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Featured researches published by Hatsuyuki Tanaka.


Advances in Resist Technology and Processing IV | 1987

High Resolution Positive Photoresist For Submicron Photolithography

Hidekatsu Kohara; Hatsuyuki Tanaka; Masanori Miyabe; Yoshiaki Arai; Shingo Asaumi; Toshimasa Nakayama

Optical lithography is achieving itself into submicron region. In the limitation of resolution for stepper there is a decrease in contrast and so it requires more exposure amount than that of D. Also it is not possible to achieve faithful transcription of fine pattern dimension. The resolution of TSMR-8800 which is developed as high resolution positive photoresist is 0.6 μm. Faithful transcription of the mask pattern is possible for 0.7 μm line and space pattern. It shows good properties compared with conventional photoresist.


Archive | 1988

Developing solution for positive-working photoresist comprising tmah and non-ionic surfactant

Hatsuyuki Tanaka; Hidekatsu Kohara; Yoshiyuki Sato; Shingo Asaumi; Toshimasa Nakayama; Akira Yokota; Hisashi Nakane


Archive | 1986

Positive-working naphthoquinone diazide photoresist composition with two cresol novolac resins

Hidekatsu Kohara; Hatsuyuki Tanaka; Masanori Miyabe; Yoshiaki Arai; Shingo Asaumi; Toshimasa Nakayama


Archive | 1986

Developing solution for positive-working photoresist comprising a metal ion free organic base and an anionic surfactant

Hatsuyuki Tanaka; Hidekatsu Kohara; Yoshiyuki Sato; Shingo Asaumi; Toshimasa Nakayama; Akira Yokota; Hisashi Nakane


Archive | 1994

Method and liquid coating composition for the formation of silica-based coating film on substrate surface

Yoshinori Sakamoto; Yoshio Hagiwara; Hatsuyuki Tanaka; Toshimasa Nakayama


Archive | 1987

Method for rinse treatment of a substrate

Masakazu Kobayashi; Shingo Asaumi; Hatsuyuki Tanaka


Archive | 1994

Method for forming a protective coating film on electronic parts and devices

Katsuya Tanitsu; Atsushi Kawakami; Hatsuyuki Tanaka; Toshimasa Nakayama


Archive | 1988

Method for forming a resist pattern on a substrate surface and a scum-remover therefor

Hatsuyuki Tanaka; Yoshiyuki Sato; Hidekatsu Kohara; Toshimasa Nakayama


Archive | 1992

Coating liquid for resist and resist material using that

Masaichi Kobayashi; Toshimasa Nakayama; Hatsuyuki Tanaka; Kazumasa Wakiya; 寿昌 中山; 政一 小林; 初幸 田中; 和正 脇屋


Archive | 1988

Positive-working photoresist composition with quinone diazide sulfonic acid ester and novolac made from m-cresol, p-cresol and aliphatic phenol with 2-6 carbon atoms

Shingo Asaumi; Hidekatsu Kohara; Hatsuyuki Tanaka; Masanori Miyabe; Toshimasa Nakayama

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Mitsuru Sato

Gunma Prefectural College of Health Sciences

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