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Dive into the research topics where Hyun-seop Shim is active.

Publication


Featured researches published by Hyun-seop Shim.


international frequency control symposium | 2006

Frequency Synthesizer Using Dual Offset Mixing for Low Phase Noise and Narrow Resolution

Ki-Jae Song; Jae-Il Lee; Hyun-seop Shim

This paper introduces a low in-band phase noise synthesizer with narrow frequency resolution. In order to improve the noise characteristic, the output frequency of the voltage controlled oscillator is converted into a fixed low IF signal by two mixers. Therefore, the N division ratio is relatively reduced, which means the minimization of the in-band phase noise. To confirm the noise performances, this synthesizer is simulated and analyzed through the phase domain noise model. This paper presents the simulation results for the phase noise, spurious, and acquisition time


Archive | 2004

Burn-in test apparatus for BGA packages using forced heat exhaust

Byung-Jun Min; Woo-Jin Kim; Jeong-Ho Bang; Hyun-seop Shim; Hyun-Geun Iy; Jae-Il Lee


Archive | 2003

Test kit for semiconductor package and method for testing semiconductor package using the same

Byoungjun Min; Jeong-Ho Bang; Hyun-seop Shim; Hyo-geun Chae


Archive | 2005

Connector for testing a semiconductor package

Young-Bae Chung; Hyun-seop Shim; Jeong-Ho Bang; Jae-Il Lee; Hyun-Kyo Seo; Young-soo An; Soon-Geol Hwang


Archive | 2004

Apparatus and method for performing parallel test on integrated circuit devices

Woo-Il Kim; Hyun-seop Shim; Hyoung-Young Lee; Young-Ki Kwak; Jeong-Ho Bang; Ki-Bong Ju


Archive | 2007

Multifunctional handler system for electrical testing of semiconductor devices

Seong-goo Kang; Jun-Ho Lee; Ki-Sang Kang; Hyun-seop Shim; Do-young Kam; Jae-Il Lee; Ju-il Kang


Archive | 2007

Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments

Seong-goo Kang; Jun-Ho Lee; Ki-Sang Kang; Hyun-seop Shim; Do-young Kam; Jae-Il Lee; Ju-il Kang


Archive | 2005

Multichip package test

Young-Gu Shin; Kyoung-il Heo; Hyoung-Young Lee; Hyuk Kwon; Ki-Bong Ju; Jeong-Ho Bang; Hyun-seop Shim


Archive | 2002

Parallel testing system for semiconductor memory devices

Hyuk Kwon; Jeong-Ho Bang; Hyun-seop Shim; Yong-Woon Kim; Hyoung-Young Lee; Young-Gu Shin


Archive | 1998

Test method for high speed memory devices in which limit conditions for the clock are defined

Ja-hyun Koo; Jong-bok Tcho; Hyun-seop Shim; Jeong-Ho Bang

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