Giancarlo Salviati

On the mechanisms of strain release in molecular‐beam‐epitaxy‐grown InxGa1−xAs/GaAs single heterostructures

Inx Ga1−x As/GaAs single heterostructures have been grown by molecular‐beam epitaxy with different growing rates and In molar fractions. Indium composition, layer thickness, and residual strain have been measured mainly by Rutherford backscattering/channeling spectrometry and the results on selected samples compared with the results of other techniques like Auger electron spectroscopy and single‐ and double‐crystal x‐ray diffraction. Cathodoluminescence, x‐ray topography, transmission electron microscopy, and ion dechanneling have been employed to observe dislocations and to characterize their nature and density. While the onset of misfit dislocations has been found to agree with the predictions of the equilibrium theory, the strain release has been found to be much lower than predicted and the results are compared with the available metastability or nucleation models. Present results are in best agreement with nucleation models. Moreover, annealing experiments show that these heterostructures are at (or ...

InAs/InSb nanowire heterostructures grown by chemical beam epitaxy

We report the Au-assisted chemical beam epitaxy growth of defect-free zincblende InSb nanowires. The grown InSb segments are the upper sections of InAs/InSb heterostructures on InAs(111)B substrates. We show, through HRTEM analysis, that zincblende InSb can be grown without any crystal defects such as stacking faults or twinning planes. Strain-map analysis demonstrates that the InSb segment is nearly relaxed within a few nanometers from the interface. By post-growth studies we have found that the catalyst particle composition is AuIn(2), and it can be varied to a AuIn alloy by cooling down the samples under TDMASb flux.

Zn vacancy induced green luminescence on non-polar surfaces in ZnO nanostructures

Although generally ascribed to the presence of defects, an ultimate assignment of the different contributions to the emission spectrum in terms of surface states and deep levels in ZnO nanostructures is still lacking. In this work we unambiguously give first evidence that zinc vacancies at the (1010) nonpolar surfaces are responsible for the green luminescence of ZnO nanostructures. The result is obtained by performing an exhaustive comparison between spatially resolved cathodoluminescence spectroscopy and imaging and ab initio simulations. Our findings are crucial to control undesired recombinations in nanostructured devices.

Strain relaxation in graded composition InxGa1-xAs/GaAs buffer layers

A model to compute the strain relaxation rate in InxGa1−xAs/GaAs single layers has been tested on several compositionally graded buffer layers. The existence of a critical elastic energy has been assumed as a criterion for the generation of new misfit dislocations. The surface strain accuracy results are within 2.5×10−4. The influence of different grading laws and growth conditions on residual strain, threading dislocation density, misfit dislocation confinement, and surface morphology has been studied. The probability of dislocation interaction and work hardening has been shown to strongly influence the mobility and the generation rate of the dislocations. Optimization of the growth conditions removes residual strain asymmetries and smoothes the surface roughness.

Influence of short-term low current dc aging on the electrical and optical properties of InGaN blue light-emitting diodes

This work describes an experiment on degradation mechanisms of InGaN light-emitting diode (LED) test structures which do not fulfill the requirements of longlife products. We present a combined capacitance-voltage (C-V), deep level transient spectroscopy (DLTS), electroluminescence (EL), and cathodoluminescence (CL) study of short-term instabilities of InGaN∕GaN LEDs submitted to low current aging tests at room temperature. In the early stages of the aging tests, the EL and CL characterizations showed an optical power decrease, more prominent at low current levels. The C-V profiles indicated that the stress induced an apparent charge increase, well related to the deep level changes detected by DLTS and to the optical power decrease. It is supposed that the main cause of the degradation is the generation of nonradiative paths, due to the generation/propagation of defects activated by carrier transport.

Selective Ultrathin Carbon Sheath on Porous Silicon Nanowires: Materials for Extremely High Energy Density Planar Micro-Supercapacitors

Microsupercapacitors are attractive energy storage devices for integration with autonomous microsensor networks due to their high-power capabilities and robust cycle lifetimes. Here, we demonstrate porous silicon nanowires synthesized via a lithography compatible low-temperature wet etch and encapsulated in an ultrathin graphitic carbon sheath, as electrochemical double layer capacitor electrodes. Specific capacitance values reaching 325 mF cm(-2) are achieved, representing the highest specific ECDL capacitance for planar microsupercapacitor electrode materials to date.

Optical evidence of an electrothermal degradation of InGaN-based light-emitting diodes during electrical stress

The optical properties of blue InGaN-based light-emitting diodes aged at high current levels have been studied by electroluminescence and cathodoluminescence. The onset of a broad optical band peaked at about 3.1 eV in devices aged without a heat sink (junction temperature higher than 300 °C) has been correlated to an electrothermal threshold effect. The band is attributed to the dissociation of Mg–H complexes inside the p-type layers and to the consequent formation of Mg-related metastable complexes acting as acceptors. Subsequent electron-beam irradiation determines the almost complete quenching of the band.

Extensive analysis of the luminescence properties of AlGaN/GaN high electron mobility transistors

This paper reports on an extensive analysis of the electroluminescence spectra of GaN-based high-electron mobility transistors (HEMT) submitted to different bias regimes. The results described within this paper indicate that: (i) under ON-state bias conditions, HEMT can emit a weak luminescence signal, localized at the edge of the gate toward the drain side; (ii) for low drain voltage levels, the electroluminescence spectrum has a Maxwellian shape, which is typical for hot carrier luminescence; (iii) for high drain voltage levels, parasitic emission bands are generated, possibly due to the recombination of hot electrons through defect-related sites. Electroluminescence data are compared with results of cathodoluminescence measurements, to provide an interpretation for the experimental results.

Unpredicted Nucleation of Extended Zinc Blende Phases in Wurtzite ZnO Nanotetrapod Arms

Tailoring the structural and electronic properties of 3D nanostructures via bottom-up techniques would pave the way for novel low-cost applications. One of such possibilities is offered by ZnO branched nanostructures like tetrapods, that have recently attracted attention for nanodevice applications from nanoelectronics to drug delivery. The conventional picture is that ZnO arms are thermodynamically stable only in the wurtzite phase. Here, we provide the first experimental evidence of unpredicted extended zinc blend phases (50-60 nm long) embedded in the arms of ZnO wurtzite tetrapods. In particular, decisive evidence is obtained from the one-to-one correlation between high lateral resolution cathodoluminescence spectroscopy, monochromatic contrast maps, and atomic resolution transmission electron microscopy images of ZnO single TPs. This observation is not specific to ZnO and can have a general validity for the understanding of the nucleation mechanisms in semiconducting 3D nanostructures for device applications.

Antiphase disorder in GaAs/Ge heterostructures for solar cells

Antiphase disorder in metal organic vapour phase epitaxy grown GaAs/(100)Ge heterostructures has been studied both in as-grown materials and in GaAs solar cells by chemical etching, transmission electron microscopy, and cathodoluminescence. All the samples are single domains at the surface due to the self-annihilation of antiphase domains whose size decreases as the misorientation angle increases. Completely antiphase domain-free epitaxy has been achieved for substrate miscuts greater than 3 degrees off towards [111]. A reversal in sublattice location has been found in the GaAs layers varying the misorientation angle and the growth temperature. A model to explain this result has been proposed based on the role of surface steps in the nucleation process. Strong interaction between antiphase boundaries and misfit dislocations has been found in all the heterostructures. In solar cells antiphase domains have been observed in high densities in the initial layer of GaAs deposited on Ge. The successful realisation of high efficiency solar cells is due to the overgrowth of these domains by single phase material over most of the wafer area.