Daniel Joseph Moore

Melody composer and arranger

A method and system for automatically generating an entire musical arrangement including melody and accompaniment on a computer. The invention combines predetermined, short musical phrases modified by selection of random parameters to produce a data stream that can be used to drive a MIDI synthesizer and generate music.

Three dimensional speech synthesis

Method, product and system alters audio data for a synthesized voice so that when it is produced on a speaker system, it appears to emanate from a spatial position. First, the voice is synthesized into a speech waveform from a set of stored data representative of a text string using standard techniques. The speech waveform is converted into analog signals for a right and left channel. According to the invention, the analog signals to the right and left channels are altered according to position data stored with the text string so that the synthesized voice appears to originate at the apparent spatial position when the analog signals are sent to a speaker system.

What Is Nanotechnology and Why Does It Matter

Nanotechnology has in various ways been regarded as a technology that promises both innovations and risks and that has the potential to profoundly change the world. Yet for many people there are still two questions that remain unanswered: just what is nanotechnology, and why does it matter? What is nanotechnology and why does it matter?: from science to ethics, by a nanoscientist and two philosophers, aims to give the reader a balanced and informed understanding of this important technology. The book not only focuses on providing the reader with normative reasons around why nanotechnology matters, such as its social impact and ethics, but also offers an accurate and generally accessible analysis of the science involved, highlighting what nanotechnology actually is and why it matters in terms of the applications and features that make it relevant. The book serves as a useful introduction to nanotechnology for those who know little about the subject but wish to learn about the impact this technology could have on their lives and about the ethical issues it raises. The book is for the most part easily accessible, with the exception of some of the first chapters in Unit 1 which could come across as overly technical. However, this may be viewed as a positive feature, rather than a negative one, given that few books that discuss the ethical and social issues of nanotechnology offer such a comprehensive review of the science behind nanotechnology. This review of the science behind nanotechnology is indeed a main strength of this book by Allhoff et al., as it is here that a framework is established that permits a better understanding of the societal and ethical issues covered in the subsequent units. In a wider sense, the book can be recommended to both scientists and non-scientists alike, since it deals with a wide range of the questions and problems that are the subject of current debate. The book is divided into three units. The first focuses on the science behind nanotechnology. In the second the authors provide frameworks that allow an evaluation of the specific ethical and social issues to be discussed in the final unit, including military, medical and enhancement-related applications. The first unit entitled ‘What is nanotechnology?’ Begins with a chapter that attempts to explain the basic principles of nanotechnology to the reader, addressing definitions and scales, the origins of nanotechnology, the current state and future of nanotechnology, as well as issues relating to nanotechnology in nature and its applications. As the authors state: “Nanotechnology has not only been present in nature, but has also been used unwittingly in human-made technology for centuries” (p.18). The second chapter focuses on the “tools of the trade” that are used in nanotechnologies and discusses the basic governing theories that have affected them. Reference is made to the development of the electron microscope and to scanning probe microscopy in the context of the former, and to quantum mechanics, Nanoethics (2014) 8:211–213 DOI 10.1007/s11569-014-0196-8

Multimedia presentation development using the audio visual connection

This paper describes the technology behind the creation of multimedia presentations using a new IBM program product, the Audio Visual Connection® (AVC™). The multimedia approach represents a major innovation in computer technology involving new concepts such as the digitization of audio and video, the involvement of the Musical Instrument Digital Interface (MIDI), and the creation of a multimedia story. Two hardware adapters support the AVC: the Audio Capture and Playback Adapter and the Video Capture Adapter. When used with these adapters, the AVC digitizes both stereo audio and color video, performs powerful edit and synchronization functions, defines an interactive user environment, and creates a multimedia presentation using standard IBM Personal System/2® hardware. Additional input is available from MIDI song files, screen capture, and non-AVC image systems. Final results range from passive presentations to interactive applications to sophisticated database front ends.

Concerning the influence of pattern symmetry on CD-SEM local overlay measurements for double patterning of complex shapes

We have developed a new local overlay measurement technique on actual device patterns using critical dimension scanning electron microscope (CD-SEM), which can be applied to 2D device structures such as an SRAM contact hole array or more complex shapes. CD-SEM overlay measurement can provide additional local overlay information at the site of device patterns, complementary to the conventional optical overlay data. The methodology includes the use of symmetrically arranged patterns to cancel out many process effects and reduce measurement uncertainty. The developed methodology was applied to local overlay measurement of double patterning contact hole layers of leading edge devices. Local overlay distribution was successfully captured on device structures on different length scale, and the result shows the possibility of assessing process induced shift on device structures and collecting denser sampling for better intra-chip overlay control. The measurement uncertainty of CD-SEM overlay metrology was assessed by comparing with conventional optical overlay metrology for 1D and 2D structures. Very good correlation was confirmed between SEM and optical overlay metrology with net residual error of ~1.1nm. Measurement variation associated with pattern roughness was analyzed for 1D structure, and identified as one of major variation sources for CD-SEM overlay metrology.

Teletex: a worldwide link among office systems for electronic document exchange

Teletex is a new international telecommunication service that provides direct electronic document exchange between such office text machines as electronic typewriters and word processors that are equipped with transmitting and receiving storages. Teletex is an international standard aimed at integrating office products and worldwide telecommunication. It represents a major step in the development of the office of the future. This paper traces the development of Teletex, describes its characteristics, and looks at how this service may be extended in the future.

Critical dimension scanning electron microscope local overlay measurement and its application for double patterning of complex shapes

We have developed a new local overlay measurement technique on actual device patterns using a critical dimension scanning electron microscope (CD-SEM), which can be applied to two-dimensional (2D) device structures such as a static random access memory contact hole array. CD-SEM overlay measurement can provide additional local overlay information at the site of device patterns, complementary to the optical overlay. The methodology includes the use of pattern symmetry to cancel out many process effects and reduce measurement uncertainty. CD-SEM overlay metrology was compared with conventional optical overlay metrology in terms of measurement uncertainty and overlay model analysis, and very good correlation was confirmed. The developed methodology was applied to local overlay measurement of double patterning contact hole layers of leading edge devices. The local overlay distribution was obtained across the device area, and spatial correlation of the overlay error vectors was examined over a large range of distances. The applications of CD-SEM overlay metrology were explored, and methodologies were introduced to examine both the overlay of double patterning contacts at the edge of an array and lithographic process-induced overlay shift of contacts. Finally, a hybrid optical CD-SEM overlay metrology was introduced in order to capture a high order, device weighted overlay response.

Spatial signature in local overlay measurements: what CD-SEM can tell us and optical measurements can not

This work explores the applications of CD-SEM overlay metrology for double patterned one-dimensional (1D) pitch split features as well as double patterned ensembles of two-dimensional (2D) complex shapes. Overlay model analysis of both optical overlay and CD-SEM is compared and found to give nearly equivalent results. Spatial correlation of the overlay vectors is examined over a large range of spatial distances. The smallest spatial distances are shown to have the highest degree of correlation. Correlation studies of local overlay in a globally uniform environment, suggest that the smallest sampling of overlay vectors need to be ~10-15μm, within the spatial sampling of this experiment. The smallest spatial distances are also found to have to tightest mean distributions. The distribution width of the CD-SEM overlay is found to scale linearly with log of the spatial distances over 4-5 orders of magnitude of spatial length. Methodologies are introduced to examine both the overlay of double pattern contacts at the edge of an array and lithographic process-induced overlay shift of contacts. Finally, a hybrid optical- CD-SEM overlay metrology is introduced in order to capture a high order, device weighted overlay response.

Multimedia Presentation Techniques and Technology

Publisher Summary This chapter focuses on multimedia presentation techniques and technology. Multimedia may be considered as the integration of the human senses into a computer environment for the purpose of improving communication between the computer and its user, and among the users. Computer based multimedia affects all three major components of a computer system: hardware, operating system, and software applications. The hardware must be able to store, move, and present video and audio information which imposes a heavy burden on the computers processing power. The operating system must provide real time control over the video and audio data so as to synchronize their presentation. The software applications must be created to take advantage of video and audio. Computer files containing image and audio data appear similar to other files used in a computer. Multimedia files can be copied, listed, and transported over a network like a word processing file.