Ken Murayama
Hitachi Construction Machinery
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Publication
Featured researches published by Ken Murayama.
Applied Physics Letters | 1994
Seiji Heike; Yasuo Wada; Seiichi Kondo; Mark Lutwyche; Ken Murayama; Hiroshi Kuroda
The possibility of measuring insulator surfaces with a scanning tunneling microscope (STM) is demonstrated. The mechanism is attributed to the conduction caused by electron beam assisted carrier generation in the insulator. A scanning electron microscope is used as the electron source. A 10‐nm‐thick and 100‐nm‐wide line‐and‐space patterned silicon dioxide layer formed on silicon substrate is observed by the STM only when an electron beam is directed at the sample. Tunneling spectroscopy results indicate a band gap of about 5 eV, which is attributed to that of silicon dioxide of about 8 eV.
Archive | 1998
Takashi Shirai; Ken Murayama; Takafumi Morimoto; Hiroshi Kuroda; Harumasa Onozato
Archive | 1988
Kiyoshi Nagasawa; Kozo Ono; Kojiro Ogata; Ken Murayama; Yoshihiro Hoshino
Archive | 1997
Takafumi Morimoto; Ken Murayama; Sumio Hosaka
Archive | 1988
Kiyoshi Nagasawa; Kozo Ono; Kojiro Ogata; Ken Murayama; Yoshihiro Hoshino
Archive | 1998
Takashi Shirai; Ken Murayama; Takafumi Morimoto; Hiroshi Kuroda; Harumasa Onozato
Archive | 1983
Satoshi Shimada; Ken Murayama; Shigeyuki Kobori; Kanji Kawakami
Archive | 1999
Takashi Shirai; Ken Murayama; Takafumi Morimoto; Hiroshi Kuroda; Harumasa Onozato
Archive | 1997
Sumio Nishitama-Gun Husaka; Takafumi Morimoto; Ken Murayama
Archive | 2008
Ken Murayama
