Farbod Ebrahimi

Ultra-low switching energy and scaling in electric-field-controlled nanoscale magnetic tunnel junctions with high resistance-area product

We report electric-field-induced switching with write energies down to 6 fJ/bit for switching times of 0.5 ns, in nanoscale perpendicular magnetic tunnel junctions (MTJs) with high resistance-area product and diameters down to 50 nm. The ultra-low switching energy is made possible by a thick MgO barrier that ensures negligible spin-transfer torque contributions, along with a reduction of the Ohmic dissipation. We find that the switching voltage and time are insensitive to the junction diameter for high-resistance MTJs, a result accounted for by a macrospin model of purely voltage-induced switching. The measured performance enables integration with same-size CMOS transistors in compact memory and logic integrated circuits.

Electric-Field-Controlled Magnetoelectric RAM: Progress, Challenges, and Scaling

We review the recent progress in the development of magnetoelectric RAM (MeRAM) based on electric-field-controlled writing in magnetic tunnel junctions (MTJs). MeRAM uses the tunneling magnetoresistance effect for readout in a two-terminal memory element, similar to other types of magnetic RAM. However, the writing of information is performed by voltage control of magnetic anisotropy (VCMA) at the interface of an MgO tunnel barrier and the CoFeB-based free layer, as opposed to current-controlled (e.g., spin-transfer torque or spin-orbit torque) mechanisms. We present results on voltage-induced switching of MTJs in both resonant (precessional) and thermally activated regimes, which demonstrate fast (<;1 ns) and ultralow-power (<;40 fJ/bit) write operations at voltages ~1.5-2 V. We also discuss the implications of the VCMA-based write mechanism on memory array design, highlighting the possibility of crossbar implementation for high bit density. Results are presented from a 1 kbit MeRAM test array. Endurance and voltage scaling data are presented. The scaling behavior is analyzed, and material-level requirements are discussed for the translation of MeRAM into mainstream memory applications.

Comparative Evaluation of Spin-Transfer-Torque and Magnetoelectric Random Access Memory

Spin-transfer torque random access memory (STT-RAM), as a promising nonvolatile memory technology, faces challenges of high write energy and low density. The recently developed magnetoelectric random access memory (MeRAM) enables the possibility of overcoming these challenges by the use of voltage-controlled magnetic anisotropy (VCMA) effect and achieves high density, fast speed, and low energy simultaneously. As both STT-RAM and MeRAM suffer from the reliability problem of write errors, we implement a fast Landau-Lifshitz-Gilbert equation-based simulator to capture their write error rate (WER) under process and temperature variation. We utilize a multi-write peripheral circuit to minimize WER and design reliable STT-RAM and MeRAM. With the same acceptable WER, MeRAM shows advantages of 83% faster write speed, 67.4% less write energy, 138% faster read speed, and 28.2% less read energy compared with STT-RAM. Benefiting from the VCMA effect, MeRAM also achieves twice the density of STT-RAM with a 32 nm technology node, and this density difference is expected to increase with technology scaling down.

Thermally stable voltage-controlled perpendicular magnetic anisotropy in Mo|CoFeB|MgO structures

We study voltage-controlled magnetic anisotropy (VCMA) and other magnetic properties in annealed Mo|CoFeB|MgO layered structures. The interfacial perpendicular magnetic anisotropy (PMA) is observed to increase with annealing over the studied temperature range, and a VCMA coefficient of about 40 fJ/V-m is sustained after annealing at temperatures as high as 430 °C. Ab initio electronic structure calculations of interfacial PMA as a function of strain further show that strain relaxation may lead to the increase of interfacial PMA at higher annealing temperatures. Measurements also show that there is no significant VCMA and interfacial PMA dependence on the CoFeB thickness over the studied range, which illustrates the interfacial origin of the anisotropy and its voltage dependence, i.e., the VCMA effect. The high thermal annealing stability of Mo|CoFeB|MgO structures makes them compatible with advanced CMOS back-end-of-line processes, and will be important for integration of magnetoelectric random access memory into on-chip embedded applications.

Low-Power, High-Density Spintronic Programmable Logic With Voltage-Gated Spin Hall Effect in Magnetic Tunnel Junctions

A non-volatile spintronic programmable logic (SPL), based on a 3-teriminal magnetic tunnel junction (MTJ), is presented and simulated using a compact device model. The SPL structure is compatible with CMOS technology and can be fabricated in the back end of line (BEOL). The proposed SPL exploits gate-voltage-modulated spin Hall effect (V-SHE) switching, which combines the voltage-controlled magnetic anisotropy (VCMA) effect and SHE, as a parallel configuration method. The VCMA modulates the coercivity of the MTJ, reducing the critical current for the SHE to change the state of the MTJs. This allows the SPL to achieve 100 times faster configuration speed due to the parallel configuration, and 32% area reduction because of minimized transistors in the write circuit, compared to programmable logic based on conventional spin-transfer torque memory (STT-RAM).

Design of high-throughput and low-power true random number generator utilizing perpendicularly magnetized voltage-controlled magnetic tunnel junction

A true random number generator based on perpendicularly magnetized voltage-controlled magnetic tunnel junction devices (MRNG) is presented. Unlike MTJs used in memory applications where a stable bit is needed to store information, in this work, the MTJ is intentionally designed with small perpendicular magnetic anisotropy (PMA). This allows one to take advantage of the thermally activated fluctuations of its free layer as a stochastic noise source. Furthermore, we take advantage of the voltage dependence of anisotropy to temporarily change the MTJ state into an unstable state when a voltage is applied. Since the MTJ has two energetically stable states, the final state is randomly chosen by thermal fluctuation. The voltage controlled magnetic anisotropy (VCMA) effect is used to generate the metastable state of the MTJ by lowering its energy barrier. The proposed MRNG achieves a high throughput (32 Gbps) by implementing a 64×64 MTJ array into CMOS circuits and executing operations in a parallel manner. Furt...

In-plane magnetic field effect on switching voltage and thermal stability in electric-field-controlled perpendicular magnetic tunnel junctions

The effect of in-plane magnetic field on switching voltage (Vsw) and thermal stability factor (Δ) are investigated in electric-field-controlled perpendicular magnetic tunnel junctions (p-MTJs). Dwell time measurements are used to determine the voltage dependence of the energy barrier height for various in-plane magnetic fields (Hin), and gain insight into the Hin dependent energy landscape. We find that both Vsw and Δ decrease with increasing Hin, with a dominant linear dependence. The results are reproduced by calculations based on a macrospin model while accounting for the modified magnetization configuration in the presence of an external magnetic field.

Source Line Sensing in Magneto-Electric Random-Access Memory to Reduce Read Disturbance and Improve Sensing Margin

A source line sensing (SLS) scheme is presented, along with a corresponding memory core circuit architecture, for the sensing operation of magneto-electric random-access memory (MeRAM). Compared to a conventional bit-line sensing (BLS) scheme, the proposed SLS, which exploits the voltage-controlled magnetic anisotropy (VCMA) effect, applies a voltage across the magneto-electric tunnel junction (MEJ) with an opposite polarity. The SLS significantly reduces read disturbance and increases the sensing margin due to the enhanced coercivity of the bit during the read operation. Experimental data demonstrate that the thermal stability of nanoscale MEJs increases up to 2 times during the SLS operation compared with conventional BLS. An MEJ compact model based the SLS simulation shows that read disturbance improves by a factor greater than 109 fJ/V·m and the sensing margin increases up to 3 times in the MEJ with the large VCMA coefficient (>100 fJ/V·m).

Analog to Stochastic Bit Stream Converter Utilizing Voltage-Assisted Spin Hall Effect

We introducea spintronic analog to stochastic bit stream (SBS) converter (ASC) based on a three terminal magnetic tunnel junction (MTJ) with a heavymetal layer. The critical current of the spin Hall effect (SHE) for switching the MTJ is efficiently modulated by applying a voltage across the MTJ via the voltage-controlled magnetic anisotropy effect. This effect results in the switching probability linearly depending on the amplitude of the analog input signal of the ASC. There are several advantages of using the voltage-assistedSHE for generating an SBS. The stochastic switching behavior of MTJ devices drastically reduces the area overhead by simplifying control circuits in the ASC. Moreover, the voltage-assisted SHE switching improves energy efficiency over traditional spin transfer torque (STT)-based MTJ switching by diminishing ohmic dissipation. Also, multiple MTJs on a single heavy metal layer increases the bandwidth by simultaneously converting analog input signals to SBSs. The performance of the spintronic ASC was evaluated by using the macrospin three terminal MTJ compactmodel integrated into a 45-nm CMOS technology. The proposed ASC can achieve 7x reduction in power consumption comparedto the previousSTT-basedwork and significant improvement in area-efficiency compared with the pure CMOS-based design.

A Word Line Pulse Circuit Technique for Reliable Magnetoelectric Random Access Memory

A word line pulse (WLP) circuit scheme is proposed toward the implementation of magnetoelectric random access memory (MeRAM). The circuit improves the write error rate (WER) and cell area efficiency by generating a better write pulse compared to conventional bitline pulse (BLP) techniques in terms of the pulse slew rate and amplitude. For the voltage-controlled magnetic anisotropy-induced precessional switching of the magnetic tunnel junction (MTJ), the write pulse shape has a large impact on the switching probability. Typically, a square shape pulse results in higher switching probability compared to that of a triangular shape pulse with long rise and falling edges, since the square shape pulse causes a more stable precessional trajectory of the free layer magnetization by providing a relatively constant in-plane-dominant effective field. Compared to the BLP scheme, the WLP can generate a better square shape pulse by eliminating discharge paths under the pulse condition, using the gain of the access transistor, and effectively diminishing the capacitive loading which needs to be driven. A macrospin compact model of voltage-controlled MTJ shows that the WLP can improve WER by