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Hans-Jürgen Fleischer

SUSS MicroTec

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Publication

Featured researches published by Hans-Jürgen Fleischer.

Archive | 2007

PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UNDER USE OF PROBE SUPPORTS

Stojan Kanev; Hans-Jürgen Fleischer; Stefan Kreissig; Karsten Stoll; Axel Schmidt; Andreas Kittlaus

Archive | 2004

Method and prober for contacting a contact area with a contact tip

Stefan Schneidewind; Claus Dietrich; Jörg Dr. Kiesewetter; Stojan Kanev; Stefan Kreissig; Frank Fehrmann; Hans-Jürgen Fleischer

Archive | 2008

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

Stojan Kanev; Hans-Jürgen Fleischer; Stefan Kreissig; Jörg Kiesewetter

Archive | 2004

Contact area contacting method for prober, involves observing vertical movement of semiconductor wafer along observation axis which runs in plane that is slight distance away from free wafer surface in its expected end position

Claus Dietrich; Frank Fehrmann; Hans-Jürgen Fleischer; Stojan Kanev; Jörg Kiesewetter; Stefan Kreissig; Stefan Schneidewind

Archive | 2007

Probe station for e.g. testing semiconductor substrates, has positioning system positioning substrate with respect to sensors, housing enclosing chuck and sensors to form electromagnetic shielding

Hans-Jürgen Fleischer; Stojan Kanev; Andreas Kittlaus; Stefan Kreissig; Axel Schmidt; Karsten Stoll

Archive | 2007

Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus

Hans-Jürgen Fleischer; Axel Schmidt; Stojan Kanev; Axel Becker

Archive | 2009

Verfahren zur Prüfung eines Testsubstrats in einem Prober unter definierten thermischen Bedingungen

Michael Teich; Stojan Kanev; Hans-Jürgen Fleischer

Archive | 2007

Probe support with shield for the examination of test substrates under use of probe supports

Stojan Kanev; Hans-Jürgen Fleischer; Stefan Kreissig; Karsten Stoll; Axel Schmidt; Andreas Kittlaus

Archive | 2009

Verfahren und Anordnung zur Positionierung einer Probecard

Stojan Kanev; Hans-Jürgen Fleischer; Stefan Kreißig; Jörg Kiesewetter

Archive | 2008

Sondenaufnahme zur Halterung einer Sonde zur Prüfung von Halbleiterbauelementen, Sondenhalterarm und Prüfvorrichtung

Axel Becker; Hans-Jürgen Fleischer; Stojan Kanev; Axel Schmidt

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Collaboration

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Stojan Kanev

SUSS MicroTec

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Stefan Kreissig

SUSS MicroTec

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Axel Schmidt

SUSS MicroTec

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Andreas Kittlaus

SUSS MicroTec

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Karsten Stoll

Cascade Microtech

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Axel Becker

SUSS MicroTec

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Kanev Stojan

SUSS MicroTec

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Frank Fehrmann

SUSS MicroTec

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Jörg Kiesewetter

SUSS MicroTec

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Karsten Stoll

Cascade Microtech

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