Fuquan Song
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Publication
Featured researches published by Fuquan Song.
Journal of Materials Chemistry | 2008
Jaakko Niinistö; Kaupo Kukli; Aile Tamm; Matti Putkonen; Charles L. Dezelah; Lauri Niinistö; Jun Lu; Fuquan Song; Paul D. Williams; Peter Nicholas Heys; Mikko Ritala; Markku Leskelä
ZrO2 thin films were grown onto silicon (100) substrates by atomic layer deposition (ALD) using novel cyclopentadienyl-type precursors, namely (CpMe)2ZrMe2 and (CpMe)2Zr(OMe)Me (Cp = cyclopentadienyl, C5H5) together with ozone as the oxygen source. Growth characteristics were studied in the temperature range of 250 to 500 °C. An ALD-type self-limiting growth mode was verified for both processes at 350 °C where highly conformal films were deposited onto high aspect ratio trenches. Signs of thermal decomposition were not observed at or below 400 °C, a temperature considerably exceeding the thermal decomposition temperature of the Zr-alkylamides. Processing parameters were optimised at 350 °C, where deposition rates of 0.55 and 0.65 A cycle−1 were obtained for (CpMe)2ZrMe2/O3 and (CpMe)2Zr(OMe)Me/O3, respectively. The films grown from both precursors were stoichiometric and polycrystalline with an increasing contribution from the metastable cubic phase with decreasing film thickness. In the films grown from (CpMe)2ZrMe2, the breakdown field did not essentially depend on the film thickness, whereas in the films grown from (CpMe)2Zr(OMe)Me the structural homogeneity and breakdown field increased with decreasing film thickness. The films exhibited good capacitive properties that were characteristic of insulating oxides and did not essentially depend on the precursor chemistry.
Meeting Abstracts | 2007
Aleksandra Zydor; Simon D. Elliott; Thomas Leese; Fuquan Song; Simon Rushworth
Thin film dielectrics based on hafnium or zirconium oxides are being introduced instead of silica to increase the permittivity of insulating layers in nanoelectronic transistor and memory devices. Atomic layer deposition (ALD) is the process of choice for fabricating these films, and the success of this method depends crucially on the chemical properties of the precursor molecules. Much promise is shown by Hf and Zr metallocenes, i.e. precursors that contain cyclopentadienyl (Cp) ligands [1].
Archive | 2006
Peter Nicholas Heys; Paul Williams; Fuquan Song
Chemistry of Materials | 2007
Jaakko Niinistö; Matti Putkonen; Lauri Niinistö; Fuquan Song; Paul A. Williams; Peter Nicholas Heys; Rajesh Odedra
Microelectronic Engineering | 2007
Kaupo Kukli; Jaakko Niinistö; Aile Tamm; Jun Lu; Mikko Ritala; Markku Leskelä; Matti Putkonen; Lauri Niinistö; Fuquan Song; Paul A. Williams; Peter Nicholas Heys
Archive | 2008
Peter Nicholas Heys; Andrew Kingsley; Fuquan Song; Paul Williams; Thomas Leese; Hywel O. Davies; Rajesh Odedra
Archive | 2008
Peter Nicholas Heys; Andrew Kingsley; Fuquan Song; Paul A. Williams; Thomas Leese; Hywel O. Davies; Rajesh Odedra
Archive | 2008
Peter Nicholas Heys; Andrew Kingsley; Fuquan Song; Paul Williams; Thomas Leese; Hywel O. Davies; Rajesh Odedra
Archive | 2008
Peter Nicholas Heys; Andrew Kingsley; Fuquan Song; Paul Williams; Thomas Leese; Hywel O. Davies; Rajesh Odedra
Surface & Coatings Technology | 2007
Simon Rushworth; K.M. Coward; Hywel O. Davies; Peter Nicholas Heys; Thomas Leese; Louis Kempster; Rajesh Odedra; Fuquan Song; Paul A. Williams