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Hans-Oliver Joachim

Infineon Technologies

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Publication

Featured researches published by Hans-Oliver Joachim.

Archive | 2004

High density flash memory with high speed cache data interface

Thomas Roehr; Michael Jacob; Norbert Rehm; Hans-Oliver Joachim

Archive | 1999

Method for fabricating transistors

Rajesh Rengarajan; Jochen Beintner; Ulrike Gruening; Hans-Oliver Joachim

Archive | 2003

Memory cell signal window testing apparatus

Norbert Rehm; Hans-Oliver Joachim; Michael Jacob; Joerg Wohlfahrt

Archive | 2005

Signal margin test mode for FeRAM with ferroelectric reference capacitor

Michael Jacob; Thomas Roehr; Hans-Oliver Joachim

Archive | 2003

2T2C signal margin test mode using a defined charge exchange between BL and/BL

Hans-Oliver Joachim; Michael Jacob; Norbert Rehm

Archive | 2003

Reliable ferro fuse cell

Roehr Thomas; Hans-Oliver Joachim; Norbert Rehm

Archive | 2002

2T2C SIGNAL MARGIN TEST MODE USING A DEFINED CHARGE AND DISCHARGE OF BL AND/BL

Hans-Oliver Joachim; Thomas Roehr; Joerg Wohlfahrt

Archive | 2003

Reference voltage generation for memory circuits

Hans-Oliver Joachim; Daisaburo Takashima

Archive | 2003

Memory integrated circuit with improved reliability

Thomas Roehr; Hans-Oliver Joachim

Archive | 2002

Hybrid fuses for redundancy

Thomas Roehr; Hans-Oliver Joachim; Norbert Rehm; Tadashi Miyakawa

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Thomas Roehr

Infineon Technologies

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Michael Jacob

Infineon Technologies

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Norbert Rehm

Infineon Technologies

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Joerg Wohlfahrt

Infineon Technologies

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Jörg Wohlfahrt

Infineon Technologies

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Daisaburo Takashima

Infineon Technologies

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Jochen Beintner

Infineon Technologies

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Rajesh Rengarajan

Infineon Technologies

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Ulrike Gruening

Infineon Technologies

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Shinichiro Shiratake

Toshiba

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