Elfido Coss
Advanced Micro Devices
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Publication
Featured researches published by Elfido Coss.
Journal of Vacuum Science and Technology | 2001
Richard J. Markle; Elfido Coss
Data streams and communication issues are the most critical areas for successful advanced process control (APC) programs. These areas are vital for both APC run-to-run controllers and fault detection and classification (FDC) systems used for high volume manufacturing applications in the semiconductor industry. All APC systems rely on data streams to make their process changes, to keep the process on target and in control, and to otherwise signal a need for engineering involvement to make similar corrective actions. The access to, communication of, and reliability and integrity of these data streams are essential to all APC programs. APC run-to-run controllers use the data to make changes in the process. FDC systems focus on predicting pending equipment- or process- related problems or detecting them quickly when they occur. The inability to access the needed data stream can prohibit the use of APC run-to-run controllers or FDC systems on critical process operations. Worse yet, the use of unreliable or cor...
Archive | 2001
Anthony J. Toprac; Elfido Coss
Archive | 2001
Elfido Coss; Richard J. Markle; Patrick M. Cowan
Archive | 2000
Elfido Coss; Qingsu Wang; Terrence J. Riley
Archive | 2000
Elfido Coss; Thomas J. Sonderman; Robert W. Anderson
Archive | 1999
Michael L. Miller; Qingsu Wang; Elfido Coss
Archive | 1997
Michael R. Conboy; Danny C. Shedd; Elfido Coss
Archive | 1999
Thomas J. Sonderman; Elfido Coss; Qingsu Wang
Archive | 2002
Elfido Coss; Susan Hickey; Michael R. Conboy
Archive | 1999
Michael R. Conboy; Patrick J. Ryan; Elfido Coss