HyeKyeong Kim

The influence of collecting substrates on the single-particle characterization of real atmospheric aerosols.

This work investigated the influence of three different collecting substrate materials, Ag and Al foils and grids for transmission electron microscopy (TEM grid), on the morphological and chemical compositional analysis of individual particles collected at an underground shopping area in Seoul, Korea. The feasibility of using each substrate in a quantitative single-particle analysis was evaluated by comparing particle morphologies, X-ray spectra, and elemental quantification results obtained for the three substrates. The morphologies and the quality of X-ray spectra for crystalline mineral particles were very similar among the three substrates. However, water-soluble, CNO-rich aerosols showed different morphologies among the three substrates, mainly due to the differences in the hygroscopic properties of the substrates. The quality of the X-ray spectra of the CNO-rich particles was optimal when collected on the TEM grid. To reliably assess the characteristic X-rays of the CNO-rich particles collected on the Ag and Al foils, appropriate data analysis had to be applied. Especially, the X-ray spectra of the CNO-rich particles collected on Al foil required a new background subtraction procedure. The overall relative abundances of the chemical species, obtained from the three collecting substrates, were in good agreement with each other and single-particle characterization of the real aerosol sample was feasible on the different substrates. However, the TEM grid substrate was the most appropriate for single-particle analysis of the water-soluble CNO-rich particles as: (i) it retains the original morphology and size of the particles, (ii) it allows high contrast in the backscattered electron image (BSEI) mode, and (iii) it provides a high peak-to-background ratio (P/B) with small and correctable interferences in the X-ray spectra.

Molecular mass concentrations for a powdered SRM sample using a quantitative single particle analysis

In a quantitative single particle analysis, named the low-Z particle EPMA, number concentration data for chemical species encountered in aerosol sample are provided. However, it will be more useful if mass concentration data can be obtained from single particle analysis; i.e., the single particle analysis data for weight fractions of chemical species can be complementarily used in combination with the bulk analysis data, for more clearly understanding the behavior of airborne aerosols. In order to investigate how reliably mass concentration data can be obtained from the low-Z particle EPMA technique, a potassium feldspar powdered standard reference material (SRM), of which elemental weight fractions are well defined by various bulk analytical techniques, was analyzed using the low-Z particle EPMA technique. In this work, it is demonstrated that weight fractions of major elements in the powdered SRM sample obtained by the low-Z particle EPMA are within 8% to the certified values obtained by bulk analytical techniques, although the single particle and bulk analyses employ different approaches. Further, it is shown that the quantitative single particle analysis, i.e., low-Z particle EPMA, can provide molecular mass concentration data for chemical species, which is not easy to obtain using bulk analysis.