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Dive into the research topics where Fuquan Song is active.

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Featured researches published by Fuquan Song.


Journal of Materials Chemistry | 2008

Advanced cyclopentadienyl precursors for atomic layer deposition of ZrO2 thin films

Jaakko Niinistö; Kaupo Kukli; Aile Tamm; Matti Putkonen; Charles L. Dezelah; Lauri Niinistö; Jun Lu; Fuquan Song; Paul D. Williams; Peter Nicholas Heys; Mikko Ritala; Markku Leskelä

ZrO2 thin films were grown onto silicon (100) substrates by atomic layer deposition (ALD) using novel cyclopentadienyl-type precursors, namely (CpMe)2ZrMe2 and (CpMe)2Zr(OMe)Me (Cp = cyclopentadienyl, C5H5) together with ozone as the oxygen source. Growth characteristics were studied in the temperature range of 250 to 500 °C. An ALD-type self-limiting growth mode was verified for both processes at 350 °C where highly conformal films were deposited onto high aspect ratio trenches. Signs of thermal decomposition were not observed at or below 400 °C, a temperature considerably exceeding the thermal decomposition temperature of the Zr-alkylamides. Processing parameters were optimised at 350 °C, where deposition rates of 0.55 and 0.65 A cycle−1 were obtained for (CpMe)2ZrMe2/O3 and (CpMe)2Zr(OMe)Me/O3, respectively. The films grown from both precursors were stoichiometric and polycrystalline with an increasing contribution from the metastable cubic phase with decreasing film thickness. In the films grown from (CpMe)2ZrMe2, the breakdown field did not essentially depend on the film thickness, whereas in the films grown from (CpMe)2Zr(OMe)Me the structural homogeneity and breakdown field increased with decreasing film thickness. The films exhibited good capacitive properties that were characteristic of insulating oxides and did not essentially depend on the precursor chemistry.


Meeting Abstracts | 2007

An Ab Initio Evaluation of Cyclopentadienyl Precursors for the Atomic Layer Deposition of Hafnia and Zirconia

Aleksandra Zydor; Simon D. Elliott; Thomas Leese; Fuquan Song; Simon Rushworth

Thin film dielectrics based on hafnium or zirconium oxides are being introduced instead of silica to increase the permittivity of insulating layers in nanoelectronic transistor and memory devices. Atomic layer deposition (ALD) is the process of choice for fabricating these films, and the success of this method depends crucially on the chemical properties of the precursor molecules. Much promise is shown by Hf and Zr metallocenes, i.e. precursors that contain cyclopentadienyl (Cp) ligands [1].


Archive | 2006

Cyclopentadienyl type hafnium and zirconium precursors and use thereof in atomic layer deposition

Peter Nicholas Heys; Paul Williams; Fuquan Song


Chemistry of Materials | 2007

Atomic Layer Deposition of HfO2 Thin Films Exploiting Novel Cyclopentadienyl Precursors at High Temperatures

Jaakko Niinistö; Matti Putkonen; Lauri Niinistö; Fuquan Song; Paul A. Williams; Peter Nicholas Heys; Rajesh Odedra


Microelectronic Engineering | 2007

Atomic layer deposition of ZrO2 and HfO2 on deep trenched and planar silicon

Kaupo Kukli; Jaakko Niinistö; Aile Tamm; Jun Lu; Mikko Ritala; Markku Leskelä; Matti Putkonen; Lauri Niinistö; Fuquan Song; Paul A. Williams; Peter Nicholas Heys


Archive | 2008

METHODS OF ATOMIC LAYER DEPOSITION USING TITANIUM-BASED PRECURSORS

Peter Nicholas Heys; Andrew Kingsley; Fuquan Song; Paul Williams; Thomas Leese; Hywel O. Davies; Rajesh Odedra


Archive | 2008

Methods of preparing thin films by atomic layer deposition using monocyclopentadienyl trialkoxy hafnium and zirconium precursors

Peter Nicholas Heys; Andrew Kingsley; Fuquan Song; Paul A. Williams; Thomas Leese; Hywel O. Davies; Rajesh Odedra


Archive | 2008

Methods of preparing titanium containing thin films by atomic layer deposition using monocyclopentadienyl titanium-based precursors

Peter Nicholas Heys; Andrew Kingsley; Fuquan Song; Paul Williams; Thomas Leese; Hywel O. Davies; Rajesh Odedra


Archive | 2008

Methods of atomic layer deposition using hafnium and zirconium-based precursors

Peter Nicholas Heys; Andrew Kingsley; Fuquan Song; Paul Williams; Thomas Leese; Hywel O. Davies; Rajesh Odedra


Surface & Coatings Technology | 2007

Thermal stability studies for advanced Hafnium and Zirconium ALD precursors

Simon Rushworth; K.M. Coward; Hywel O. Davies; Peter Nicholas Heys; Thomas Leese; Louis Kempster; Rajesh Odedra; Fuquan Song; Paul A. Williams

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Lauri Niinistö

Helsinki University of Technology

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Matti Putkonen

Helsinki University of Technology

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