Davide Sangiovanni
Linköping University
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Publication
Featured researches published by Davide Sangiovanni.
APL Materials | 2013
Hanna Kindlund; Davide Sangiovanni; L. Martínez-de-Olcoz; Jun Lu; Jens Jensen; Jens Birch; Ivan Petrov; J. E. Greene; Valeriu Chirita; Lars Hultman
Hardness is an essential property for a wide range of applications. However, hardness alone, typically accompanied by brittleness, is not sufficient to prevent failure in ceramic films exposed to h ...
Journal of Vacuum Science and Technology | 2016
Daniel Edström; Davide Sangiovanni; Lars Hultman; Ivan Petrov; J. E. Greene; Valeriu Chirita
Large-scale classical molecular dynamics simulations of epitaxial TiN/TiN(001) thin film growth at 1200K are carried out using incident flux ratios N/Ti -1, 2, and 4. The films are analyzed as a fu ...
Journal of Vacuum Science and Technology | 2017
M. Mikula; Martin Truchlý; Davide Sangiovanni; Dušan Plašienka; T. Roch; Maros Gregor; Pavol Ďurina; Marián Janík; P. Kúš
Design of hard ceramic material coatings with enhanced toughness, which prevents crack formation/propagation leading to brittle failure during application, is a primary industrial requirement. In this work, experimental methods supported by ab initio density functional theory (DFT) calculations and electronic structure analyses are used to investigate the mechanical behavior of magnetron sputtered Ti-Al-Ta-N hard coatings. The as-deposited Ti1-x-yAlxTayN (y = 0–0.60) films exhibit a single phase cubic sodium chloride (B1) structure identified as TiAl(Ta)N solid solutions. While the hardness H of Ti0.46Al0.54N (32.5 ± 2 GPa) is not significantly affected by alloying with TaN (H of the quaternary nitrides varies between 26 ± 2 and 35 ± 4 GPa), the elastic stiffness monotonically decreases from 442 to 354 GPa with increasing Ta contents, which indicates improved toughness in TiAlTaN. Consistent with the experimental findings, the DFT results show that Ta substitutions in TiAlN reduce the shear resistance due...
Journal of Applied Physics | 2017
Daniel Edström; Davide Sangiovanni; Lars Hultman; Ivan Petrov; J. E. Greene; Valeriu Chirita
Large-scale classical molecular dynamics simulations of epitaxial TiN/TiN(001) thin film growth at 1200 K, a temperature within the optimal range for epitaxial TiN growth, with an incident N-to-Ti flux ratio of four, are carried out using incident N energies EN = 2 and 10 eV and incident Ti energy ETi = 2 eV. To further highlight the effect of EN, we grow a bilayer film with EN = 2 eV initially and then switch to EN = 10 eV. As-deposited layers are analyzed as a function of composition, island-size distribution, island-edge orientation, and vacancy formation. Results show that growth with EN = 2 eV results in films that are globally overstoichiometric with islands bounded by N-terminated polar 110 edges, whereas films grown with EN = 10 eV are flatter and closer to stoichiometric. However, EN = 10 eV layers exhibit local N deficiency leading to the formation of isolated 111-oriented islands. Films grown by changing the incident energy from 2 to 10 eV during growth are more compact than those grown entirel...
Physical Review B | 2018
Davide Sangiovanni; A. B. Mei; Daniel Edström; Lars Hultman; Valeriu Chirita; Ivan Petrov; J. E. Greene
We carried out density-functional ab initio molecular dynamics (AIMD) simulations of Ti adatom (
Journal of Applied Physics | 2017
M. Mikula; Davide Sangiovanni; Dušan Plašienka; T. Roch; M. Caplovicova; Martin Truchly; Leonid Satrapinskyy; R. Bystricky; D. Tonhauzerova; D. Vlčková; P. Kúš
\mathrm{T}{\mathrm{i}}_{\mathrm{ad}}
Journal of Materials Chemistry C | 2016
A. B. Mei; M. Tuteja; Davide Sangiovanni; Rick Haasch; A. Rockett; Lars Hultman; Ivan Petrov; J. E. Greene
) migration on, and descent from, square
Physical Review B | 2016
Davide Sangiovanni; Olle Hellman; Björn Alling; Igor A. Abrikosov
\mathrm{TiN}\ensuremath{\langle}100\ensuremath{\rangle}
Physical Review B | 2010
Davide Sangiovanni; Valeriu Chirita; Lars Hultman
epitaxial islands on TiN(001) at temperatures (
Physical Review B | 2010
Davide Sangiovanni; Valeriu Chirita; Lars Hultman
T