Dean W. Skinner

Seal characterization for supernarrow periphery LCD panel

Control of the seal edge of LC cells with super narrow periphery is very important for the application to compact AM-LCD designs. Several thermal cure epoxy resins have been studied as candidates for LC panel seal materials, with emphasis on characterizing the seal edge. The factors affecting material selection are its effect on LC alignment, the seal edge waviness or straightness, the formation of the seal edge boundary during lamination and cure and finally, its compatibility with standard cell processing techniques. Optimal seal material selection is discussed in view of its application to the design and fabrication of super narrow periphery LC cells. Cell design of seal edge control is also discussed in view of application of seal characterization and structural contribution, including material and process matching.