Harald Niebel

Method for setting an operating parameter of a particle beam device and a sample holder for performing the method

Electron beam device having a specimen holder

Nano beam diffraction and precession in an energy filtered CS corrected transmission electron microscope

Method for producing a representation of an object by means of a particle beam, as well as a particle beam device for carrying out the method

Method for adjusting operating parameter of particle radiation device, involves providing sample holder with sample receptacle for receiving reference sample

Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering

Electron beam apparatus with specimen holder

High-voltage lead-through for particle-beam apparatus

Precession diffraction charged particle beam system

Verfahren zur Erzeugung der Darstellung eines Objekts mittels Teilchenstrahl sowie eine Teilchenstrahlvorrichtung zur Durchführung des Verfahrens