F. de Fornel
University of Burgundy
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Featured researches published by F. de Fornel.
1989 Intl Congress on Optical Science and Engineering | 1989
F. de Fornel; Jean-Pierre Goudonnet; L. Salomon; E. Lesniewska
We present a new form of optical microscope. An evanescent field is produced in the lower index medium of an ATR system and modulated by a sample deposited on the hypotenuse of the prism. A sharpened fiber optic probes this field and gives information about the topography of the surface.
Journal of The Optical Society of America A-optics Image Science and Vision | 1991
L. Salomon; F. de Fornel; Jean-Pierre Goudonnet
The photon-scanning tunneling microscope is the photon analog to the electron-scanning tunneling microscope. It uses the evanescent field due to the total internal reflection of a light beam in a prism, modulated by a sample attached to the prism. The exponential decay of the evanescent field is characterized by the penetration depth dp and depends on the angle of incidence θ, the wavelength, and the polarization of the incident beam. The 1/e decay lengths range from 150 to 265 nm as deduced from the expression of the electric-field intensity in the rarer medium for θ = π/2. If we place another optically transparent medium near the surface, frustrated total reflection occurs. It is shown theoretically and experimentally that, if we choose an appropriate angle of incidence θ(θ ≠ π/2) and change the index of refraction of one of the media, the decay length of the electric field can be extremely small, so that images with an improved resolution can be produced.
Optics Communications | 1996
J. C. Weeber; F. de Fornel; Jean-Pierre Goudonnet
The differential method was used to model the scanning of a tip above a given surface defect in the photon scanning tunneling microscope illumination conditions. In order to estimate the influence of the tip-sample interaction, we consider two configurations. In the coupled configuration, the computation is complete and takes into account the tip-sample interaction. In the uncoupled configuration, we use an outgoing wave condition in order to forbid artificially the creation of a multiple scattering system between the tip and the surface. We show that, since the observed sample is dielectric, the tip can be regarded as a passive sensor even if the tip is coated with metal. We also investigate the case of a metallic sample for the two classical TE and TM states of polarization of the incident plane wave.
Applied Physics Letters | 2012
C. Renaut; Jean Dellinger; Benoit Cluzel; T. Honegger; D. Peyrade; Emmanuel Picard; F. de Fornel; Emmanuel Hadji
In this work, we report the auto-assembly experiments of micrometer sized particles by optical trapping in the evanescent field of a photonic crystal nanocavity. The nanocavity is inserted inside an optofluidic cell designed to enable the real time control of the nanoresonator transmittance as well as the real time visualization of the particles motion in the vicinity of the nanocavity. It is demonstrated that the optical trap above the cavity enables the assembly of multiple particles in respect of different stable conformations.
Optics Express | 2004
D. Gérard; L. Salomon; F. de Fornel; Anatoly V. Zayats
The Bloch mode spectrum of surface plasmon polaritons (SPPs) on a finite thickness metal film has been analyzed in the regimes of weak and strong coupling between SPP modes on the opposite film interfaces. The SPP mode dispersion and associated field distributions have been studied. The results have been applied to the description of the light transmission through thick and thin periodically structured metal films at oblique incidence. In contrast to normal incidence, all SPP Bloch modes on a grating structure participate in the resonant photon tunnelling leading to the transmission enhancement. However, at the angle of incidence corresponding to the crossing of different symmetry film SPP Bloch modes, the far-field transmission is suppressed despite the enhanced near-field transmission. The combined SPP mode consisting of the two film SPPs having different symmetries that is achieved at the crossing frequency exhibits no radiative losses on a structured surface.
Optics Letters | 2002
Davy Gérard; Lotfi Berguiga; F. de Fornel; L. Salomon; Christian Seassal; Xavier Letartre; P. Rojo-Romeo; Pierre Viktorovitch
We report a study of the optical near field of an active integrated component operating near the 1.55-mum telecommunications wavelength. The device is based on a two-dimensional photonic crystal etched in a suspended InP membrane. Topographic as well as optical information is collected by use of a scanning near-field optical microscope in collection mode, providing information about the local distribution of the losses.
Journal of The Optical Society of America A-optics Image Science and Vision | 1996
F. de Fornel; Anne Sentenac; Rémi Carminati; P. M. Adam; L. Salomon; Jean-Jacques Greffet; Jean-Pierre Goudonnet
The photon scanning tunneling microscope (PSTM ) is based on the frustration of a total internal reflected beam by the end of an optical fiber. Until now it has been used to obtain topographic information, generally for smooth samples. We report theoretical as well as experimental results on the observation of a step on a quartz substrate with the PSTM. These results demonstrate the effects on image formation of the distance between the fiber tip and the sample surface, the orientation of the incident beam with respect to the step, the polarization, and the coherence of the light. Good agreement exists between numerical simulations and experiments. We show that a perturbative approach, whose validity has been checked by comparison with a rigorous volume integral method, provides physical insight into the main features of the different images.
Scientific Reports | 2013
C. Renaut; Benoit Cluzel; Jean Dellinger; L. Lalouat; Emmanuel Picard; D. Peyrade; Emmanuel Hadji; F. de Fornel
Particles manipulation with optical forces is known as optical tweezing. While tweezing in free space with laser beams was established in the 1980s, integrating the optical tweezers on a chip is a challenging task. Recent experiments with plasmonic nanoantennas, microring resonators, and photonic crystal nanocavities have demonstrated optical trapping. However, the optical field of a tweezer made of a single microscopic resonator cannot be shaped. So far, this prevents from optically driven micromanipulations. Here we propose an alternative approach where the shape of the optical trap can be tuned by the wavelength in coupled nanobeam cavities. Using these shapeable tweezers, we present micromanipulation of polystyrene microspheres trapped on a silicon chip. These results show that coupled nanobeam cavities are versatile building blocks for optical near-field engineering. They open the way to much complex integrated tweezers using networks of coupled nanobeam cavities for particles or bio-objects manipulation at a larger scale.
Applied Physics Letters | 2004
B. Cluzel; D. Gérard; Emmanuel Picard; T. Charvolin; Vincent Calvo; Emmanuel Hadji; F. de Fornel
We experimentally show coupling between two photonic crystal waveguide Bloch modes having a different parity. A monomode ridge waveguide etched in a silicon-on-insulator substrate and connecting to the photonic crystal waveguide allows us to excite the even Bloch mode. Transmission measurements, performed on a broad spectral range, show the even mode propagation along the defect line. Then, spectrally resolved near-field patterns obtained by using a scanning near-field optical microscope in collection mode for wavelengths, inside and outside the multimode region of the photonic crystal waveguide, clearly demonstrate coupling phenomenon between even and odd modes.
Applied Physics Letters | 2008
L. Lalouat; Benoit Cluzel; F. de Fornel; Philippe Velha; Philippe Lalanne; D. Peyrade; Emmanuel Picard; T. Charvolin; Emmanuel Hadji
The optical near field of a high-Q and ultrasmall volume photonic crystal nanocavity is visualized with a subwavelength resolution by using a scanning near-field optical microscope (SNOM) operating at the same time in collection-scanning mode and in interaction-scanning mode. It is shown that the nanocavity resonant mode is selectively visualized by using the SNOM interaction-scanning mode while the whole electromagnetic field surrounding the nanocavity is probed using the SNOM collection-scanning mode. The different optical near-field images are compared in light of a three-dimensional numerical analysis and we demonstrate an unexpected mode coupling at the cavity resonance.