Gerald H. Johnson

A general purpose ATE based I/sub DDQ/ measurement circuit

Previously published measurement circuits offered good solutions for measuring I/sub DDQ/ on a fairly narrow range of part types. Most of these solutions have required adding circuitry either to the DUT board or to the DUT itself. In this paper we describe a general purpose, ATE Pin Electronics Card based, I/sub DDQ/ measurement circuit. It gives good results over a very wide range of device types, supply currents, switching currents, bypass capacitance and I/sub DDQ/ currents.

Challenges of high supply currents during VLSI test

Very high power supply currents required during test of advanced VLSI parts pose problems for both the ATE power supply and the interconnect to the DUT. Power supply design, inductance, resistance, filter capacitance and sense points all become critical. Design of the DUT interface board requires careful attention to detail.