Daniel Perry

Electrostatically defined silicon quantum dots with counted antimony donor implants

Deterministic control over the location and number of donors is crucial to donor spin quantum bits (qubits) in semiconductor based quantum computing. In this work, a focused ion beam is used to implant antimony donors in 100 nm × 150 nm windows straddling quantum dots. Ion detectors are integrated next to the quantum dots to sense the implants. The numbers of donors implanted can be counted to a precision of a single ion. In low-temperature transport measurements, regular Coulomb blockade is observed from the quantum dots. Charge offsets indicative of donor ionization are also observed in devices with counted donor implants.

Ion implantation for deterministic single atom devices

We demonstrate a capability of deterministic doping at the single atom level using a combination of direct write focused ion beam and solid-state ion detectors. The focused ion beam system can position a single ion to within 35 nm of a targeted location and the detection system is sensitive to single low energy heavy ions. This platform can be used to deterministically fabricate single atom devices in materials where the nanostructure and ion detectors can be integrated, including donor-based qubits in Si and color centers in diamond.

Accuracy and precision in broadband laser ranging

Broadband laser ranging uses spectral interferometry and a dispersive Fourier transform to perform high repetition rate position measurements of explosively-driven surfaces typically moving at several km/s. A broadband fiber laser and fiber interferometer record distance as a relative delay between short pulses, and the beat spectrum of the pulses is mapped into the time domain via long propagation in dispersive fiber. Optical amplification and a fast oscilloscope allow the dispersed spectrum to be recorded in real-time, often at measurement rates of 20-40 MHz. The third-order phase of the dispersive fiber causes distortions in mapping the spectrum into time that must be compensated for when analyzing the measured data. We characterize the accuracy and precision of BLR systems by performing a scan of static positions and comparing our single-shot measurements against position measurements from a commercial Michelson interferometer. We demonstrate a combination of hardware and data analysis that measures position to within 30 microns over a 27 cm range with very high precision.