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Dive into the research topics where Ichiro Shiono is active.

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Featured researches published by Ichiro Shiono.


photovoltaic specialists conference | 2015

Evaluation of the CIGS precursor layer deposited by CuGa-NaF sputtering target and its effect for Na distribution

Keita Umemoto; Ichiro Shiono; Hajime Chiba; Yuichi Kondo; Shoubin Zhang

The purpose of this study is to understand the relationship between the precursor layer deposited by CuGa-NaF sputtering target and selenidization process. The addition of Na was carried out by using the CuGa-NaF sputtering target. In the CuGa-NaF precursor film, the presence of Na-Ga-F compound was observed. The desorption of fluoride gas from the Na-Ga-F compound occurred, and it accompanied the migration of Ga element. The desorption of fluoride gas enhanced the reactivity with the Se gas in the selenization process. On the other hand, the presence of Na and the migration of Ga impeded the interdiffusion of In and Ga. The decomposition temperature of H2Se gas and the temperature of formation of CIGS were important for uniformity of composition in selenization process. By optimizing the CuGa-NaF film thickness and the multilayer film structure, a CIGS film with a graded composition of In/Ga and the uniformly incorporation Na was obtained.


MRS Proceedings | 2000

Relationship Between Graded Layer Structures and Defects in Silicon-Germanium Virtual Substrates

Kazuki Mizushima; Ichiro Shiono; Kenji Yamaguchi; Naoki Muraki

Silicon-germanium virtual substrates have been synthesized by low-pressure chemical vapor deposition. We obtained threading dislocation densities ranging from 10 5 to 10 6 cm −2 , surface roughness ranging from 1.5 to 4 nm, and also cross-hatch pattern densities, depending on the grading rate and top layer germanium composition. For the typical sample, which has a linear-graded structure with a grading rate of 20%/[µm, and germanium composition of 30 % at the top layer, we obtained dislocation densities of about 10 6 cm −2 and root mean squared surface roughness of about 3 nm. The obtained dislocation densities are equivalent with the virtual substrates synthesized by ultra-high vacuum system. On the other hand the surface roughness is superior to the typical reported values. In this study three kinds of structures, i.e. linear-graded, stepwise, and graded-step structures, were considered. We found the defects are effectively reduced by introduction of an optimum number of steps in the graded layer.


Archive | 2001

Semiconductor substrate, field effect transistor, method of forming SiGe layer and method of forming strained Si layer using same, and method of manufacturing field effect transistor

Kazuki Mizushima; Ichiro Shiono; Kenji Yamaguchi


Archive | 2000

SiGe FILM FORMING METHOD, METHOD OF MANUFACTURING HETEROJUNCTION TRANSISTOR AND HETEROJUNCTION BIPOLAR TRANSISTOR

Kazuki Mizushima; Ichiro Shiono; 一郎 塩野; 一樹 水嶋


Archive | 2003

Semiconductor substrate, field-effect transistor, and their production methods

Ichiro Shiono; Masaharu Ninomiya; Hazumu Kougami


Archive | 2002

Semiconductor substrate, field-effect transistor, and their manufacturing methods

Kazuki Mizushima; Ichiro Shiono; Kenji Yamaguchi


Archive | 2001

Semiconductor substrate, field effect transistor, method for forming silicon-germanium layer, method for forming strained silicon layer using the method and method for manufacturing field effect transistor

Kazuki Mizushima; Ichiro Shiono; 一郎 塩野; 一樹 水嶋


Archive | 2001

SEMICONDUCTOR SUBSTRATE, FIELD-EFFECT TRANSISTOR AND FORMING METHOD OF SiGe LAYER, FORMING METHOD OF DISTORTED Si LAYER USING THIS FORMING METHOD AND MANUFACTURING METHOD OF FIELD-EFFECT TRANSISTOR

Kazuki Mizushima; Ichiro Shiono; Kenji Yamaguchi; 一郎 塩野; 健志 山口; 一樹 水嶋


Archive | 2001

Method for producing epitaxial multilayer film and epitaxial multilayer film

Eiji Kamiyama; Kazuki Mizushima; Ichiro Shiono; 一郎 塩野; 一樹 水嶋; 栄治 神山


Archive | 2003

Method for manufacturing strain si-soi substrate and strain si-soi substrate manufactured thereby

Katsumi Kakimoto; Hajime Konoue; Koji Matsumoto; Masanobu Miyao; Masahiko Nakamae; Masaharu Ninomiya; Taizo Sado; Ichiro Shiono; 正彦 中前; 正晴 二宮; 泰造 佐道; 勝己 垣本; 一郎 塩野; 正信 宮尾; 光二 松本; 肇 鴻上

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Kazuki Mizushima

MITSUBISHI MATERIALS CORPORATION

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Kenji Yamaguchi

MITSUBISHI MATERIALS CORPORATION

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Yousong Jiang

University of Science and Technology of China

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Atsushi Saito

MITSUBISHI MATERIALS CORPORATION

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Shoubin Zhang

MITSUBISHI MATERIALS CORPORATION

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Yuto Toshimori

MITSUBISHI MATERIALS CORPORATION

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Toshihiko Sato

Tokyo University of Technology

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Keita Umemoto

MITSUBISHI MATERIALS CORPORATION

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