Ivan Petrov
Linköping University
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Ivan Petrov.
Journal of Vacuum Science and Technology | 2012
Grzegorz Greczynski; Jun Lu; Jens Jensen; Ivan Petrov; J. E. Greene; Stephan Bolz; Werner Kölker; Christoph Schiffers; Oliver Lemmer; Lars Hultman
Metastable NaCl-structure Ti1-xAlxN is employed as a model system to probe the effects of metal versus rare-gas ion irradiation during film growth using reactive high-power pulsed magnetron sputter ...
APL Materials | 2013
Hanna Kindlund; Davide Sangiovanni; L. Martínez-de-Olcoz; Jun Lu; Jens Jensen; Jens Birch; Ivan Petrov; J. E. Greene; Valeriu Chirita; Lars Hultman
Hardness is an essential property for a wide range of applications. However, hardness alone, typically accompanied by brittleness, is not sufficient to prevent failure in ceramic films exposed to h ...
Physical Review B | 2012
Björn Alling; Peter Steneget; Christopher Tholander; Ferenc Tasnádi; Ivan Petrov; J. E. Greene; Lars Hultman
We use metastable NaCl-structure Ti0.5Al0.5N alloys to probe effects of configurational disorder on adatom surface diffusion dynamics which control phase stability and nanostructural evolution during film growth. First-principles calculations were employed to obtain potential energy maps of Ti and Al adsorption on an ordered TiN(001) reference surface and a disordered Ti0.5Al0.5N(001) solid-solution surface. The energetics of adatom migration on these surfaces are determined and compared in order to isolate effects of configurational disorder. The results show that alloy surface disorder dramatically reduces Ti adatom mobilities. Al adatoms, in sharp contrast, experience only small disorder-induced differences in migration dynamics.
Journal of Vacuum Science and Technology | 2014
Grzegorz Greczynski; Jun Lu; Stephan Bolz; Werner Kölker; Christoph Schiffers; Oliver Lemmer; Ivan Petrov; J. E. Greene; Lars Hultman
Growth of fully dense refractory thin films by means of physical vapor deposition (PVD) requires elevated temperatures Ts to ensure sufficient adatom mobilities. Films grown with no external heating are underdense, as demonstrated by the open voids visible in cross-sectional transmission electron microscopy images and by x-ray reflectivity results; thus, the layers exhibit low nanoindentation hardness and elastic modulus values. Ion bombardment of the growing film surface is often used to enhance densification; however, the required ion energies typically extract a steep price in the form of residual rare-gas-ion-induced compressive stress. Here, the authors propose a PVD strategy for the growth of dense, hard, and stress-free refractory thin films at low temperatures; that is, with no external heating. The authors use TiN as a model ceramic materials system and employ hybrid high-power pulsed and dc magnetron co-sputtering (HIPIMS and DCMS) in Ar/N2 mixtures to grow dilute Ti1−xTaxN alloys on Si(001) sub...
Journal of Applied Physics | 2014
A. B. Mei; Richard Wilson; Dongyao Li; David G. Cahill; A. Rockett; Jens Birch; Lars Hultman; J. E. Greene; Ivan Petrov
Elastic constants are determined for single-crystal stoichiometric NaCl-structure VN(001), VN(011), and VN(111) epitaxial layers grown by magnetically unbalanced reactive magnetron sputter deposition on 001-, 011-, and 111-oriented MgO substrates at 430u2009°C. The relaxed lattice parameter aou2009=u20090.4134u2009±u20090.0004u2009nm, obtained from high-resolution reciprocal space maps, and the mass density ρu2009=u20096.1u2009g/cm3, determined from the combination of Rutherford backscattering spectroscopy and film thickness measurements, of the VN layers are both in good agreement with reported values for bulk crystals. Sub-picosecond ultrasonic optical pump/probe techniques are used to generate and detect VN longitudinal sound waves with measured velocities v001u2009=u20099.8u2009±u20090.3, v011u2009=u20099.1u2009±u20090.3, and v111u2009=u20099.1u2009±u20090.3u2009km/s. The VN c11 elastic constant is determined from the sound wave velocity measurements as 585u2009±u200930u2009GPa; the c44 elastic constant, 126u2009±u20093u2009GPa, is obtained from surface acoustic wave measurements. From the combination of c11, c44, vhkl, and ρ we obtain the VN c12 elastic constant 178u2009±u200933u2009GPa, the VN elastic anisotropy Au2009=u20090.62, the isotropic Poisson ratio νu2009=u20090.29, and the anisotropic Poisson ratios ν001u2009=u20090.23, ν011u2009=u20090.30, and ν111u2009=u20090.29.
APL Materials | 2013
Naureen Ghafoor; Lars Johnson; Dmitri O. Klenov; Jelly Demeulemeester; P. Desjardins; Ivan Petrov; Lars Hultman; Magnus Odén
Self-organization on the nanometer scale is a trend in materials research. Thermodynamic driving forces may, for example, yield chessboard patterns in metal alloys [Y. Ni and A. G. Khachaturyan, Nature Mater. 8, 410–414 (2009)]10.1038/nmat2431 or nitrides [P. H. Mayrhofer, A. Horling, L. Karlsson, J. Sjolen, T. Larsson, and C. Mitterer, Appl. Phys. Lett. 83, 2049 (2003)]10.1063/1.1608464 during spinodal decomposition. Here, we explore the ZrN-AlN system, which has one of the largest positive enthalpies of mixing among the transition metal aluminum nitrides [D. Holec, R. Rachbauer, L. Chen, L. Wang, D. Luefa, and P. H. Mayrhofer, Surf. Coat. Technol. 206, 1698–1704 (2011)10.1016/j.surfcoat.2011.09.019; B. Alling, A. Karimi, and I. Abrikosov, Surf. Coat. Technol. 203, 883–886 (2008)]10.1016/j.surfcoat.2008.08.027. Surprisingly, a highly regular superhard (36 GPa) two-dimensional nanolabyrinthine structure of two intergrown single crystal phases evolves during magnetron sputter thin film synthesis of Zr0.64A...
Journal of Vacuum Science and Technology | 2016
Daniel Edström; Davide Sangiovanni; Lars Hultman; Ivan Petrov; J. E. Greene; Valeriu Chirita
Large-scale classical molecular dynamics simulations of epitaxial TiN/TiN(001) thin film growth at 1200K are carried out using incident flux ratios N/Ti -1, 2, and 4. The films are analyzed as a fu ...
Scientific Reports | 2018
Marlene Mühlbacher; Grzegorz Greczynski; Bernhard Sartory; Nina Schalk; Jun Lu; Ivan Petrov; J. E. Greene; Lars Hultman; Christian Mitterer
We compare the performance of conventional DC magnetron sputter-deposited (DCMS) TiN diffusion barriers between Cu overlayers and Si(001) substrates with Ti0.84Ta0.16N barriers grown by hybrid DCMS/high-power impulse magnetron sputtering (HiPIMS) with substrate bias synchronized to the metal-rich portion of each pulse. DCMS power is applied to a Ti target, and HiPIMS applied to Ta. No external substrate heating is used in either the DCMS or hybrid DCMS/HiPIMS process in order to meet future industrial thermal-budget requirements. Barrier efficiency in inhibiting Cu diffusion into Si(001) while annealing for 1u2009hour at temperatures between 700 and 900u2009°C is investigated using scanning electron microscopy, X-ray diffraction, four-point-probe sheet resistance measurements, transmission electron microscopy, and energy-dispersive X-ray spectroscopy profiling. Ti0.84Ta0.16N barriers are shown to prevent large-scale Cu diffusion at temperatures up to 900u2009°C, while conventional TiN barriers fail at ≤700u2009°C. The improved performance of the Ti0.84Ta0.16N barrier is due to film densification resulting from HiPIMS pulsed irradiation of the growing film with synchronized Ta ions. The heavy ion bombardment dynamically enhances near-surface atomic mixing during barrier-layer deposition.
Journal of Applied Physics | 2017
Daniel Edström; Davide Sangiovanni; Lars Hultman; Ivan Petrov; J. E. Greene; Valeriu Chirita
Large-scale classical molecular dynamics simulations of epitaxial TiN/TiN(001) thin film growth at 1200u2009K, a temperature within the optimal range for epitaxial TiN growth, with an incident N-to-Ti flux ratio of four, are carried out using incident N energies ENu2009=u20092 and 10u2009eV and incident Ti energy ETiu2009=u20092u2009eV. To further highlight the effect of EN, we grow a bilayer film with ENu2009=u20092u2009eV initially and then switch to ENu2009=u200910u2009eV. As-deposited layers are analyzed as a function of composition, island-size distribution, island-edge orientation, and vacancy formation. Results show that growth with ENu2009=u20092u2009eV results in films that are globally overstoichiometric with islands bounded by N-terminated polar 110 edges, whereas films grown with ENu2009=u200910u2009eV are flatter and closer to stoichiometric. However, ENu2009=u200910u2009eV layers exhibit local N deficiency leading to the formation of isolated 111-oriented islands. Films grown by changing the incident energy from 2 to 10u2009eV during growth are more compact than those grown entirel...
Physical Review B | 2018
Davide Sangiovanni; A. B. Mei; Daniel Edström; Lars Hultman; Valeriu Chirita; Ivan Petrov; J. E. Greene
We carried out density-functional ab initio molecular dynamics (AIMD) simulations of Ti adatom (