III–V nitride material system have been studied. LEDs with external quantum efficiencies as high as 4% were characterized by transmission electron microscopy and found to contain dislocation densities in excess of 2×1010 cm−2. A comparison to other III–V arsenide and phosphide LEDs shows that minority carries in GaN‐based LEDs are remarkably insensitive to the presence of structural defects. Dislocations do not act as efficient nonradiative recombination sites in nitride materials. It is hypothesized that the benign character of dislocations arises from the ionic nature of bonding in the III–V nitrides.

High-power AlGaInN flip-chip light-emitting diodes

Data are presented on high-power AlGaInN flip-chip light-emitting diodes (FCLEDs). The FCLED is “flipped-over” or inverted compared to conventional AlGaInN light-emitting diodes (LEDs), and light is extracted through the transparent sapphire substrate. This avoids light absorption from the semitransparent metal contact in conventional epitaxial-up designs. The power FCLED has a large emitting area (∼0.70 mm2) and an optimized contacting scheme allowing high current (200–1000 mA, J∼30–143 A/cm2) operation with low forward voltages (∼2.8 V at 200 mA), and therefore higher power conversion (“wall-plug”) efficiencies. The improved extraction efficiency of the FCLED provides 1.6 times more light compared to top-emitting power LEDs and ten times more light than conventional small-area (∼0.07 mm2) LEDs. FCLEDs in the blue wavelength regime (∼435 nm peak) exhibit ∼21% external quantum efficiency and ∼20% wall-plug efficiency at 200 mA and with record light output powers of 400 mW at 1.0 A.

Very high‐efficiency semiconductor wafer‐bonded transparent‐substrate (AlxGa1−x)0.5In0.5P/GaP light‐emitting diodes

Data are presented demonstrating the operation of transparent‐substrate (TS) (AlxGa1−x)0.5In0.5P/GaP light‐emitting diodes (LEDs) whose efficiency exceeds that afforded by all other current LED technologies in the green to red (560–630 nm) spectral regime. A maximum luminous efficiency of 41.5 lm/W (93.2 lm/A) is realized at λ∼604 nm (20 mA, direct current). The TS (AlxGa1−x)0.5In0.5P/GaP LEDs are fabricated by selectively removing the absorbing n‐type GaAs substrate of a p‐n (AlxGa1−x)0.5In0.5P double heterostructure LED and wafer bonding a ‘‘transparent’’ n‐GaP substrate in its place. The resulting TS (AlxGa1−x)0.5In0.5P/GaP LED lamps exhibit a twofold improvement in light output compared to absorbing‐substrate (AS) (AlxGa1−x)0.5In0.5P/GaAs lamps.

High Power LEDs – Technology Status and Market Applications

High power light emitting diodes (LEDs) continue to increase in output flux with the best III-nitride based devices today emitting over 150 lm of white, cyan, or green light. The key design features of such products will be covered with special emphasis on power packaging, flip-chip device design, and phosphor coating technology. The high-flux performance of these devices is enabling many new applications for LEDs. Two of the most interesting of these applications are LCD display backlighting and vehicle forward lighting. The advantages of LEDs over competing lighting technologies will be covered in detail.

Performance of High‐Power AlInGaN Light Emitting Diodes

The performance of high-power AlInGaN light emitting diodes (LEDs) is characterized by light output-current-voltage (L-I-V) measurements for devices with peak emission wavelengths ranging from 428 to 545 nm. The highest external quantum efficiency (EQE) is measured for short wavelength LEDs (428 nm) at 29%. EQE decreases with increasing wavelength, reaching 13% at 527 nm. With low forward voltages ranging from 3.3 to 2.9 V at a drive current density of 50 A/cm 2 , these LEDs exhibit power conversion efficiencies ranging from 26% (428 nm) to 10% (527 nm).

High‐Power III‐Nitride Emitters for Solid‐State Lighting

High-power, large-area InGaN/GaN quantum-well heterostructure light-emitting diodes based on an inverted, or flip-chip, configuration are described. These devices are mounted in specially designed high-power (1-5 W) packages and exhibit high extraction efficiency and low operating voltage. In the blue wavelength regime, output powers greater than 250 mW (1 x 1 mm 2 device) and 1 W (2 x 2 mm 2 device) are delivered at standard operating current densities (50 A/cm 2 ), corresponding to wall-plug efficiencies of 22%-23%. Employing phosphors for the generation of white light, these same devices achieve luminous efficiencies greater than 30 lm/W.

GAIN SPECTROSCOPY ON INGAN/GAN QUANTUM WELL DIODES

We have investigated spectroscopically the emergence of gain in InGaN/GaN quantum well diodes under high current injection (>kA/cm2). The spectral characteristics suggest that the electronic states responsible for blue laser action in this material are strongly influenced by the presence of microscopic crystalline disorder.

High-brightness AlGaInN light-emitting diodes

Currently, commercial LEDs based on AlGaInN emit light efficiently from the ultraviolet-blue to the green portion of the visible wavelength spectrum. Data are presented on AlGaInN LEDs grown by organometallic vapor phase epitaxy (OMVPE). Designs for high-power AlGaInN LEDs are presented along with their performance in terms of output power and efficiency. Finally, present and potential applications for high-power AlGaInN LEDs, including traffic signals and contour lighting, are discussed.

Green phosphor-converted LED

Green phosphor-converted LEDs using a blue pump InGaN diodes have advantages over the direct green InGaN LED with regards to color stability with drive and/or temperature. Added manufacturing steps are outweighed by higher color yield, as a range of pump colors can be used without changing the final chromaticity. The conversion losses can be smaller than the decrease in wall-plug efficiency from blue towards green, which has been reported by many sources. A distinct disadvantage of the concept is due to only one color and phosphor proven - SrGa2S4:Eu2+ and 535 nm peak wavelength.

High-flux and high-efficiency nitride-based light-emitting devices

There are numerous materials challenges involved in the production of high-efficiency III-nitride lasers and LEDs, some of which can be mitigated by epitaxy and device physics. The lack of a suitable lattice-matched substrate for epitaxy of AlInGaN films results in high dislocation densities and a large amount of residual strain in the deposited films. The role of the dislocations is not well-understood, although there is clear evidence that laser reliability is improved by reducing their density.