George Russell Olin

Through-thickness mark length variations in laser-irradiated thin films

Low-conductivity, laser-irradiated thin films such as the chalcogenides employed for optical data storage can display manifestations of significant through-thickness thermal gradients. A combined Laplacetra nsform, Fou rier-i nteg ral method was used to derive the tern peratu re distributions in such films, and the results were used to examine the effects of some marking parameters on through-thickness thermal gradients. The results were in good qualitative agreement with experimental observations.