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Proceedings of SPIE | 1996

Inspection machine using laser scanning for chip-mounted circuit boards

Koichi Kawata; Nobuhiro Araki; Hiroto Toba; Takumi Seto; Kazutoshi Ikegaya; Yukifumi Tsuda; Kunio Sannomiya

This paper deals with the in-line three-dimensional measurement of circuit boards with mounted electronic components. The surface for inspection is scanned by a laser beam, and three-dimensional data are obtained by triangulation from the position of the reflected light measured with a position-sensitive detector (PSD). The location of reflected light is measured from a direction at an angle to the axis of the incident laser beam. The light from the target is reflected by the mirror which is positioned between the f (theta) lens and the target to increase the angle and the measuring sensitivity. The position of the image plane of the reflected beam varies according to the scanning position, which produces a similar effect to the variation of height. The measured value is corrected by a ROM set for three-dimensional space in data processing. The error in height measurement is 0.06 to 0.08 mm, and 0.025 mm accuracy is obtained in the neighboring area of the electronic component targets in practical inspection.


Archive | 1984

Apparatus for processing multiple workpieces utilizing a single laser beam source

Takeshi Masaki; Koichi Kawata; Yukuo Sakagaito; Katsumasa Yamaguchi; Hiromichi Kinoshiro; Hiroto Toba


Archive | 1990

System for optically inspecting conditions of parts packaged on substrate

Yuji Maruyama; Yukifumi Tsuda; Kazutoshi Ikegaya; Kunio Sannomiya; Hiroto Toba; Takumi Seto


Archive | 1990

Electro-optical inspection apparatus for printed-circuit boards with components mounted thereon

Kazutoshi Ikegaya; Yuji Maruyama; Kunjo Sannomiya; Yukifumi Tsuda; Hiroto Toba


Archive | 1990

Apparatus for inspecting solder portion of a circuit board

Kazutoshi Ikegaya; Yuji Maruyama; Yukifumi Tsuda; Kunio Sannomiya; Hiroto Toba


Archive | 1996

Method for adjusting a position of a solid-state image detector in a given image-forming optical system

Kouji Ohura; Keiji Shintani; Yoko Koseki; Hiroto Toba; Toshiro Obi; Kazuyuki Kobayashi


Archive | 1989

Linescan apparatus for detecting salient pattern of a product

Kazutoshi Ikegaya; Kunio Sannomiya; Yukifumi Tsuda; Yuji Maruyama; Nobuhiro Araki; Hiroto Toba


Archive | 1985

Laser beam processing apparatus

Takeshi Masaki; Koichi Kawata; Yukuo Sakagaito; Katsumasa Yamaguchi; Hiromichi Kinoshiro; Hiroto Toba


Archive | 1990

Circuit board inspecting apparatus

Kazutoshi Ikegaya; Yuji Maruyama; Yukifumi Tsuda; Kunio Sannomiya; Hiroto Toba


Archive | 1990

Elektro-optisches Inspektionsgerät für gedruckte Leiterplatten mit darauf montierten Bauelementen. Electro-optical inspection device for printed circuit boards with components mounted thereon.

Kazutoshi Ikegaya; Yuji Maruyama; Kunio Sannomiya; Yukifumi Tsuda; Hiroto Toba

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