Daniel Platz

Intermodulation atomic force microscopy

A mode of atomic force microscopy AFM is demonstrated where an oscillating AFM cantileverhaving linear response is driven with two frequencies in the vicinity of a resonance. Newfrequencies in th ...

Interaction imaging with amplitude-dependence force spectroscopy

Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic AFM has been enormously successful in imaging surface topography, even to atomic resolution, but the force between the AFM tip and the surface remains unknown during imaging. Here we present a new approach that combines high-accuracy force measurements and high-resolution scanning. The method, called amplitude-dependence force spectroscopy (ADFS), is based on the amplitude dependence of the cantilevers response near resonance and allows for separate determination of both conservative and dissipative tip-surface interactions. We use ADFS to quantitatively study and map the nano-mechanical interaction between the AFM tip and heterogeneous polymer surfaces. ADFS is compatible with commercial atomic force microscopes and we anticipate its widespread use in taking AFM toward quantitative microscopy.

Reconstructing Nonlinearities with Intermodulation Spectroscopy

We describe a method of analysis which allows for reconstructing the nonlinear disturbance of a high Q harmonic oscillator. When the oscillator is driven with two or more frequencies, the nonlinearity causes intermodulation of the drives, resulting in a complicated spectral response. Analysis of this spectrum allows one to approximate the nonlinearity. The method, which is generally applicable to measurements based on resonant detection, increases the information content of the measurement without requiring a large detection bandwidth, and optimally uses the enhanced sensitivity near resonance to extract information and minimize error due to detector noise.

The role of nonlinear dynamics in quantitative atomic force microscopy

Various methods of force measurement with the atomic force microscope are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation, or the frequency mixing of multiple drive tones by the nonlinear tip-surface force, can be used to concentrate the nonlinear motion in a narrow band of frequency near the cantilevers fundamental resonance, where accuracy and sensitivity of force measurement are greatest. Two different methods for reconstructing tip-surface forces from intermodulation spectra are explained. The reconstruction of both conservative and dissipative tip-surface interactions from intermodulation spectra are demonstrated on simulated data.

Note: The intermodulation lockin analyzer

Nonlinear systems can be probed by driving them with two or more pure tones while measuring the intermodulation products of the drive tones in the response. We describe a digital lockin analyzer which is designed explicitly for this purpose. The analyzer is implemented on a field-programmable gate array, providing speed in analysis, real-time feedback, and stability in operation. The use of the analyzer is demonstrated for intermodulation atomic force microscopy. A generalization of the intermodulation spectral technique to arbitrary drive waveforms is discussed.

Probing viscoelastic response of soft material surfaces at the nanoscale

We study the interaction between an AFM tip and a soft viscoelastic surface. Using a multifrequency method we measure the amplitude-dependence of the cantilever dynamic force quadratures, which clearly show the effect of finite relaxation time of the viscoelastic surface. A model is introduced which treats the tip and surface as a two-body dynamic problem with a nonlinear interaction depending on their separation. We find good agreement between simulations of this model and experimental data on polymer blend samples for a variety of materials and measurement conditions.

Phase imaging with intermodulation atomic force microscopy

Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive tones and generates new frequency components in the cantilever response known as intermodulation products (IMPs). We present a procedure for extracting the phase at each IMP and demonstrate phase images made by recording this phase while scanning. Amplitude and phase images at intermodulation frequencies exhibit enhanced topographic and material contrast.

Reconstruction of tip-surface interactions with multimodal intermodulation atomic force microscopy

We propose a theoretical framework for reconstructing tip-surface interactions using the intermodulation technique when more than one eigenmode is required to describe the cantilever motion. Two particular cases of bimodal motion are studied numerically: one bending and one torsional mode, and two bending modes. We demonstrate the possibility of accurate reconstruction of a two-dimensional conservative force field for the former case, while dissipative forces are studied for the latter.

Determining surface properties with bimodal and multimodal AFM

Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two or more resonance frequencies. Such excitation schemes result in one additional amplitude and phase images for each driven resonance, and potentially convey more information about the surface under investigation. Here we present a theoretical basis for using this information to approximate the parameters of a tip-surface interaction model. The theory is verified by simulations with added noise corresponding to room-temperature measurements.

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

Summary Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show, by a separation of time scales, that such motion is equivalent to rapid oscillations at the cantilever resonance with a slow amplitude and phase or frequency modulation. With this time-domain perspective, we analyze single oscillation cycles in ImAFM to extract the Fourier components of the tip–surface force that are in-phase with the tip motion (F I) and quadrature to the motion (F Q). Traditionally, these force components have been considered as a function of the static-probe height only. Here we show that F I and F Q actually depend on both static-probe height and oscillation amplitude. We demonstrate on simulated data how to reconstruct the amplitude dependence of F I and F Q from a single ImAFM measurement. Furthermore, we introduce ImAFM approach measurements with which we reconstruct the full amplitude and probe-height dependence of the force components F I and F Q, providing deeper insight into the tip–surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface.