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Dive into the research topics where Hidekazu Tanisawa is active.

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Featured researches published by Hidekazu Tanisawa.


Materials Science Forum | 2013

40 kW/L High Switching Frequency Three-Phase AC 400 V All-SiC Inverter

Kensuke Sasaki; Shinji Sato; Kohei Matsui; Yoshinori Murakami; Satoshi Tanimoto; Hidekazu Tanisawa

We, the R&D Partnership for Future Power Electronics Technology (FUPET), have reported a forced-air-cooled DC 600 V three-phase AC 400 V inverter built with SiC-JFETs and SiC-SBDs and designed to attain an output power density (OPD) of 40 kW/L with a switching frequency (fSW) of 50 kHz. This paper reports the test results of this inverter attaining an OPD of 40 kW/L in operating a 3-phase motor with fSW = 50 kHz, and an OPD of more than 60 kW/L in operating an equivalent circuit with fSW = 20 kHz by adopting specialized high speed drive circuit boards.


Materials Science Forum | 2013

Power Module Package Structure Capable of Surviving Greater ΔTj Thermal Cycles

Satoshi Tanimoto; Hidekazu Tanisawa; Kinuyo Watanabe; Kohei Matsui; Shinji Sato

A new SiC power module package structure is proposed that is capable of withstanding greater ΔTj cycle stress. Its most notable feature is the use of a SiN substrate having Cu/Invar/Cu foils (C/I/C thickness ratio of 1/8/1) brazed on both sides as conductor plates. The CIC foils show a very low coefficient of thermal expansion (CTE) of 5.1 ppm/°C and therefore can significantly reduce package degradation resulting from the larger CTE mismatch of the conductor to SiC and SiN. A thermal cycle test (TCT) was conducted between -40°C and 250°C (ΔTj = 290°C). It was found that the SiC/Au-Ge/CIC-SiN die attachment maintained joint strength of 78 MPa even after 3000 cycles.


Materials Science Forum | 2016

Development of a Wire-Bonding-Less SiC Power Module Operating over a Wide Temperature Range

Shinya Sato; Hidekazu Tanisawa; Takeshi Anzai; Hiroki Takahashi; Yoshinori Murakami; Fumiki Kato; Kinuyo Watanabe; Hiroshi Sato

In this paper, we describe a power module fabricated using SiC metal–oxide–semiconductor field-effect transistors (MOSFETs). A C-R snubber is integrated into this power module for reduction of the surge voltage and dumping of the voltage ringing. The four SiC MOSFETs are sandwiched between active metal copper (AMC) substrates. The surfaces of the SiC MOSFETs are attached to AMC substrates by Al bumps, owing to which the power module shows low inductance. Moreover, this power module ensures credibility and reliability at higher operating temperatures beyond 200 °C. The switching characteristics of the module are studied experimentally for high-temperature and high-frequency operations.


Materials Science Forum | 2016

Switching analysis for all-SiC module

Shinji Sato; Hidekazu Tanisawa; Kenichi Koui; Hiroki Takahashi; Yoshinori Murakami; Fumiki Kato; Kinuyo Watanabe; Hiroshi Sato

In this paper, we propose a method to accurately calculate the turn-off switching loss. For that purpose, a simple analytical model is proposed in which the parasitic capacitances and stray inductances are integrated within the power module. Experiment confirmed that the turn-off loss analyzed by this model is correct.


International Symposium on Microelectronics | 2014

Sandwich Structured Power Module for High Temperature SiC Power Semiconductor Devices

Takeshi Anzai; Yoshinori Murakami; Shinji Sato; Hidekazu Tanisawa; Kohei Hiyama; Hiroki Takahashi; Fumiki Kato; Hiroshi Sato


224th ECS Meeting (October 27 – November 1, 2013) | 2013

Packaging Techniques for Compact SiC Power Modules Operable in An Extended Tj Range

Satoshi Tanimoto; Kinuyo Watanabe; Hidekazu Tanisawa; Kohei Matsui; Shinji Sato


228th ECS Meeting (October 11-15, 2015) | 2015

(Invited) Characteristics of a Wire-Bonding-Less SiC Power Module Operating in a Wide Temperature Range

Shinji Sato; Hidekazu Tanisawa; Takeshi Anzai; Hiroki Takahashi; Yoshinori Murakami; Fumiki Kato; Kinuyo Watanabe; Hiroshi Sato


Journal of microelectronics and electronic packaging | 2015

Reliability Assessment of Flip-Chip Assembly of Al Bumps

Hidekazu Tanisawa; Kohei Hiyama; Takeshi Anzai; Hiroki Takahashi; Yoshinori Murakami; Shinji Sato; Kinuyo Watanabe; Fumiki Kato; Hiroshi Sato


Archive | 2013

Au-based solder die attachment semiconductor device and method for manufacturing the same

Satoshi Tanimoto; Shinji Sato; Hidekazu Tanisawa; Kohei Matsui


Japanese Journal of Applied Physics | 2018

Transient thermal characteristics of high-temperature SiC power module enhanced with Al-bump technology

Hidekazu Tanisawa; Fumiki Kato; Kenichi Koui; Shinji Sato; Kinuyo Watanabe; Hiroki Takahashi; Yoshinori Murakami; Hiroshi Sato

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Shinji Sato

National Institute of Advanced Industrial Science and Technology

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Yoshinori Murakami

National Institute of Advanced Industrial Science and Technology

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Fumiki Kato

National Institute of Advanced Industrial Science and Technology

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Hiroshi Sato

Tokyo Institute of Technology

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Hiroki Takahashi

National Institute of Advanced Industrial Science and Technology

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Kinuyo Watanabe

National Institute of Advanced Industrial Science and Technology

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Kenichi Koui

National Institute of Advanced Industrial Science and Technology

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