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Dive into the research topics where Gopal G. Pethuraja is active.

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Featured researches published by Gopal G. Pethuraja.


photovoltaic specialists conference | 2012

Broadband nanostructured antireflection coating on glass for photovoltaic applications

Roger E. Welser; Adam W. Sood; Gopal G. Pethuraja; Ashok K. Sood; Xing Yan; David J. Poxson; Jaehee Cho; E. Fred Schubert; Jennifer L. Harvey

Ultra-high, omnidirectional transmittance through a coated glass window is demonstrated over the entire accessible portion of the solar spectrum. The average broadband transmittance has been increased to greater than 98.5% at normal incidence, and exceeds 97.8% at all wavelengths between 440 nm and 1800 nm, significantly outperforming conventional MgF2 coated glass. The measured improvement in transmittance results from coating the window with a new class of materials consisting of porous SiO2 nanorods. The step-graded antireflection structure also exhibits excellent omnidirectional performance, enabling average broadband transmittance in excess of 96% at incident angles as high as 70°.


Proceedings of SPIE | 2012

Development of large area nanostructure antireflection coatings for EO/IR sensor applications

Ashok K. Sood; Gopal G. Pethuraja; Roger E. Welser; Yash R. Puri; Nibir K. Dhar; Priyalal S. Wijewarnasuriya; Jay Lewis; Harry Efsthadiatis; Pradeep Haldar; E. F. Schubert

Electro-optical/infrared sensors are being developed for a variety of defense and commercial systems applications. One of the critical technologies that will enhance EO/IR sensor performance is the development of advanced antireflection coatings with both broadband and omnidirectional characteristics. In this paper, we review our latest work on high quality nanostructure-based antireflection structures, including recent efforts to deposit nanostructured antireflection coatings on large area substrates. Nanostructured antireflection coatings fabricated via oblique angle deposition are shown to enhance the optical transmission through transparent windows by minimizing broadband reflection losses to less than one percent, a substantial improvement over conventional thin-film antireflection coating technologies. Step-graded antireflection structures also exhibit excellent omnidirectional performance, and have recently been demonstrated on 6-inch diameter substrates.


Proceedings of SPIE | 2013

Design and development of wafer-level short wave infrared micro-camera

Ashok K. Sood; Robert A. Richwine; Gopal G. Pethuraja; Yash R. Puri; Je-Ung Lee; Pradeep Haldar; Nibir K. Dhar

Low cost IR Sensors are needed for a variety of Defense and Commercial Applications as low cost imagers for various Army and Marine missions. SiGe based IR Focal Planes offers a low cost alternative for developing wafer-level shortwave infrared micro-camera that will not require any cooling and can operate in the Visible-NIR band. The attractive features of SiGe based IRFPA’s will take advantage of Silicon based technology, that promises small feature size and compatibility with the low power silicon CMOS circuits for signal processing. SiGe technology offers a low cost alternative for developing Visible-NIR sensors that will not require any cooling and can operate from 0.4- 1.7 microns. The attractive features of SiGe based IRFPA’s will take advantage of Silicon based technology that can be processed on 12-inch silicon substrates, that can promise small feature size and compatibility with the Silicon CMOS circuit for signal processing. In this paper, we will discuss the design and development of Wafer-Level Short Wave Infrared (SWIR) Micro-Camera. We will discuss manufacturing approaches and sensor configurations for short wave infrared (SWIR) focal plane arrays (FPAs) that significantly reduce the cost of SWIR FPA packaging, optics and integration into micro-systems.


photovoltaic specialists conference | 2013

Large-area nanostructured self-assembled antireflection coatings for photovoltaic devices

Gopal G. Pethuraja; Adam W. Sood; Roger E. Welser; Ashok K. Sood; Harry Efstathiadis; Pradeep Haldar; Jennifer L. Harvey

The scalability of nanostructured, self-assembled antireflection (AR) coatings has been demonstrated on 6-inch glass and silicon wafers. Ultra-high transmittance through these large-area coatings has been confirmed by measuring the short circuit current of a CIGS-based thin film photovoltaic (PV) device placed below the large-area AR-coated glass wafer. At normal light incidence, the light transmitted through the AR coated glass wafer yields 5% more short-circuit current compared to the uncoated glass wafer. At off-angle incidence, the light transmitted through the AR-coated wafer yields nearly 20% higher short-circuit current compared to light transmitted through an uncoated glass wafer. The large-area AR coating preserves ultra-high transmittance over a wide range of incident angles and has the potential to enhance PV device performance from dawn to dusk.


Proceedings of SPIE | 2013

Development of large area nanostructured AR coatings for EO/IR sensor applications

Ashok K. Sood; Gopal G. Pethuraja; Adam W. Sood; Roger E. Welser; Yash R. Puri; Pradeep Haldar; E. Fred Schubert; Nibir K. Dhar; Priyalal S. Wijewarnasuriya

Electro-optical/infrared nanosensors are being developed for a variety of defense and commercial systems applications. One of the critical technologies that will enhance EO/IR sensor performance is the development of advanced antireflection coatings with both broadband and omnidirectional characteristics. In this paper, we review our latest work on high quality nanostructure-based antireflection structures, including recent efforts to deposit nanostructured antireflection coatings on large area substrates. Nanostructured antireflection coatings fabricated via oblique angle deposition are shown to enhance the optical transmission through transparent windows by minimizing broadband reflection losses to less than one percent, a substantial improvement over conventional thin-film antireflection coating technologies. Step-graded antireflection structures also exhibit excellent omnidirectional performance, and have recently been demonstrated on 6-inch diameter substrates.


Next Generation (Nano) Photonic and Cell Technologies for Solar Energy Conversion II | 2011

High-voltage quantum well waveguide solar cells

Roger E. Welser; Gopal G. Pethuraja; Ashok K. Sood; Oleg Laboutin; Mark Chaplin; Van Un; Wayne Johnson; Adam W. Sood; David J. Poxson; Jaehee Cho; E. Fred Schubert; Pradeep Haldar; Jennifer L. Harvey

Photon absorption, and thus current generation, is hindered in conventional thin-film solar cell designs, including quantum well structures, by the limited path length of incident light passing vertically through the device structure. Optical scattering into lateral waveguide structures provides a physical mechanism to dramatically increase photocurrent generation through in-plane light trapping. However, the insertion of wells of high refractive index material with lower energy gap into the device structure often results in lower voltage operation, and hence lower photovoltaic power conversion efficiency. In this work, we demonstrate that the voltage output of an InGaAs quantum well waveguide photovoltaic device can be increased by employing a novel III-V material structure with an extended wide band gap emitter heterojunction. Analysis of the light IV characteristics from small area test devices reveals that nonradiative recombination components of the underlying dark diode current have been reduced, exposing the limiting radiative recombination component and providing a pathway for realizing solar-electric conversion efficiency of 30% or more in single-junction cells.


Infrared Sensors, Devices, and Applications VII | 2017

Development of nanostructured antireflection coatings for infrared technologies and applications

John Zeller; Roger E. Welser; Pradeep Haldar; Harry Efstathiadis; Nibir K. Dhar; Ashok K. Sood; Gopal G. Pethuraja; Priyalal S. Wijewarnasuriya

Infrared (IR) sensing technologies and systems operating from the near-infrared (NIR) to long-wave infrared (LWIR) spectra are being developed for a variety of defense and commercial systems applications. Reflection losses affecting a significant portion of the incident signal limits the performance of IR sensing systems. One of the critical technologies that will overcome this limitation and enhance the performance of IR sensing systems is the development of advanced antireflection (AR) coatings. Magnolia is actively involved in the development and advancement of ultrahigh performance AR coatings for a wide variety of defense and commercial applications. Ultrahigh performance nanostructured AR coatings have been demonstrated for UV to LWIR spectral bands using various substrates. The AR coatings enhance the optical transmission through optical components and devices by significantly minimizing reflection losses, a substantial improvement over conventional thin-film AR coating technologies. Nanostructured AR coatings are fabricated using a tunable self-assembly process on substrates that are transparent for a given spectrum of interest ranging from UV to LWIR. The nanostructured multilayer structures have been designed, developed and optimized for various optoelectronic applications. The optical properties of the AR-coated optical components and sensor substrates have been measured and fine-tuned to achieve a predicted high level of performance of the coatings. In this paper, we review our latest work on high quality nanostructure-based AR coatings, including recent efforts towards the development of nanostructured AR coatings on IR-transparent substrates.


Infrared Sensors, Devices, and Applications VIII | 2018

Nanostructured antireflection coatings for infrared sensors and applications

Priyalal S. Wijewarnasuriya; Harry Efstathiadis; Ashok K. Sood; Gopal G. Pethuraja; John Zeller; Roger E. Welser

Infrared (IR) technology plays a critical role in a wide range of terrestrial and space applications. IR sensing technologies and systems operating from the near-infrared (NIR) to long-wave infrared (LWIR) spectra are being developed for a variety of defense and commercial system applications. However, the performance of IR systems can be significantly limited by signal losses due to reflections from the IR substrates. Optical coatings with high antireflection (AR) characteristics can overcome this limitation and yield substantial enhancement in IR system performance. Magnolia is actively working on the development and advancement of ultrahigh performance AR coatings for a wide variety of defense and commercial applications. These nanostructured AR coatings have been demonstrated for ultraviolet (UV) to LWIR spectral bands on various substrates. The AR coatings enhance the transmission of light through optical components and devices by significantly minimizing reflection losses, providing substantial improvement over conventional thin film AR coating technologies. Nanostructured AR coatings have been fabricated using a tunable self-assembly process on substrates transparent for a given spectra of interest ranging from the UV to LWIR. The nanostructured multilayer coatings have been designed, developed and optimized for various optoelectronic applications. The optical properties of AR-coated optical and IR components and sensor substrates have been measured and fine-tuned to achieve a high level of performance. In this paper, we review our latest work focusing on high quality nanostructure-based AR coatings, including recent efforts to develop of the nanostructured coatings on IR-transparent substrates.


Image Sensing Technologies: Materials, Devices, Systems, and Applications IV | 2017

Development of nanostructured antireflection coatings for infrared image sensing technologies

Gopal G. Pethuraja; John Zeller; Roger E. Welser; Ashok K. Sood; Harry Efstathiadis; Pradeep Haldar; Eric A. DeCuir; Priyalal S. Wijewarnasuriya; Nibir K. Dhar

Image sensing technologies and systems operating from the ultraviolet (UV) to long-wave infrared (LWIR) spectral range are being developed for a variety of defense and commercial systems applications. Reflection loss of a significant portion of the incident signal limits the performance of image sensing systems. One of the critical technologies that will overcome this limitation and enhance image sensor performance is the development of advanced antireflection (AR) coatings. In this paper, we review our latest work on high-quality nanostructure-based AR structures, including recent efforts to deposit nanostructured AR coatings on substrates transparent to infrared (IR) radiation. Nanostructured AR coatings fabricated via a scalable self-assembly process are shown to enhance the optical transmission through transparent optical components by minimizing reflection losses in the spectral band of interest to less than one percent, a substantial improvement over conventional thin-film AR coating technologies. Step-graded AR structures also exhibit excellent omnidirectional performance, and have recently been demonstrated in medium wavelength and long wavelength IR spectral bands.


Image Sensing Technologies: Materials, Devices, Systems, and Applications III | 2016

Development of nanostructured antireflection coatings for EO/IR sensor applications

Gopal G. Pethuraja; Roger E. Welser; Ashok K. Sood; Harry Efstathiadis; Pradeep Haldar; Priyalal S. Wijewarnasuriya; Nibir K. Dhar

Electro-optical/infrared (EO/IR) nanosensors are being developed for a variety of defense and commercial systems applications. One of the critical technologies that will enhance EO/IR sensor performance is the development of advanced antireflection coatings. In this paper, we review our latest work on high quality nanostructure-based antireflection structures, including recent efforts to deposit nanostructured antireflection coatings on IR substrates. Nanostructured antireflection coatings fabricated via oblique angle deposition are shown to enhance the optical transmission through transparent windows by minimizing reflection losses at the spectral band of interest to less than one percent, a substantial improvement over conventional thin-film antireflection coating technologies. Step-graded antireflection structures also exhibit excellent omnidirectional performance, and have recently been demonstrated with good performance in medium wavelength and long wavelength IR spectral bands.

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Harry Efstathiadis

State University of New York System

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Yash R. Puri

University of Massachusetts Lowell

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John Zeller

Naval Undersea Warfare Center

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Adam W. Sood

Rensselaer Polytechnic Institute

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E. Fred Schubert

Rensselaer Polytechnic Institute

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David J. Poxson

Rensselaer Polytechnic Institute

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