J. Lenzner

Dielectric functions (1 to 5 eV) of wurtzite MgxZn1−xO (x⩽0.29) thin films

The optical dielectric functions for polarization perpendicular and parallel to the c-axis (optical axis) of pulsed-laser-deposition grown wurtzite MgxZn1−xO (0⩽x⩽0.29) thin films have been determined at room temperature using ellipsometry for photon energies from 1 to 5 eV. The dielectric functions reveal strong excitonic contributions for all Mg concentrations x. The band gap energies (E0A=3.369 eV for ZnO to 4.101 eV for x=0.29) show a remarkable blueshift. The exciton binding energy (61 meV for ZnO) decreases to approximately 50 meV for x≈0.17 and increases to approximately 58 meV for x=0.29. In contrast to ZnO, the MgxZn1−xO alloys are found uniaxial negative below the band gap energy, opposite to previously reported results.

Lateral homogeneity of Schottky contacts on n-type ZnO

The electrical properties of Schottky contacts (SCs) produced ex situ on n-type ZnO single crystals and epitaxial thin films were investigated. Electron beam induced current imaging was used to study lateral variations of the current induced in the space charge region of the SC. Further, the effective barrier height was determined by current–voltage and capacitance–voltage measurements. Pd contacts prepared on ZnO thin films that had undergone treatment in a plasma-enhanced chemical vapor deposition with nitrous oxide (N2O) as ambient gas are laterally homogeneous with an effective barrier height of (600±30) meV.

Phosphorus acceptor doped ZnO nanowires prepared by pulsed-laser deposition

Phosphorus-doped ZnO (ZnO:P) nanowires were successfully prepared by a novel high-pressure pulsed-laser deposition process using phosphorus pentoxide as the dopant source. Detailed cathodoluminescence studies of single ZnO:P nanowires revealed characteristic phosphorus acceptor-related peaks: neutral acceptor-bound exciton emission (A0, X, 3.356 eV), free-to-neutral-acceptor emission (e, A0, 3.314 eV), and donor-to-acceptor pair emission (DAP, ~3.24 and ~3.04 eV). This means that stable acceptor levels with a binding energy of about 122 meV have been induced in the nanowires by phosphorus doping. Moreover, the induced acceptors are distributed homogeneously along the doped nanowires.

Properties of reactively sputtered Ag, Au, Pd, and Pt Schottky contacts on n-type ZnO

Highly rectifying Ag, Au, Pd, and Pt Schottky contacts have been fabricated on heteroepitaxial pulsed-laser deposited ZnO-thin films by reactive sputtering. X-ray photoelectron spectroscopy revealed an oxidation of the Ag, Pd, and Pt contact material; the gold contacts are purely metallic. The necessity of a conductive capping of the oxidized contacts is proven by photocurrent measurements of AgxO contacts. The ideality factors and the effective barrier heights were determined by current-voltage measurements. Capacitance-voltage and temperature dependent current-voltage measurements were furthermore carried out to determine the mean barrier height, the standard deviation and the respective voltage dependencies taking lateral fluctuations of the barrier height into account.

Homogeneous core/shell ZnO/ZnMgO quantum well heterostructures on vertical ZnO nanowires.

Low-area density ZnO nanowire arrays, growing perpendicularly to the substrate, are synthesized with high-pressure pulsed laser deposition. The introduction of a ZnO buffer layer enables us to fabricate individual nanowires several micrometres apart (area density<0.1 nanowire microm(-2)), suppressing any shadowing effect by neighbouring nanowires during subsequent growth. These low density ZnO nanowires, whose c-axis is perpendicular to the substrate surface, are then used as templates to grow ZnO/ZnMgO core-shell nanowire heterostructures with conventional low-pressure pulsed laser deposition. Cathodoluminescence spectroscopy as well as transmission electron microscopy show that a sharp interface forms between the ZnO core and the ZnMgO shell. Based on these findings, we have grown a series of radial ZnO/ZnMgO quantum wells with different thicknesses that exhibit quantum confinement effects, with thicker quantum wells emitting at lower energies. Spatially resolved cathodoluminescence confirms the homogeneity of the quantum well structure along the full nanowire length of about 3 microm.

Identification of pre-breakdown mechanism of silicon solar cells at low reverse voltages

The local breakdown of commercial silicon solar cells occurring at reverse voltages of only 3–4 V has been investigated by means of current-voltage measurements, dark lock-in thermography, and reverse-biased electroluminescence (ReBEL) with a spatial resolution on the micrometer-scale. It is shown that the origin of the local breakdown (so-called type I) can be traced back to a contamination of the wafer surface with Al particles prior to the phosphorous diffusion step. A model is presented explaining that the spectral maximum of ReBEL is within the visible range.

Control of interface abruptness of polar MgZnO/ZnO quantum wells grown by pulsed laser deposition

A strong quantum confined Stark effect (QCSE) was observed in wedge shaped MgZnO/ZnO quantum wells (QWs) grown by pulsed laser deposition. A reduced laser fluence of 1.8 J/cm2 was used. Reference samples grown at higher standard fluence 2.4 J/cm2 showed only a negligible QCSE. Using off-axis deposition without substrate rotation, a constant composition of the barriers was maintained while varying the well width in a wedge shaped QW. A redshift of the QW luminescence with increasing QW thickness up to 230 meV below the ZnO emission was found, accompanied by an increase in the exciton lifetime from 0.3 ns up to 4.2 μs.

Lattice parameters and Raman-active phonon modes of β-(AlxGa1−x)2O3

We present X-ray diffraction and Raman spectroscopy investigations of a (100)-oriented (AlxGa1–x)2O3 thin film on MgO (100) and bulk-like ceramics in dependence on their composition. The thin film grown by pulsed laser deposition has a continuous lateral composition spread allowing to determine precisely the dependence of the phonon mode properties and lattice parameters on the chemical composition. For x < 0.4, we observe the single-phase β-modification. Its lattice parameters and phonon energies depend linearly on the composition. We determined the slopes of these dependencies for the individual lattice parameters and for nine Raman lines, respectively. While the lattice parameters of the ceramics follow Vegards rule, deviations are observed for the thin film. This deviation has only a small effect on the phonon energies, which show a reasonably good agreement between thin film and ceramics.

Lattice parameters and Raman-active phonon modes of (InxGa1–x)2O3 for x < 0.4

We present X-ray diffraction and Raman spectroscopy investigations of (InxGa1–x)2O3 thin films and bulk-like ceramics in dependence of their composition. The thin films grown by pulsed laser deposition have a continuous lateral composition spread allowing the determination of phonon mode properties and lattice parameters with high sensitivity to the composition from a single 2-in. wafer. In the regime of low indium concentration, the phonon energies depend linearly on the composition and show a good agreement between both sample types. We determined the slopes of these dependencies for eight different Raman modes. While the lattice parameters of the ceramics follow Vegards rule, deviations are observed for the thin films. Further, we found indications of the high-pressure phase InGaO3 II in the thin films above a critical indium concentration, its value depending on the type of substrate.

Fresnoite thin films grown by pulsed laser deposition: photoluminescence and laser crystallization

Fresnoite (Ba2TiSi2O8–BTS) thin films were grown on fused quartz, silicon (100), MgO (100), and a-plane sapphire by pulsed laser deposition, and crystallized by subsequent thermal or flash lamp annealing. The corresponding texture evolution of the BTS thin films was studied by X-ray diffraction. The preferential (001) texture of the crystallised BTS films was found to be most pronounced on sapphire substrates. The broad photoluminescence band of the BTS thin films depends only weakly on temperature. The intensity of the BTS luminescence can be as high as that of the most efficient oxide scintillator materials. In order to qualify the fresnoite thin films for photonic applications, we demonstrate infrared-laser direct writing in amorphous BTS films which allows a local crystallisation and patterning. A subsequent considerable enhancement of luminescence intensity can be applied for UV-sensitive marking of nearly any object.