Hiromi Eba

Chemical characterization using relative intensity of manganese Kβ′ and Kβ5 X-ray fluorescence

X-ray fluorescence can be used not only for the identification/quantification of elements but also for chemical speciation. The present paper demonstrates the potential feasibility of Kb spectra measured with a middle energy resolution around � 10 eV at 6–8 keV, with the main idea being the efficient detection of intensity changes of Kb 0 and Kb5 rather than precise measurements of energy shifts that require high energy-resolution. The experiments were performed at BL40XU, SPring-8, with quasi-monochromatic X-rays (fundamental peak 10.0 keV). Manganese Kb spectra were collected using a spectrometer with a Ge(2 2 0) Johansson analyzing crystal (R ¼ 120 mm). Since spectral changes were clearly observed, the integrated intensities of Kb 0 and Kb5 lines were normalized by Kb1;3 in order to compare the profiles of the spectra for a number of samples. It has been found that chemical species are suitably classified in the map of Kb 0 –Kb5 relative intensity.

X-Ray Fluorescence Analysis with a Johansson-type Spectrometer

A new age is dawning in X-ray fluorescence spectrometry with the advent of 3rd-generation synchrotron radiation, especially undulator radiation in the X-ray region. Not only a brilliant source, but also a high-performance spectrometer is indispensable to realizing advanced analysis, which has been almost impossible so far. The present paper describes experimental feasibility tests of a Johansson-type spectrometer performed with monochromatic undulator radiation at SPring-8. A Ge (220) analyzing crystal (Rowland radius 350 mm) and a NaI:Tl detector with a 0.15 mm receiving slit were employed. The energy resolution obtained is 8eV for Cu Kα1 line (8.04 keV), and is sufficient to separate signals from unnecessary scattering and other fluorescent X-rays. The resonant X-ray fluorescence spectra were obtained in a reasonably short time as well. Further optimization of detection efficiency is now under way for application to trace systems.

Grazing Incidence X-Ray Fluorescence and Scattering Experiments at BL-39XU, SPring-8

3rd-generation synchrotron radiation has enabled remarkable progress to be made in ultra trace analysis by total-reflection X-ray fluorescence as well as in surface/interface morphology study by specular and non-specular X-ray scattering. A new grazing incidence X-ray spectro-reflectometer has been recently installed at the undulator beamline BL-39XU, SPring-8. The present paper gives recent preliminary results obtained during commissioning.