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Dive into the research topics where Enrico Massa is active.

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Featured researches published by Enrico Massa.


Physical Review Letters | 2011

Determination of the Avogadro constant by counting the atoms in a 28Si crystal.

B. Andreas; Y. Azuma; G. Bartl; P. Becker; Horst Bettin; M. Borys; I. Busch; Malcolm B. Gray; P. Fuchs; K. Fujii; Hiroyuki Fujimoto; Ernest G. Kessler; M. Krumrey; Ulrich Kuetgens; N. Kuramoto; Giovanni Mana; P. Manson; Enrico Massa; S. Mizushima; A. Nicolaus; A. Picard; A. Pramann; Olaf Rienitz; D. Schiel; S. Valkiers; A. Waseda

The Avogadro constant links the atomic and the macroscopic properties of matter. Since the molar Planck constant is well known via the measurement of the Rydberg constant, it is also closely related to the Planck constant. In addition, its accurate determination is of paramount importance for a definition of the kilogram in terms of a fundamental constant. We describe a new approach for its determination by counting the atoms in 1 kg single-crystal spheres, which are highly enriched with the 28Si isotope. It enabled isotope dilution mass spectroscopy to determine the molar mass of the silicon crystal with unprecedented accuracy. The value obtained, NA = 6.022,140,78(18) × 10(23) mol(-1), is the most accurate input datum for a new definition of the kilogram.


Metrologia | 2011

Counting the atoms in a 28Si crystal for a new kilogram definition

Birk Andreas; Yasushi Azuma; Guido Bartl; P. Becker; Horst Bettin; Michael Borys; Ingo Busch; P Fuchs; Kenichi Fujii; Hiroyuki Fujimoto; Ernest G. Kessler; Michael Krumrey; Ulrich Kuetgens; Naoki Kuramoto; Giovanni Mana; Enrico Massa; Shigeki Mizushima; Arnold Nicolaus; A. Picard; Axel Pramann; Olaf Rienitz; Detlef Schiel; S. Valkiers; Atsushi Waseda; S Zakel

This paper concerns an international research project aimed at determining the Avogadro constant by counting the atoms in an isotopically enriched silicon crystal. The counting procedure was based on the measurement of the molar volume and the volume of an atom in two 1 kg crystal spheres. The novelty was the use of isotope dilution mass spectrometry as a new and very accurate method for the determination of the molar mass of enriched silicon. Because of an unexpected metallic contamination of the sphere surfaces, the relative measurement uncertainty, 3 × 10−8 NA, is larger by a factor 1.5 than that targeted. The measured value of the Avogadro constant, NA = 6.022 140 82(18) × 1023 mol−1, is the most accurate input datum for the kilogram redefinition and differs by 16 × 10−8 NA from the CODATA 2006 adjusted value. This value is midway between the NIST and NPL watt-balance values.


Metrologia | 2015

Improved measurement results for the Avogadro constant using a 28Si-enriched crystal

Yasushi Azuma; Pauline Barat; Guido Bartl; Horst Bettin; Michael Borys; Ingo Busch; L Cibik; G D’Agostino; Kenichi Fujii; Hiroyuki Fujimoto; Akiharu Hioki; Michael Krumrey; Ulrich Kuetgens; Naoki Kuramoto; Giovanni Mana; Enrico Massa; R Meeß; Shigeki Mizushima; Tomohiro Narukawa; Arnold Nicolaus; Axel Pramann; Savelas A. Rabb; Olaf Rienitz; C Sasso; Michael Stock; Robert D. Vocke; Atsushi Waseda; S Wundrack; S Zakel

New results are reported from an ongoing international research effort to accurately determine the Avogadro constant by counting the atoms in an isotopically enriched silicon crystal. The surfaces of two 28Si-enriched spheres were decontaminated and reworked in order to produce an outer surface without metal contamination and improved sphericity. New measurements were then made on these two reconditioned spheres using improved methods and apparatuses. When combined with other recently refined parameter measurements, the Avogadro constant derived from these new results has a value of


conference on precision electromagnetic measurements | 2004

Present Status of the a Vogadro Constant Determination from Silicon Crystals with Natural Isotopic Composition

Kenichi Fujii; Atsushi Waseda; Naoki Kuramoto; Shigeki Mizushima; P. Becker; Horst Bettin; R. Arnold Nicolaus; Ulrich Kuetgens; S. Valkiers; Philip Taylor; Paul De Bièvre; Giovanni Mana; Enrico Massa; Richard J. Matyi; Ernest G. Kessler; M. Hanke

N_A = 6.022 140 76(12) \times 10^{23}


New Journal of Physics | 2009

Measurement of the lattice parameter of a silicon crystal

Enrico Massa; Giovanni Mana; Ulrich Kuetgens; Luca Ferroglio

mol


Metrologia | 2011

Measurement of the {2 2 0} lattice-plane spacing of a 28Si x-ray interferometer

Enrico Massa; Giovanni Mana; Ulrich Kuetgens; Luca Ferroglio

^{-1}


Annalen der Physik | 2013

Accurate measurements of the Avogadro and Planck constants by counting silicon atoms

Horst Bettin; Kenichi Fujii; John Man; Giovanni Mana; Enrico Massa; A. Picard

. The X-ray crystal density method has thus achieved the target relative standard uncertainty of


Optics Express | 2008

Si lattice parameter measurement by centimeter X-ray interferometry

Luca Ferroglio; Giovanni Mana; Enrico Massa

2.0 \times 10^{-8}


Metrologia | 2011

The lattice parameter of the 28Si spheres in the determination of the Avogadro constant

Enrico Massa; Giovanni Mana; Luca Ferroglio; Ernest G. Kessler; Detlef Schiel; S Zakel

necessary for the realization of the definition of the new kilogram.


Metrologia | 2012

Model selection in the average of inconsistent data: an analysis of the measured Planck-constant values

Giovanni Mana; Enrico Massa; M Predescu

The determination of the Avogadro constant from two selected silicon crystals is described. The density, molar mass, and lattice spacing of the two crystals were measured at NMU, PTB, IRMM, IMGC, and NIST. When all the data are combined, it leads to the Avogadro constant of 6.022 1353 (21) times 1023 mol-1 with a relative combined standard uncertainty of 3.4 times 10-7

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Kenichi Fujii

National Institute of Advanced Industrial Science and Technology

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Naoki Kuramoto

National Institute of Advanced Industrial Science and Technology

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A. Picard

International Bureau of Weights and Measures

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Hiroyuki Fujimoto

National Institute of Advanced Industrial Science and Technology

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Ernest G. Kessler

National Institute of Standards and Technology

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Atsushi Waseda

National Institute of Advanced Industrial Science and Technology

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Shigeki Mizushima

National Institute of Advanced Industrial Science and Technology

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Yasushi Azuma

National Institute of Advanced Industrial Science and Technology

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