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Stefan Kreissig

SUSS MicroTec

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Publication

Featured researches published by Stefan Kreissig.

Archive | 2003

Test apparatus with loading device

Karsten Stoll; Stefan Kreissig; Alf Wachtveitl; Michael Teich; Stefan Schneidewind; Claus Dietrich; Jörg Dr. Kiesewetter; Dietmar Runge

Archive | 2007

PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES UNDER DEFINED ATMOSPHERE

Jörg Dr. Kiesewetter; Stefan Kreissig; Stojan Kanev; Claus Dietrich

Archive | 2007

PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UNDER USE OF PROBE SUPPORTS

Stojan Kanev; Hans-Jürgen Fleischer; Stefan Kreissig; Karsten Stoll; Axel Schmidt; Andreas Kittlaus

Archive | 2005

PROBE STATION COMPRISING A BELLOWS WITH EMI SHIELDING CAPABILITIES

Stefan Kreissig; Joerg Kiesewetter

Archive | 2004

Method and prober for contacting a contact area with a contact tip

Stefan Schneidewind; Claus Dietrich; Jörg Dr. Kiesewetter; Stojan Kanev; Stefan Kreissig; Frank Fehrmann; Hans-Jürgen Fleischer

Archive | 2008

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

Stojan Kanev; Hans-Jürgen Fleischer; Stefan Kreissig; Jörg Kiesewetter

Archive | 2004

Contact area contacting method for prober, involves observing vertical movement of semiconductor wafer along observation axis which runs in plane that is slight distance away from free wafer surface in its expected end position

Claus Dietrich; Frank Fehrmann; Hans-Jürgen Fleischer; Stojan Kanev; Jörg Kiesewetter; Stefan Kreissig; Stefan Schneidewind

Archive | 2007

Probe station for e.g. testing semiconductor substrates, has positioning system positioning substrate with respect to sensors, housing enclosing chuck and sensors to form electromagnetic shielding

Hans-Jürgen Fleischer; Stojan Kanev; Andreas Kittlaus; Stefan Kreissig; Axel Schmidt; Karsten Stoll

Archive | 2006

Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station

Joerg Kiesewetter; Axel Schmidt; Stefan Kreissig; Karsten Stoll; Ralph Juettner; Hans-Juergen Fleischer

Archive | 2005

Substrate e.g. wafer, testing device, has frame that is manually or electrically moved and/or rotated on base plate in x/y direction, and substrate carrier that is fastened within frame, where substrate is fastened on carrier

Uwe Beier; Steffen Grauer; Stefan Kreissig; Dietmar Runge

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Collaboration

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Stojan Kanev

SUSS MicroTec

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Jörg Dr. Kiesewetter

Cascade Microtech

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Hans-Jürgen Fleischer

SUSS MicroTec

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Karsten Stoll

Cascade Microtech

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Andreas Kittlaus

SUSS MicroTec

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Jörg Kiesewetter

SUSS MicroTec

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Axel Schmidt

SUSS MicroTec

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Claus Dr.-Ing. Dietrich

SUSS MicroTec

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Claus Dietrich

SUSS MicroTec

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Dietmar Runge

SUSS MicroTec

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