Hans-Joachim Büchner
Technische Universität Ilmenau
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Publication
Featured researches published by Hans-Joachim Büchner.
Metrology, inspection, and process control for microlithography. Conference | 2006
Gerd Jäger; Tino Hausotte; Hans-Joachim Büchner; Eberhard Manske; Ingomar Schmidt; Rostyslav Mastylo
The paper describes the operation of a high-precision long range three-dimensional nanopositioning and nanomeasuring machine (NPM-Machine). The NPM-Machine has been developed by the Institute of Process Measurement and Sensor Technology of the Technische Universität Ilmenau. The machine was successfully tested and continually improved in the last few years. The machines are operating successfully in several German and foreign research institutes including the Physikalisch-Technische Bundesanstalt (PTB). Three plane mirror miniature interferometers are installed into the NPM-machine having a resolution of less than 0,1 nm over the entire positioning and measuring range of 25 mm x 25 mm x 5 mm. An Abbe offset-free design of the three miniature plane mirror interferometers and applying a new concept for compensating systematic errors resulting from mechanical guide systems provide extraordinary accuracy with an expanded uncertainty of only 5 - 10 nm. The integration of several, optical and tactile probe systems and nanotools makes the NPM-Machine suitable for various tasks, such as large-area scanning probe microscopy, mask and wafer inspection, nanostructuring, biotechnology and genetic engineering as well as measuring mechanical precision workpieces, precision treatment and for engineering new material. Various developed probe systems have been integrated into the NPM-Machine. The measurement results of a focus sensor, metrological AFM, white light sensor, tactile stylus probe and of a 3D-micro-touch-probe are presented. Single beam-, double beam- and triple beam interferometers built in the NPM-Machine for six degrees of freedom measurements are described.
Archive | 2006
G. Jäger; Tino Hausotte; Eberhard Manske; Hans-Joachim Büchner; Rostyslav Mastylo; N. Dorozhovets; Roland Füßl; Rainer Grünwald
The paper describes the operation of a high-precision wide scale three-dimensional nanopositioning and nanomeasuring machine (NPM-Machine) having a resolution of 0,1 nm over the positioning and measuring range of 25 mm × 25 mm × 5 mm. The NPM-Machine has been developed by the Technische Universitat Ilmenau and manufactured by the SIOS Mestechnik GmbH Ilmenau. The machines are operating successfully in several German and foreign research institutes including the Physikalisch-Technische Bundesanstalt (PTB).
Archive | 2005
Hans-Joachim Büchner; Tino Hausotte; Eberhard Manske
Shaping the Future by Engineering: Proceedings ; 58th IWK, Ilmenau Scientific Colloquium, Technische Universität Ilmenau, 8 - 12 September 2014 | 2014
Kerstin John; René Theska; Eberhard Manske; Hans-Joachim Büchner
MRS Proceedings | 2008
Sindy Hauguth-Frank; V. Lebedev; K. Tonisch; Henry Romanus; Thomas Kups; Hans-Joachim Büchner; Gerd Jäger; O. Ambacher; Andreas Schober
<b>Publikation entstand im Rahmen von :</b><br/>#R##N#International Conference Sensors and Systems, 24.-27. Juni 2002, St. Petersburg, Russland | 2007
Tino Hausotte; Hans-Joachim Büchner; Rainer Grünwald
Archive | 2005
Hans-Joachim Büchner; Tino Hausotte; Eberhard Manske
Archive | 2001
Hans-Joachim Büchner; R. Carius; Gerd Jäger; Dietmar Knipp; Helmut Stiebig
Archive | 2001
Hans-Joachim Büchner; Gerd Jäger; Dietmar Knipp; Helmut Stiebig
Archive | 2000
Hans-Joachim Büchner; Gerd Jäger; Eberhard Manske; Andreas Müller