Hae-Jun Seo
Chungbuk National University
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Publication
Featured researches published by Hae-Jun Seo.
international conference on information and communication technology convergence | 2010
Hae-Jun Seo; Yoonseok Heo; Se-Hwan Han; Tae Won Cho
The content in terms of ACL function which adjusts the brightness automatically as a function related to an OLED driver IC design of QVGA(320×240) is presented in this paper. ACL function adjusts luminance automatically as the brightness of adjacent circumstance and unnecessary power consumption of display panel can be reduced. Verification method is that original image is applied to ACL function and compare original image and result image.
international conference on future generation information technology | 2012
Hae-Jun Seo; Yoonseok Heo; Tae-Won Cho
This paper presents a method for constructing a memory system using defective memory chips comprising faulty storage blocks. The three-dimensional memory system introduced here employs a die-stacked structure of faulty memory chips. Signals lines passing through the through-silicon-vias (TSVs) connect chips in the defect tolerant structure. Defective chips are classified into several groups each group comprising defective chips having faulty blocks at the same location. A defect tolerant memory system is constructed using chips from different groups. Defect-free storage blocks from spare chips replace faulty blocks using additional routing circuitry. The number of spare memory chips for defect tolerance is s=
FGIT-GDC/CA | 2010
Hae-Jun Seo; Se-Hwan Han; Yoonseok Heo; Tae-Won Cho
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Journal of IKEEE | 2012
Hae-Jun Seo; Haing-Sup Jung; Gi-Ju Ryu; Tae-Won Cho
( k × n ) / ( m --- k )
대한전자공학회 학술대회 | 2012
Hae-Jun Seo; Dong-Keun Song; Gi-Ju Ryu; Tae-Won Cho
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ICEIC : International Conference on Electronics, Informations and Communications | 2010
Hae-Jun Seo; Se-Hwan Han; Gi-Ju Ryu; Jong-Bok Ahn; Tae-Won Cho
to make a system defect tolerant for (n + s) chips with k faulty blocks among m independently addressable blocks.
대한전자공학회 학술대회 | 2009
Hae-Jun Seo; Yeon-Ho Kim; Sung-Hyun Lee; Gi-Ju Ryu; Man-Ho Seung; Tae-Won Cho
BCH(Bose-Chaudhuri-Hoquenbhem) code, a type of block codes-cyclic codes, has very strong error-correcting ability which is vital for performing the error protection on the memory system. BCH code has many kinds of dual algorithms, PGZ(Pererson-Gorenstein-Zierler) algorithm out of them is advantageous in view of correcting the errors through the simple calculation in t value. However, this is problematic when this becomes 0 (divided by zero) in case ν ≠ t. In this paper, the circuit would be simplified by suggesting the multi-mode hardware architecture in preparation that v were 0~3. First, production cost would be less thanks to the smaller number of gates. Second, lessening power consumption could lengthen the recharging period. The very low cost and simple datapath make our design a good choice in small-footprint SoC(System on Chip) as ECC(Error Correction Code/Circuit) in memory system.
Journal of the Institute of Electronics Engineers of Korea | 2009
Young-Woon Kim; Hae-Jun Seo; Se-Hwan Han; Tae-Won Cho
대한전자공학회 학술대회 | 2008
Hae-Jun Seo; Young-Woon Kim; Tae-Won Cho
ITC-CSCC :International Technical Conference on Circuits Systems, Computers and Communications | 2008
Hae-Jun Seo; Young-Woon Kim; Tae-Won Cho