Han Gyeol Park

Temperature dependence of the dielectric functions and the critical points of InSb by spectroscopic ellipsometry from 31 to 675 K

We report the complex dielectric function of InSb for temperatures from 31 to 675 K and energies from 0.74 to 6.42 eV. The spectra were obtained by rotating-compensator spectroscopic ellipsometry on bulk InSb. The critical point (CP) energies were determined using numerically calculated second energy derivatives of the data. At low temperature, the CP structures are blue-shifted and significantly sharpened relative to those seen at high temperature. The temperature dependence of the E1, E1+Δ1, E0′, Δ5cu-Δ5vu (0.35, 0, 0), E0′+Δ0′, Δ5cl-Δ5vu (0.35, 0, 0), E2, E2′, E2+Δ2, E2′+Δ2, E1′, E1′+Δ1′, and E1′+Δ1′+Δ1 CPs was determined by fitting to a phenomenological expression that contains the Bose-Einstein statistical factor or to a linear equation. In particular, temperature dependences of CPs below 100 K and those of the E0′, E0′+Δ0′, E2′, E2+Δ2, E2′+Δ2, E1′+Δ1′, and E1′+Δ1′+Δ1 transitions have not previously been reported.

Temperature dependent dielectric function and the E0 critical points of hexagonal GaN from 30 to 690 K

The complex dielectric function ɛ and the E0 excitonic and band-edge critical-point structures of hexagonal GaN are reported for temperatures from 30 to 690 K and energies from 0.74 to 6.42 eV, obtained by rotating-compensator spectroscopic ellipsometry on a 1.9 μm thick GaN film deposited on a c-plane (0001) sapphire substrate by molecular beam epitaxy. Direct inversion and B-splines in a multilayer-structure calculation were used to extract the optical properties of the film from the measured pseudodielectric function ⟨ɛ⟩. At low temperature sharp E0 excitonic and critical-point interband transitions are separately observed. Their temperature dependences were determined by fitting the data to the empirical Varshni relation and the phenomenological expression that contains the Bose-Einstein statistical factor.

Parameterization of the dielectric function of InP from 1.19 to 6.57 eV for temperatures from 25 to 700 K

We present an analytic expression that accurately represents the dielectric function ɛ = ɛ1 + iɛ2 of InP from 1.19 to 6.57 eV for temperatures from 25 to 700 K. The original data were obtained on a InP substrate by spectroscopic ellipsometry. The analytic representation is based on the parametric model, which is known to accurately portray ɛ without unphysical assumptions. The ɛ data are successfully reconstructed by eight Gaussian-broadened polynomials and a pole and can be used to determine ɛ as a continuous function of energy and temperature within the limits given above. Our results should be useful in a number of contexts, including device design and in situ monitoring of deposition. A representative deposition example is discussed.

Temperature dependence of the critical points of monolayer MoS2 by ellipsometry

ABSTRACT We report the complex pseudodielectric function of molybdenum disulfide (MoS2) monolayers for energies from 1.40 to 6.42 eV and temperatures from 35 to 350 K. MoS2 was grown as a continuous monolayer on a SiO2/Si substrate in a two zone hot-wall furnace using a catalyst-free chemical vapor growth process. The monolayer was then transferred onto a sapphire substrate. We investigated the optical properties of MoS2 using a dual-rotating-compensator ellipsometer with the sample in ultrahigh vacuum to prevent degradation and to minimize condensation artifacts in the data at low sample temperatures. Critical-point (CP) energies were determined using numerically calculated second energy derivatives of the spectra. At low temperature, we observed a splitting of A-excitonic peak. This identifies the bound excitonic states, including negatively charged excitons, trion states in monolayer MoS2. Splitting of the B-excitonic peak is also indicated. Blue shifts of the CP energies and enhanced structures with reduced electron–phonon interaction are observed as the temperature is lowered. The temperature dependences of the CP energies were fit to a phenomenological expression that contains the Bose–Einstein statistical factor and the temperature coefficient.

Temperature Dependence of the Dielectric Function of Monolayer MoSe 2

The dielectric function

Multifunctional Bilayer Template for Near-Infrared Sensitive Organic Solar Cells

{\boldsymbol{\varepsilon }}{\boldsymbol{=}}{{\boldsymbol{\varepsilon }}}_{{\bf{1}}}{\boldsymbol{+}}{\bf{i}}{{\boldsymbol{\varepsilon }}}_{{\bf{2}}}

Parametrization of the Optical Constants of AlAs x Sb 1-x Alloys in the Range 0.74-6.0 eV

ε=ε1+iε2 of monolayer molybdenum diselenide (MoSe2) is obtained and analyzed at temperatures from 31 to 300 K and at energies from 0.74 to 6.42 eV. The sample is a large-area, partially discontinuous monolayer (submonolayer) film of MoSe2 grown on a sapphire substrate by selenization of pulsed laser deposited MoO3 film. Morphological and optical characterizations verified the excellent quality of the film. The MoSe2 data were analyzed using the effective medium approximation, which treats the film and bare substrate regions as a single layer. Second derivatives of ε with respect to energy were numerically calculated and analyzed with standard lineshapes to extract accurate critical-point (CP) energies. We find only 6 CPs for monolayer MoSe2 at room temperature. At cryogenic temperatures 6 additional structures are resolved. The separations in the B- and C-excitonic peaks are also observed. All structures blue-shift and sharpen with decreasing temperature as a result of the reducing lattice constant and electron-phonon interactions. The temperature dependences of the CP energies were determined by fitting the data to the phenomenological expression that contains the Bose-Einstein statistical factor and the temperature coefficient.

Three-Dimensional Analysis of the Collapse of a Fatty Acid at Various Compression Rates using In Situ Imaging Ellipsometry

The complex dielectric function and band-edge critical point structures of Bi1.85Gd0.15Te3 are reported for temperatures from 28 to 300 K and energies from 0.74 to 6 eV, obtained on bulk Bi1.85Gd0.15Te3 by rotating-compensator spectroscopic ellipsometry. The critical point (CP) energies are determined using numerically calculated second energy derivatives of the data. At low temperature, eight CP structures are identified, while only four CPs are observed at room temperature. As temperature decreases, we also observe blue shifts and significantly enhanced CP structures relative to those obtained at room temperature. The temperature dependence of the CPs are determined by fitting the data to the temperature coefficient and a phenomenological expression that contains the Bose-Einstein statistical factor.