Isabelle Bord
University of Bordeaux
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Publication
Featured researches published by Isabelle Bord.
electronic components and technology conference | 2012
Warda Benhadjala; Isabelle Bord; Laurent Bechou; Ephraim Suhir; Matthieu Buet; Fabien Rougé; Yves Ousten
Thin capacitors using new hybrid nanoparticles as dielectric material have been successfully fabricated by a roll-to-roll process. The nanoparticles with a BaTiO3 core and a hyperbranched polyester shell have been synthesized at a filler fraction of approximately 41 wt%. For the first time, dielectric properties of monolithic nanocomposite-based capacitors have been investigated over an extremely wide frequency range from 10Hz to 1.2GHz. A dedicated test circuit has been designed and manufactured to characterize the capacitors at high frequencies directly on the sample. It has been demonstrated that promising resonance frequencies above 600MHz and dielectric constants needed for the existing commercial products can be achieved on the basis of the employed nano-technology. We conclude that hybrid BaTiO3/hyperbranched-polyester nanoparticles have the potential to outperform the existing systems and are suitable for the use as an effective dielectric in embedded radiofrequency (RF) capacitors.
Journal of microelectronics and electronic packaging | 2008
Isabelle Bord; Bruno Levrier; Yannick Deshayes; Laurent Bechou; Yves Ousten
Reliability assessment of components, integrated circuits, and microassemblies is clearly identified as a major factor in the on-going development of microelectronics. Since the last decade, the 3-D packaging and interconnections have emerged, and integrated packages have been developed. System-in-package (SIP) has become the principal support for integrated systems. Numerous problems are linked to their decreasing dimensions, the increasing numbers of interfaces (multichips stacked one on top of another), and plastic packages that must tolerate higher temperatures (RoHS). How is the reliability of such components assessed? What are the tools to investigate failure mechanisms in these new packages? This article gives some solutions mixing acoustic analysis, x-ray microscopy, electrical testing, and the use of specific tests points (sensors) placed in the package.
Journal of the American Chemical Society | 2006
Shin-ichi Ohkoshi; Hiroko Tokoro; Toshiya Hozumi; Yue Zhang; Kazuhito Hashimoto; Corine Mathonière; Isabelle Bord; Guillaume Rombaut; Marc Verelst; Christophe Cartier dit Moulin; Françoise Villain
Sensors and Actuators B-chemical | 2006
Isabelle Bord; Pascal Tardy; Francis Menil
Comptes Rendus Chimie | 2008
Corine Mathonière; Hirokazu Kobayashi; Rémy Le Bris; Abdellah Kaiba; Isabelle Bord
CARTS USA 2010 | 2010
Yves Ousten; Isabelle Bord; Cyril Blot; Bruno Levrier; Laurent Bechou; Philippe Kertesz
European Electronics Assembly Reliability Summit | 2008
Yves Ousten; Laurent Bechou; Frédéric Verdier; Yannick Deshayes; Bruno Levrier; Isabelle Bord; Bertrand Carbonne
Sensors and Actuators B-chemical | 2007
Isabelle Bord; Pascal Tardy; Francis Menil
The 63rd IEEE Electronic Component and Technology Conference (ECTC) | 2013
Warda Benhadjala; Isabelle Bord; Laurent Bechou; Ephraim Suhir; Matthieu Buet; Fabien Rougé; Vincent Gaud; Yves Ousten
The 62th Electronic Components ad Technology Conference (ECTC) | 2012
Warda Benhadjala; Isabelle Bord; Laurent Bechou; Ephraim Suhir; Matthieu Buet; Fabien Rougé; Yves Ousten