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Proceedings of SPIE | 1996

Inspection machine using laser scanning for chip-mounted circuit boards

Koichi Kawata; Nobuhiro Araki; Hiroto Toba; Takumi Seto; Kazutoshi Ikegaya; Yukifumi Tsuda; Kunio Sannomiya

This paper deals with the in-line three-dimensional measurement of circuit boards with mounted electronic components. The surface for inspection is scanned by a laser beam, and three-dimensional data are obtained by triangulation from the position of the reflected light measured with a position-sensitive detector (PSD). The location of reflected light is measured from a direction at an angle to the axis of the incident laser beam. The light from the target is reflected by the mirror which is positioned between the f (theta) lens and the target to increase the angle and the measuring sensitivity. The position of the image plane of the reflected beam varies according to the scanning position, which produces a similar effect to the variation of height. The measured value is corrected by a ROM set for three-dimensional space in data processing. The error in height measurement is 0.06 to 0.08 mm, and 0.025 mm accuracy is obtained in the neighboring area of the electronic component targets in practical inspection.


Archive | 1989

Image signal processing apparatus for bar code image signal

Hiroyoshi Tsuchiya; Atsuharu Yamamoto; Kunio Sannomiya; Hiroaki Kotera; Katsuo Nakazato; Mikio Fujita; Shigeo Komizo


Archive | 1983

Method and apparatus for processing image signal

Hiroyoshi Tsuchiya; Katsuo Nakazato; Kunio Sannomiya; Hidehiko Kawakami; Hirotaka Otsuka


Archive | 1990

System for optically inspecting conditions of parts packaged on substrate

Yuji Maruyama; Yukifumi Tsuda; Kazutoshi Ikegaya; Kunio Sannomiya; Hiroto Toba; Takumi Seto


Archive | 1990

Apparatus for inspecting solder portion of a circuit board

Kazutoshi Ikegaya; Yuji Maruyama; Yukifumi Tsuda; Kunio Sannomiya; Hiroto Toba


Archive | 1983

Method and apparatus for processing video signals

Hirotaka Otsuka; Katsuo Nakazato; Kunio Sannomiya; Hidehiko Kawakami; Hiroyoshi Tsuchiya; Hideo Uchida


Archive | 1982

Method of band compression

Akiyoshi Tanaka; Kunio Sannomiya; Hiroaki Kotera; Kunio Yoshida; Yoshihiro Uno; Hiroaki Miwa


Archive | 1985

Method and device for processing picture signal

Hidehiko Kawakami; Katsuo Nakazato; Hirotaka Otsuka; Kunio Sannomiya; Hiroyoshi Tsuchiya; Hideo Uchida


Archive | 1991

Three-dimensional shape data reading system

Kunio Sannomiya; Yukifumi Tsuda; Kazutoshi Ikegaya


Archive | 1989

Linescan apparatus for detecting salient pattern of a product

Kazutoshi Ikegaya; Kunio Sannomiya; Yukifumi Tsuda; Yuji Maruyama; Nobuhiro Araki; Hiroto Toba

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