Elizabeth George

Measurement of the

The half-life of the

^{20}

^{20}

F half-life.

F ground state has been measured using a radioactive beam implanted in a plastic scintillator and recording

Measurement of the Branching Ratio for the Beta Decay of

\beta\gamma

^{14}

coincidences together with four CsI(Na) detectors. The result,

O

T_{1/2} = 11.0011(69)_{\rm stat}(30)_{\rm sys}

Measurement of the branching ratio for the β decay of O 14

~s, is at variance by 17 combined standard deviations with the two most precise results. The present value revives the poor consistency of results for this half-life and calls for a new measurement, with a technique having different sources of systematic effects, to clarify the discrepancy.

Measurement of the branching ratio for theβdecay ofO14

We present a new measurement of the branching ratio for the decay of

Measurement of the shape factor for the β decay of O 14

^{14}

Half-life of 66Ga

O to the ground state of