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Erich Maechler

IBM

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Publication

Featured researches published by Erich Maechler.

Oxide Superconductor Physics and Nano-Engineering | 1994

Characterization of MBE-grown ultrathin films in the La2-xSrxCuO4±δ system

Y Jaccard; Andreas Cretton; Ej Williams; Jean-Pierre Locquet; Erich Maechler; Christoph Gerber; T. Schneider; Oystein Fischer; P. Martinoli

Using a molecular beam epitaxy deposition technique, c-axis La2-xSrxCuO4+/- (delta ) ultrathin films have been prepared on (001) SrTiO3 substrates. Several superconductive properties such as the critical temperature Tc, the penetration depth (lambda) ab(0), the activation energy for flux flow (Delta) U and the Hall coefficient RH are reported for the same set of films. As the dopant content is increased, maximum values for Tc and (Delta) U are observed near the optimum doping while RH decreases continuously.

Archive | 2000

Method of imaging a magnetic field emanating from a surface using a conventional scanning force microscope

R. Berger; Andreas Dietzel; Jean Fompeyrine; Frank Krause; Jean-Pierre Locquet; Erich Maechler

Archive | 1993

Process for manufacturing thin films by multi-layer deposition

J. G. Bednorz; Andrei Dr Catana; Jean-Pierre Locquet; Erich Maechler; Carl Alexander Mueller

Archive | 1996

Deposition method and precursor therefor

F Arrouy; J. G. Bednorz; Heinz Berke; Elke Fritsch; J. Robert Huber; Jean-Pierre Locquet; Erich Maechler

Archive | 2000

DEPOSITION METHOD AND USE OF A PRECURSOR THEREFOR

Heinz Berke; Robert James Huber; F Arrouy; J. G. Bednorz; Elke Fritsch; Jean-Pierre Locquet; Erich Maechler

Archive | 2000

Magnetic field characterization process, especially for magnetic read/write heads, comprises providing a magnetosensitive layer between a component surface and a scanning force microscope sensor

R. Berger; Andreas Dietzel; Jean Fompeyrine; Frank Krause; Jean-Pierre Locquet; Erich Maechler

Archive | 2000

Charakterisierung von Magnetfeldern

R. Berger; Andreas Dietzel; Jean Fompeyrine; Frank Krause; Jean-Pierre Locquet; Erich Maechler

Physical Review B | 1997

Molecular beam epitaxy and microstructural study of La{sub 2-x}Sr{sub 1+x}CuO{sub 6+y} thin films

Karen Verbist; Ognjen Milat; Gustaaf Van Tendeloo; F Arrouy; E. A. Williams; Ch. Rossel; Erich Maechler; Jean-Pierre Locquet

Physical Review B | 1996

Variation of the in-plane penetration depth λ{sub {ital ab}} as a function of doping in La{sub 2-{ital x}}Sr{sub {ital x}}CuO{sub 4±δ} thin films on SrTiOâ: Implications for the overdoped state

Jean-Pierre Locquet; Y Jaccard; Andreas Cretton; E. A. Williams; F Arrouy; Erich Maechler; Theo Schneider; Ø. Fischer; P. Martinoli

Archive | 1992

Verfahren zum Herstellen dünner Schichten durch Mehrlagen-Abscheidung A method of producing thin layers by multilayer deposition

Jean-Pierre Dr Locquet; J. G. Bednorz; Carl Alexander Mueller; Erich Maechler; Andrei Dr Catana

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Jean-Pierre Locquet

Katholieke Universiteit Leuven

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J. G. Bednorz

IBM

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F Arrouy

IBM

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Andreas Dietzel

IBM

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Andrei Dr Catana

IBM

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Carl Alexander Mueller

IBM

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Frank Krause

IBM

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Jean Fompeyrine

IBM

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R. Berger

IBM

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Andreas Cretton

IBM

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