Dominik Heinz

Determination of axial and lateral exciton diffusion length in GaN by electron energy dependent cathodoluminescence

We demonstrate the application of low-temperature cathodoluminescence (CL) with high lateral, depth, and spectral resolution to determine both the lateral (i.e., perpendicular to the incident primary electron beam) and axial (i.e., parallel to the electron beam) diffusion length of excitons in semiconductor materials. The lateral diffusion length in GaN is investigated by the decrease of the GaN-related luminescence signal when approaching an interface to Ga(In)N based quantum well stripes. The axial diffusion length in GaN is evaluated from a comparison of the results of depth-resolved CL spectroscopy (DRCLS) measurements with predictions from Monte Carlo simulations on the size and shape of the excitation volume. The lateral diffusion length was found to be (95 ± 40) nm for nominally undoped GaN, and the axial exciton diffusion length was determined to be (150 ± 25) nm. The application of the DRCLS method is also presented on a semipolar (112¯2) sample, resulting in a value of (70 ± 10) nm in p-type GaN.

Ga(In)N Photonic Crystal Light Emitters with Semipolar Quantum Wells

We present directional photonic crystal light emitters produced as periodic semipolar GaInN quantum wells, grown by selective area metal organic vapour phase epitaxy. The emitted angle-dependent modal structure for sub-micrometer stripes and embedded photonic crystal structures is analyzed experimentally in detail, and the introduction of an Al0.12Ga0.88N cladding layer is investigated. We provide a complete simulation based on the finite-difference time-domain method, which allows to identify all leaky modes as well as their spectral and angular dependence.

Composition analysis of coaxially grown InGaN multi quantum wells using scanning transmission electron microscopy

GaN nanotubes with coaxial InGaN quantum wells were analyzed by scanning transmission electron microscopy in order to determine their structural properties as well as the indium distribution across the InGaN quantum wells. For the latter, two process steps are necessary. First, a technique to prepare cross-sectional slices out of the nanotubes has been developed. Second, an existing scanning transmission electron microscopy analysis technique has been extended with respect to the special crystallographic orientation of this type of specimen. In particular, the shape of the nanotubes, their defect structure, and the incorporation of indium on different facets were investigated. The quantum wells preferentially grow on m-planes of the dodecagonally shaped nanotubes and on semipolar top facets while no significant indium signal was found on a-planes. An averaged indium concentration of 6% to 7% was found by scanning transmission electron microscopy analysis and could be confirmed by cathodoluminescence measu...