Giuseppe Farruggia

P-173: Reduction of Shorting Defects in OLED Devices

A method to reduce the detrimental effect of shorting defects in OLED devices is presented. The method involves the application of a transparent thin film of appropriate electrical resistance between two electrodes in order to divert the current away from the shorting defects.

10.1: Broadband-Emitting Microcavity-OLED Device

We demonstrate a broadband-emitting microcavity-OLED device by applying a light-scattering layer to a microcavity device to integrate its angular-dependent narrow-band emission and to detrap shorter wavelength light from the substrate. The luminous efficiency is improved, and the use of a thin metal film, in place of ITO, permits larger feature sizes and reduces device costs.

Co/Pt Disks with a Simplified Structure.

Potentially low cost Co/Pt multilayer disks were fabricated using a simplified disk structure. Ultrathin seed layers of dielectrics were used to enhance the coercivity and squareness of the Kerr hysteresis loop. Both Co/Pt superlattices and the dielectrics were deposited under low vacuum. The total cycle time consisting of loading the PC substrate into the vacuum chamber, pumping the sputtering chamber to a base pressure, and deposition of the ITO seed layer and the Co/Pt multilayer was reduced to less than ten seconds. Cyclability and recording performance of the conventional media is retained.