Hiroshi Kuroda
Hitachi Construction Machinery
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Publication
Featured researches published by Hiroshi Kuroda.
Applied Physics Letters | 1994
Seiji Heike; Yasuo Wada; Seiichi Kondo; Mark Lutwyche; Ken Murayama; Hiroshi Kuroda
The possibility of measuring insulator surfaces with a scanning tunneling microscope (STM) is demonstrated. The mechanism is attributed to the conduction caused by electron beam assisted carrier generation in the insulator. A scanning electron microscope is used as the electron source. A 10‐nm‐thick and 100‐nm‐wide line‐and‐space patterned silicon dioxide layer formed on silicon substrate is observed by the STM only when an electron beam is directed at the sample. Tunneling spectroscopy results indicate a band gap of about 5 eV, which is attributed to that of silicon dioxide of about 8 eV.
Archive | 1998
Takashi Shirai; Ken Murayama; Takafumi Morimoto; Hiroshi Kuroda; Harumasa Onozato
Archive | 2000
Takafumi Morimoto; Hiroshi Kuroda
Archive | 2003
Shuichiro Hatakeyama; Masaki Kanzawa; Hiroshi Kuroda; Masakazu Sawai; 正和 澤井; 修一郎 畠山; 正樹 神澤; 浩史 黒田
Archive | 1999
Shuichiro Hatakeyama; Hiroshi Kuroda; Tamaki Sakurai; Masakazu Sawai; 玉貴 桜井; 正和 澤井; 修一郎 畠山; 浩史 黒田
Archive | 1998
Takashi Shirai; Ken Murayama; Takafumi Morimoto; Hiroshi Kuroda; Harumasa Onozato
Archive | 1998
Hiroshi Kuroda; Takashi Morimoto; Takeshi Murayama; 健 村山; 高史 森本; 浩史 黒田
Archive | 1997
Hiroshi Kuroda; Takashi Morimoto; Takeshi Murayama; Akimasa Onozato; Takashi Shirai; 陽正 小野里; 健 村山; 高史 森本; 隆 白井; 浩史 黒田
Archive | 1999
Takashi Shirai; Ken Murayama; Takafumi Morimoto; Hiroshi Kuroda; Harumasa Onozato
Archive | 2004
Hiroshi Kuroda; Takafumi Morimoto; Ken Murayama; Harumasa Onozato; Takashi Shirai
