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Dive into the research topics where Hisae Yamamura is active.

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Featured researches published by Hisae Yamamura.


workshop on applications of computer vision | 1996

Automated solder joint inspection system using optical 3-D image detection

Yukio Matsuyama; Toshifumi Honda; Hisae Yamamura; Hideaki Sasazawa; Mineo Nomoto; Takanori Ninomiya; Anton Schick; Ludwig Listl; Paul Köllensperger; Dieter Spriegel; Peter Mengel; Richard Schneider

An automated system has been developed for visually inspecting the solder joints of SMDs (Surface Mounted Devices). The system is capable of inspecting fine pitch components down to 0.3 mm pitch QFPs (Quad Flat Packages). A unique image detection method was also developed to obtain precise 3-D images of solder joints. The principle of a confocal microscope is employed but plural sensors are used to detect reflected light at different focusing positions simultaneously. The system is unaffected by secondary reflection and dead angles. The warp in a PC (Printed Circuit) board surface is calculated in real time using the detected 3-D images, and board height to be detected in successive areas is predicted based on this calculation. Real-time automatic focusing control is then performed using newly developed defect detection algorithms, the system can recognize leads, pads and solder fillets from the detected images. Because 3-D shape features are extracted and used for defect judgment, user-defined parameters have been made easy to understand and/or to modify. Operational evaluation of the system confirms a 100% defect detection rate and a very low false alarm rate (0.16%).


Archive | 1995

Method and apparatus for automatic focusing and a method and apparatus for three dimensional profile detection

Hisae Yamamura; Yukio Matsuyama; Takanori Ninomiya; Hideaki Sasazawa


Archive | 1993

Method and apparatus for measuring the size of a circuit or wiring pattern formed on a hybrid integrated circuit chip and a wiring board respectively

Takanori Ninomiya; Hisae Yamamura


Archive | 1997

Defect judgement processing method and apparatus

Hisae Yamamura; Yukio Matsuyama; Toshifumi Honda; Ludwig Listl


Archive | 1992

Semiconductor memory device having redundancy memory cells for replacing defective

Makoto Saeki; Kiyoshi Nagai; Hisae Yamamura; Tadashi Abe; Takeshi Fukazawa


Archive | 1999

Method monitoring a quality of electronic circuits and its manufacturing condition and system for it

Hirohito Okuda; Toshifumi Honda; Hisae Yamamura; Yuji Takagi; Hideaki Doi; Shigeshi Yoshinaga


Archive | 1997

Method and apparatus for evaluating defects

Hisae Yamamura; Yukio Matsuyama; Toshifumi Honda; Ludwig Listl


Journal of Machine Vision and Applications | 1996

Automated Visual Inspection Algorithm for Solder Joint of Surface Mount Devices Based on Three Dimensional Shape Analysis.

Toshifumi Honda; Yukio Matsuyama; Hisae Yamamura; Hideaki Sasazawa; Takanori Ninomiya; Ludwig Listl; Anton Schick; Richard Schneider


Journal of robotics and mechatronics | 1999

Automated Visual Inspection for Solder Joints of PCB Based on 3-D Image Analysis

Toshifumi Honda; Hisae Yamamura; Mineo Nomoto; Takanori Ninomiya; Tomoharu Horii; Yoshio Miyawaki


Journal of Machine Vision and Applications | 1994

Automated Inspection System for Electronic Devices Mounted on Printed Circuit Boards Using Light-Section Method.

Toshifumi Honda; Hisae Yamamura; Syouji Ueda; Minoru Kawabata; Takanori Ninomiya

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