David Tar-Wei Wang

An Algorithm for the Generation of Test Sets for Combinational Logic Networks

An algorithm is developed for generating a single-fault detection test set to be used in a combinational logic network. This algorithm has two unique characteristics. 1) When a test is generated, a list of faults detected by this test is available. Fault simulation, therefore, is not required after the test has been generated. 2) It generates a test set rather than a single test. Each test, with the exception of the first one, is based on a previous test. Repetition of effort and overlapped coverage of faults for different test generations are thus reduced.

Properties of Faults and Criticalities of Values under Tests for Combinational Networks

This correspondence discusses the properties of faults in combinational networks and their relationships with fault-detection and fault-location test sets.