Graham Rowlands

Voltage-Induced Ferromagnetic Resonance in Magnetic Tunnel Junctions

We demonstrate excitation of ferromagnetic resonance in CoFeB/MgO/CoFeB magnetic tunnel junctions (MTJs) by the combined action of voltage-controlled magnetic anisotropy (VCMA) and spin transfer torque (ST). Our measurements reveal that GHz-frequency VCMA torque and ST in low-resistance MTJs have similar magnitudes, and thus that both torques are equally important for understanding high-frequency voltage-driven magnetization dynamics in MTJs. As an example, we show that VCMA can increase the sensitivity of an MTJ-based microwave signal detector to the sensitivity level of semiconductor Schottky diodes.

Switching current reduction using perpendicular anisotropy in CoFeB–MgO magnetic tunnel junctions

We present in-plane CoFeB–MgO magnetic tunnel junctions with perpendicular magnetic anisotropy in the free layer to reduce the spin transfer induced switching current. The tunneling magnetoresistance ratio, resistance-area product, and switching current densities are compared in magnetic tunnel junctions with different CoFeB compositions. The effects of CoFeB free layer thickness on its magnetic anisotropy and current-induced switching characteristics are studied by vibrating sample magnetometry and electrical transport measurements on patterned elliptical nanopillar devices. Switching current densities ∼4 MA/cm2 are obtained at 10 ns write times.

Low writing energy and sub nanosecond spin torque transfer switching of in-plane magnetic tunnel junction for spin torque transfer random access memory

This work investigated in-plane MgO-based magnetic tunnel junctions (MTJs) for the application of spin torque transfer random access memory (STT-RAM). The MTJ in this work had an resistance area product (RA) = 4.3 Ω·μm2, tunneling magnetoresistance ratio ∼135%, thermal stability factor Δ(H)=68 (by field measurement), and Δ(I) = 50 (by current measurement). The optimal writing energy was found to be 0.286 pJ per bit at 1.54 ns for antiparallel (AP) state to parallel (P) state switching, and 0.706 pJ per bit at 0.68 ns for P state to AP state switching. Ultra fast spin torque transfer (STT) switching was also observed in this sample at 580 ps (AP to P) and 560 ps (P to AP). As a result, 0.6–1.3 GHz was determined to be the optimal writing rate from writing energy consumption of view. These results show that in-plane MgO MTJs are still a viable candidate as the fast memory cell for STT-RAM.

Deep subnanosecond spin torque switching in magnetic tunnel junctions with combined in-plane and perpendicular polarizers

We show that adding a perpendicular polarizer to a conventional spin torque memory element with an in-plane free layer and an in-plane polarizer can significantly increase the write speed and decrease the write energy of the element. We demonstrate the operation of such spin torque memory elements with write energies of 0.4 pJ and write times of 0.12 ns.

Strategies and tolerances of spin transfer torque switching

Schemes of switching memories based on magnetic tunnel junctions via the effect of spin torque with various polarizations of injected electrons are studied. Simulations based on macrospin and micromagnetic theories without account of thermal fluctuations are performed and compared. We demonstrate that short-pulse precessional switching with perpendicularly polarized current requires a shorter time and smaller energy than switching with collinear in-plane spin polarization. We also show that memory cells based on precessional switching are superior to those in current technologies. We study the dependence of switching on the magnitude of current and pulse duration. An increased Gilbert damping is found to improve tolerances of perpendicular-polarization switching without increasing the threshold current, unlike in-plane switching.

Low Write-Energy Magnetic Tunnel Junctions for High-Speed Spin-Transfer-Torque MRAM

This letter presents energy-efficient MgO based magnetic tunnel junction (MTJ) bits for high-speed spin transfer torque magnetoresistive random access memory (STT-MRAM). We present experimental data illustrating the effect of device shape, area, and tunnel-barrier thickness of the MTJ on its switching voltage, thermal stability, and energy per write operation in the nanosecond switching regime. Finite-temperature micromagnetic simulations show that the write energy changes with operating temperature. The temperature sensitivity increases with increasing write pulsewidth and decreasing write voltage. We demonstrate STT-MRAM cells with switching energies of <;1 pJ for write times of 1-5 ns.

Sub-200ps spin transfer torque switching in in-plane magnetic tunnel junctions with interface perpendicular anisotropy

Ultrafast spin transfer torque (STT) switching in an in-plane MgO magnetic tunnel junction with 50 nm×150 nm elliptical shape was demonstrated in this paper. Switching speeds as short as 165 ps and 190 ps at 50% and 98% switching probabilities, respectively, were observed without external field assistance in a thermally stable junction with a 101% tunnelling magnetoresistance ratio. The minimum writing energy of P-AP switching for 50% and 98% switching probability are 0.16 pJ and 0.21 pJ, respectively. The observed ultrafast switching is believed to occur because of partially cancelled out-of-plane demagnetizing field in the free layer from interface perpendicular anisotropy between the MgO layer and the Co20Fe60B20 layer. High J/Jc0 ratio and magnetization nucleation at the edge of free layer, which result from the reduced perpendicular demagnetizing field, are possibly two major factors that contribute to the ultrafast STT switching.

Effect of resistance-area product on spin-transfer switching in MgO-based magnetic tunnel junction memory cells

We use ultrafast current-induced switching measurements to study spin-transfer switching performance metrics, such as write energy per bit (EW) and switching current density (Jc), as a function of resistance-area product (RA) (hence MgO thickness) in magnetic tunnel junction cells used for magnetoresistive random access memory (MRAM). EW increases with RA, while Jc decreases with increasing RA for both switching directions. The results are discussed in terms of RA optimization for low write energy and current drive capability (hence density) of the MRAM cells. Switching times <2 ns and write energies <0.3 pJ are demonstrated for 135 nm×65 nm CoFeB/MgO/CoFeB devices.

Nonlinear ferromagnetic resonance induced by spin torque in nanoscale magnetic tunnel junctions

Spin transfer torque can excite ferromagnetic resonance of magnetization in a nanoscale magnetic tunnel junction. Here we describe a strongly nonlinear regime of spin-torque-driven ferromagnetic resonance in which large-amplitude magnetization oscillations are excited by microwave current applied to the junction. In this nonlinear regime, the junction generates a large direct voltage in response to the applied microwave signal and thereby can serve as a sensitive microwave signal detector. We demonstrate a low-temperature detector sensitivity of 2.5 × 104 V/W, which exceeds the sensitivity of metal-semiconductor Schottky diodes.

Reduction of switching current density in perpendicular magnetic tunnel junctions by tuning the anisotropy of the CoFeB free layer

The spin torque switching behavior of perpendicular magnetic tunnel junctions consisting of a CoFeB free layer and a CoFeB/Ru/(Co/Pd)n exchanged coupled fixed layer is investigated. At first, the Ru and CoFeB layer thickness is tuned in the CoFeB/Ru/(Co/Pd)n structure to form a ferromagnetically exchange coupled structure with a strong PMA at an annealing treatment of 325 °C for 1 h. Then it is shown that that the CoFeB free layer thickness plays an important role in the switching current density. The switching current density decreases with the increase of the CoFeB free layer thickness. A minimum switching current density of 1.87 MA/cm2 is achieved for a device with 60 nm diameter. The mechanism involved in the switching current reduction with the decrease of CoFeB free layer thickness is also studied.