Falah S. Hasoon

Progress toward 20% efficiency in Cu(In,Ga)Se2 polycrystalline thin‐film solar cells

This short communication reports on achieving 18·8% total-area conversion efficiency for a ZnO/CdS/Cu(In,Ga)Se2/Mo polycrystalline thin-film solar cell. We also report a 15%-efficient, Cd-free device fabricated via physical vapor deposition methods. The Cd-free cell includes no buffer layer, and it is fabricated by direct deposition of ZnO on the Cu(In,Ga)Se2 thin-film absorber. Both results have been measured at the National Renewable Energy Laboratory under standard reporting conditions (1000 W/m2, 25°C, ASTM E 892 Global). The 18·8% conversion efficiency represents a new record for such devices (Notable Exceptions) and makes the 20% performance level by thin-film polycrystalline materials much closer to reality. We allude to the enhancement in performance of such cells as compared to previous record cells, and we discuss possible and realistic routes to enhance the performance toward the 20% efficiency level. Published in 1999 by John Wiley & Sons, Ltd. This article is a US government work and is in the public domain in the United States.

Optimization of CBD CdS process in high-efficiency Cu(In,Ga)Se2-based solar cells

Abstract We present an optimization of the CdS chemical bath deposition process as applied to high-efficiency Cu(In,Ga)Se2 photovoltaic thin-film absorber materials. Specifically, we investigated deposition time (thickness), bath temperature (65, 80 and 90°C) and a Cd2+ partial-electrolyte treatment of the chalcopyrite absorber prior to CdS deposition. We found that thinner CdS layers (grown on as-deposited absorbers) allowing more light to reach the junction are not necessarily conducive to higher short-circuit current density. Device performance was found to be dependent on the CdS layer thickness, but rather independent of the growth temperature. On the other hand, devices prepared from absorbers subjected to a Cd2+ partial electrolyte treatment show that the device performance dependence on CdS thickness is somewhat alleviated, and devices incorporating thinner CdS layers are possible without loss of parameters, such as open-circuit voltage and fill factor.

Fabrication procedures and process sensitivities for CdS/CdTe solar cells

This paper details the laboratory processes used to fabricate CdS/CdTe solar cells at the National Renewable Energy Laboratory. The basic fabrication technique includes low-pressure chemical vapor deposited SnO2 , chemical-bath deposited CdS, close-spaced sublimated CdTe, solution-CdCl2 treatment, and an acid-contact etch, followed by application of a doped-graphite paste. This paper also describes the results of a reproducibility study in which cells were produced by multiple operators with an average AM1·5 efficiency of 12·6%. And finally, this paper discusses process sensitivities and alternative cell fabrication procedures and reports the fabrication of a cell with an AM1·5 efficiency of 15·4%. Copyright

Na impurity chemistry in photovoltaic CIGS thin films: Investigation with x-ray photoelectron spectroscopy

Thermal processing of Cu(In1−xGax)Se2 thin-films grown as part of photovoltaic devices on soda-lime glass leads to the incorporation of Na impurity atoms in the Cu(In1−xGax)Se2. Na contamination increases the photovoltaic efficiency of Cu(In1−xGax)Se2-based devices. The purpose of this investigation is to develop a model for the chemistry of Na in Cu(In1−xGax)Se2 in an effort to understand how it improves performance. An analysis of x-ray photoelectron spectroscopy data shows that the Na concentration is ∼0.1 at. % in the bulk of Cu(In1−xGax)Se2 thin films and that the Na is bound to Se. The authors propose a model invoking the replacement of column III elements by Na during the growth of Cu(In1−xGax)Se2 thin films. Na on In and Ga sites would act as acceptor states to enhance photovoltaic device performance.

Investigation of polycrystalline CdTe thin films deposited by physical vapor deposition, close‐spaced sublimation, and sputtering

CdTe thin films, deposited on different substrate structures by physical vapor deposition, sputtering, and close‐spaced sublimation, have been treated with CdCl2 at several temperatures. The morphology of the films has been studied by atomic force microscopy, and the observations were correlated to results obtained from x‐ray diffraction, cathodoluminescence, and minority‐carrier lifetime measurements. The samples treated at 400 °C resulted in the best device‐quality films, independent of deposition method and underlying substrate structure. For the first time, a nanograin structure was observed in CdTe sputtered samples.CdTe thin films, deposited on different substrate structures by physical vapor deposition, sputtering, and close‐spaced sublimation, have been treated with CdCl2 at several temperatures. The morphology of the films has been studied by atomic force microscopy, and the observations were correlated to results obtained from x‐ray diffraction, cathodoluminescence, and minority‐carrier lifetime measurements. The samples treated at 400 °C resulted in the best device‐quality films, independent of deposition method and underlying substrate structure. For the first time, a nanograin structure was observed in CdTe sputtered samples.

Direct evidence of a buried homojunction in Cu(In,Ga)Se2 solar cells

The built-in electrical potential of Cu(In,Ga)Se2 (CIGS) solar cells was measured quantitatively and resolved spatially using scanning Kelvin probe microscopy. Profiles of the electrical potential along cross sections of the device demonstrate that the p–n junction is a buried homojunction, and the p/n boundary is located 30–80 nm from the CIGS/CdS interface in the CIGS film. The built-in electric field terminates at the CIGS/CdS interface, indicating that the CdS and ZnO layers of the device structure are inactive for the collection of photoexcited carriers.

Efficient heterojunction solar cells on p-type crystal silicon wafers

Efficient crystalline silicon heterojunction solar cells are fabricated on p-type wafers using amorphous silicon emitter and back contact layers. The independently confirmed AM1.5 conversion efficiencies are 19.3% on a float-zone wafer and 18.8% on a Czochralski wafer; conversion efficiencies show no significant light-induced degradation. The best open-circuit voltage is above 700 mV. Surface cleaning and passivation play important roles in heterojunction solar cell performance.

Secondary barriers in CdS-CuIn1-xGaxSe2 solar cells

Previous work on CdS–CuInSe2 (CIS) solar cells, which reported distortions of their current-voltage (J–V) curves under red illumination, is expanded in this work to include CdS–CuIn1−xGaxSe2 cells with variable Ga and CIS cells with variable CdS thickness. Different amounts of J–V distortion were observed in these cells under red light. The details are in good agreement with predictions of a photodiode model, in which a secondary barrier caused by the positive conduction-band discontinuity (spike) at the buffer–absorber interface is responsible for the current limitation. The illumination of the cell with high-energy photons lowers the barrier due to buffer photoconductivity, and thus removes the J–V distortion.

Deep-level impurities in CdTe/CdS thin-film solar cells

We have studied deep-level impurities in CdTe/CdS thin-film solar cells by capacitance–voltage (C–V), deep-level transient spectroscopy (DLTS), and optical DLTS (ODLTS). CdTe devices were grown by close-spaced sublimation. Using DLTS, a dominant electron trap and two hole traps were observed. These traps are designated as E1 at EC−0.28 eV, H1 at EV+0.34 eV, and H2 at EV+0.45 eV. The presence of the E1 and H1 trap levels was confirmed by ODLTS. The H1 trap level is due to Cu-induced substitutional defects. The E1 trap level is believed to be a deep donor and is attributed to the doubly ionized interstitial Cu or a Cu complex. The E1 trap is an effective recombination center and is a lifetime killer.

CuIn1−xGaxSe2-based photovoltaic cells from electrodeposited and chemical bath deposited precursors

We have fabricated 13.7%- and 7.3%-efficient CuIn1−xGaxSe2 (CIGS)-based devices from electrodeposited and chemical bath deposited precursors. As-deposited precursors are Cu-rich films and polycrystalline (grain size is very small) in nature. Only preliminary data is presented on chemical bath deposited precursors. Additional In, Ga, and Se were added to the precursor films by physical evaporation to adjust the final composition to CuIn1−xGaxSe2. Addition of In and Ga and also selenization at high temperature are very crucial to obtain high efficiency devices. Three devices with Ga/(In+Ga) ratios of 0.16, 0.26, and 0.39 were fabricated from electrodeposited precursors. The device fabricated from the chemical bath deposited precursor had a Ga/(In+Ga) ratio of 0.19. The films/devices have been characterized by inductive-coupled plasma spectrometry, Auger electron spectroscopy, X-ray diffraction, electron-probe microanalysis, current-voltage characteristics, capacitance–voltage, and spectral response. The compositional uniformity of the electrodeposited precursor films both in the vertical and horizontal directions were studied. The electrodeposited device parameters are compared with those of a 17.7% physical vapor deposited device.