Hidekazu Okuhira
Hitachi
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Featured researches published by Hidekazu Okuhira.
Applied Surface Science | 2003
Chika Izawa; Haru-Hisa Uchida; Hidekazu Okuhira; Yoshitake Nishi
Abstract In the hydrogen absorption reaction, the surface condition is a predominant factor. The surface oxide layer generally prevents the dissociative absorption. Recently we reported the effect of the pretreatment by LiOH, which enhanced the hydrogen absorption even after significant surface oxidations. In this study the surface of LaNi 5 alloy treated with a LiOD solution was analyzed by TOF-SIMS. The reaction mechanism of the accelerated absorption by the alkaline treatment is discussed.
Japanese Journal of Applied Physics | 1993
Yasuhiro Mitsui; Takashi Irie; Hidekazu Okuhira; Atsushi Saiki
Quantitative analysis of trace hydrogen in highly purified nitrogen gas for the semiconductor fabrication process was investigated using an atmospheric pressure ionization mass spectrometer (APIMS). A previous method wherein the sample gas is directly introduced into the APIMS is not capable of providing high-sensitivity measurements for hydrogen in nitrogen gas. By mixing 20% argon gas with the sample gas, the sensitivity was increased to ten times that of the previous method. This is due to the occurrence of a previously unreported rapid reaction through which the quantity of hydrogen ions is increased: (N2Ar)++H2→N2H++H+Ar. The detection limit in this method and the rate constant for this reaction were estimated to be 40 ppt and 1.4×10-10 molecule-1 cm3 s-1, respectively.
Applied Surface Science | 2003
Yoshimi Abe; Hidekazu Okuhira
Abstract There is great difficulty to obtain molecular ions from the lubricant actually as films on magnetic recording disks. With the assistance of Ag cationization, quasi-molecular ions of (Ag+M)+ from Fomblin Z-DOL cast on Ag substrate were successfully observed on the positive time-of-flight secondary ion mass spectrometry (ToF-SIMS) spectra. Considering the mass interference between oligomers, detailed distributions of molecular weight (Mn) and monomer ratio (m/n) could be extracted. The average values of Mn and m/n obtained by ToF-SIMS are in good agreement with other conventional technique such as nuclear magnetic resonance spectroscopy (NMR).
Archive | 1986
Nobuyoshi Natsuaki; Masao Tamura; Yasuo Wada; Kiyonori Ohyu; Tadashi Suzuki; Hidekazu Okuhira; Akira Shintani; Shoji Syukuri
Archive | 1985
Hidekazu Okuhira; Yasuo Wada
Archive | 1995
Hiroshi Kakibayashi; Hisaya Murakoshi; Hidekazu Okuhira; Takashi Irie; Jiro Tokita; Keiichi Kanehori; Yasuhiro Mitsui
Applied Surface Science | 2003
Yoshimi Abe; Manabu Komatsu; Hidekazu Okuhira
The Japan Society of Applied Physics | 1990
Hidekazu Okuhira; Shigeru Nishimatsu; Ken Ninomiya
Archive | 1988
Yusuke Yajima; Hidekazu Okuhira; Kanji Tsujii; Seiichi Murayama; Akira Shintani; Yasuo Wada
Journal of Advanced Science | 2002
Chika Izawa; Yoshitake Nishi; Hidekazu Okuhira; Haru-Hisa Uchida