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Dive into the research topics where Hosni Idrissi is active.

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Featured researches published by Hosni Idrissi.


Science and Technology of Advanced Materials | 2013

Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials

D. Schryvers; S Cao; W Tirry; Hosni Idrissi; S. Van Aert

Abstract After a short review of electron tomography techniques for materials science, this overview will cover some recent results on different shape memory and nanostructured metallic systems obtained by various three-dimensional (3D) electron imaging techniques. In binary Ni–Ti, the 3D morphology and distribution of Ni4Ti3 precipitates are investigated by using FIB/SEM slice-and-view yielding 3D data stacks. Different quantification techniques will be presented including the principal ellipsoid for a given precipitate, shape classification following a Zingg scheme, particle distribution function, distance transform and water penetration. The latter is a novel approach to quantifying the expected matrix transformation in between the precipitates. The different samples investigated include a single crystal annealed with and without compression yielding layered and autocatalytic precipitation, respectively, and a polycrystal revealing different densities and sizes of the precipitates resulting in a multistage transformation process. Electron tomography was used to understand the interaction between focused ion beam-induced Frank loops and long dislocation structures in nanobeams of Al exhibiting special mechanical behaviour measured by on-chip deposition. Atomic resolution electron tomography is demonstrated on Ag nanoparticles in an Al matrix.


Advanced Materials | 2011

Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins

Hosni Idrissi; Binjie Wang; Marie Stéphane Colla; Jean-Pierre Raskin; Dominique Schryvers; Thomas Pardoen

Nanocrystalline Pd thin films containing coherent growth twin boundaries are deformed using on-chip nanomechanical testing. A large work-hardening capacity is measured. The origin of the observed behavior is unraveled using transmission electron microscopy and shows specific dislocations and twin boundaries interactions. The results indicate the potential for large strength and ductility balance enhancement in Pd films, as needed in membranes for H technologies.


Nature Communications | 2015

Dislocation-mediated relaxation in nanograined columnar palladium films revealed by on-chip time-resolved HRTEM testing

Marie Stéphane Colla; Behnam Amin-Ahmadi; Hosni Idrissi; Loïc Malet; Stéphane Godet; Jean-Pierre Raskin; Dominique Schryvers; Thomas Pardoen

The high-rate sensitivity of nanostructured metallic materials demonstrated in the recent literature is related to the predominance of thermally activated deformation mechanisms favoured by a large density of internal interfaces. Here we report time-resolved high-resolution electron transmission microscopy creep tests on thin nanograined films using on-chip nanomechanical testing. Tests are performed on palladium, which exhibited unexpectedly large creep rates at room temperature. Despite the small 30-nm grain size, relaxation is found to be mediated by dislocation mechanisms. The dislocations interact with the growth nanotwins present in the grains, leading to a loss of coherency of twin boundaries. The density of stored dislocations first increases with applied deformation, and then decreases with time to drive additional deformation while no grain boundary mechanism is observed. This fast relaxation constitutes a key issue in the development of various micro- and nanotechnologies such as palladium membranes for hydrogen applications.


Microscopy and Microanalysis | 2011

Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study

Hosni Idrissi; Stuart Turner; Masatoshi Mitsuhara; Binjie Wang; Satoshi Hata; Michaël Coulombier; Jean-Pierre Raskin; Thomas Pardoen; Gustaaf Van Tendeloo; Dominique Schryvers

Focused ion beam (FIB) induced damage in nanocrystalline Al thin films has been characterized using advanced transmission electron microscopy techniques. Electron tomography was used to analyze the three-dimensional distribution of point defect clusters induced by FIB milling, as well as their interaction with preexisting dislocations generated by internal stresses in the Al films. The atomic structure of interstitial Frank loops induced by irradiation, as well as the core structure of Frank dislocations, has been resolved with aberration-corrected high-resolution annular dark-field scanning TEM. The combination of both techniques constitutes a powerful tool for the study of the intrinsic structural properties of point defect clusters as well as the interaction of these defects with preexisting or deformation dislocations in irradiated bulk or nanostructured materials.


Applied Physics Letters | 2014

Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing

Hosni Idrissi; Aaron Kobler; Behnam Amin-Ahmadi; Michaël Coulombier; M. Galceran; Jean-Pierre Raskin; Stéphane Godet; Christian Kübel; Thomas Pardoen; Dominique Schryvers

In-situ bright field transmission electron microscopy (TEM) nanomechanical tensile testing and in-situ automated crystallographic orientation mapping in TEM were combined to unravel the elementary mechanisms controlling the plasticity of ultrafine grained Aluminum freestanding thin films. The characterizations demonstrate that deformation proceeds with a transition from grain rotation to intragranular dislocation glide and starvation plasticity mechanism at about 1% deformation. The grain rotation is not affected by the character of the grain boundaries. No grain growth or twinning is detected.


Science Advances | 2016

Low-temperature plasticity of olivine revisited with in situ TEM nanomechanical testing

Hosni Idrissi; Caroline Bollinger; Francesca Boioli; Dominique Schryvers; Patrick Cordier

The flow properties of the mineral olivine under lithospheric conditions, as seen in the transmission electron microscope (TEM). The rheology of the lithospheric mantle is fundamental to understanding how mantle convection couples with plate tectonics. However, olivine rheology at lithospheric conditions is still poorly understood because experiments are difficult in this temperature range where rocks and mineral become very brittle. We combine techniques of quantitative in situ tensile testing in a transmission electron microscope and numerical modeling of dislocation dynamics to constrain the low-temperature rheology of olivine. We find that the intrinsic ductility of olivine at low temperature is significantly lower than previously reported values, which were obtained under strain-hardened conditions. Using this method, we can anchor rheological laws determined at higher temperature and can provide a better constraint on intermediate temperatures relevant for the lithosphere. More generally, we demonstrate the possibility of characterizing the mechanical properties of specimens, which can be available in the form of submillimeter-sized particles only.


Applied Physics Letters | 2013

High resolution transmission electron microscopy characterization of fcc → 9R transformation in nanocrystalline palladium films due to hydriding

Behnam Amin-Ahmadi; Hosni Idrissi; Renaud Delmelle; Thomas Pardoen; Joris Proost; Dominique Schryvers

Sputtered nanocrystalline palladium thin films with nanoscale growth twins have been subjected to hydriding cycles. The evolution of the twin boundaries has been investigated using high resolution transmission electron microscopy. Surprisingly, the ∑3{112} incoherent twin boundaries dissociate after hydriding into two phase boundaries bounding a 9R phase. This phase which corresponds to single stacking faults located every three {111} planes in the fcc Pd structure was not expected because of the high stacking fault energy of Pd. This observation is connected to the influence of the Hydrogen on the stacking fault energy of palladium and the high compressive stresses building up during hydriding.


Scientific Reports | 2015

Damage evaluation in graphene underlying atomic layer deposition dielectrics

Xiaohui Tang; Nicolas Reckinger; Olivier Poncelet; Pierre Louette; Ferran Ureña; Hosni Idrissi; Stuart Turner; Damien Cabosart; Jean-François Colomer; Jean-Pierre Raskin; Benoît Hackens; Laurent Francis

Based on micro-Raman spectroscopy (μRS) and X-ray photoelectron spectroscopy (XPS), we study the structural damage incurred in monolayer (1L) and few-layer (FL) graphene subjected to atomic-layer deposition of HfO2 and Al2O3 upon different oxygen plasma power levels. We evaluate the damage level and the influence of the HfO2 thickness on graphene. The results indicate that in the case of Al2O3/graphene, whether 1L or FL graphene is strongly damaged under our process conditions. For the case of HfO2/graphene, μRS analysis clearly shows that FL graphene is less disordered than 1L graphene. In addition, the damage levels in FL graphene decrease with the number of layers. Moreover, the FL graphene damage is inversely proportional to the thickness of HfO2 film. Particularly, the bottom layer of twisted bilayer (t-2L) has the salient features of 1L graphene. Therefore, FL graphene allows for controlling/limiting the degree of defect during the PE-ALD HfO2 of dielectrics and could be a good starting material for building field effect transistors, sensors, touch screens and solar cells. Besides, the formation of Hf-C bonds may favor growing high-quality and uniform-coverage dielectric. HfO2 could be a suitable high-K gate dielectric with a scaling capability down to sub-5-nm for graphene-based transistors.


APL Materials | 2014

Thin films of the spin ice compound Ho2Ti2O7

D. P. Leusink; F. Coneri; M. Hoek; Stuart Turner; Hosni Idrissi; G. Van Tendeloo; H. Hilgenkamp

The pyrochlore compounds Ho 2 Ti 2 O 7 and Dy 2 Ti 2 O 7 show an exotic form of magnetism called the spin ice state, resulting from the interplay between geometrical frustration and ferromagnetic coupling. A fascinating feature of this state is the appearance of magnetic monopoles as emergent excitations above the degenerate ground state. Over the past years, strong effort has been devoted to the investigation of these monopoles and other properties of the spin ice state in bulk crystals. Here, we report the fabrication of Ho 2 Ti 2 O 7 thin films using pulsed laser deposition on yttria-stabilized ZrO 2 substrates. We investigated the structural properties of these films by X-ray diffraction, scanning transmission electron microscopy, and atomic force microscopy, and the magnetic properties by vibrating sample magnetometry at 2 K. The films not only show a high crystalline quality, but also exhibit the hallmarks of a spin ice: a pronounced magnetic anisotropy and an intermediate plateau in the magnetization along the [111] crystal direction.


Philosophical Magazine | 2013

TEM investigation of the formation mechanism of deformation twins in Fe-Mn-Si-Al TWIP steels

Hosni Idrissi; Krystel Renard; Dominique Schryvers; Pascal Jacques

The microstructure of a Fe–Mn–Si–Al twinning-induced plasticity (TWIP) steel exhibiting remarkable work hardening rate under uniaxial tensile deformation was investigated using transmission electron microscopy to uncover the mechanism(s) controlling the nucleation and growth of the mechanically induced twins. The results show that the stair-rod cross-slip deviation mechanism is necessary for the formation of the twins, while large extrinsic stacking faults homogenously distributed within the grains could act as preferential sources for the activation of the deviation process. The influence of such features on the thickness and strength of the twins and the resulting mechanical behaviour is discussed and compared to similar works recently performed on Fe–Mn–C TWIP steels.

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Thomas Pardoen

Université catholique de Louvain

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Jean-Pierre Raskin

Université catholique de Louvain

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Marie-Stéphane Colla

Université catholique de Louvain

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Michaël Coulombier

Université catholique de Louvain

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Stéphane Godet

Université libre de Bruxelles

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Joris Proost

Université catholique de Louvain

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