Jack L. Glover

Measurement of the O2O3O4 and O3O4O5 Super Coster-Kronig Rates in Tungsten via Asymmetric Diffraction Spectrometry

The tungsten Lγ transitions between 11 and 12 keV and Kα transitions from 57 to 60 keV were produced by a laboratory electron-bombarded x-ray source and simultaneously recorded with high resolution by using multiple diffraction planes of the same quartz crystal operating in Cauchois transmission geometry. The W Kα transitions were dispersed by the (5 0 2) planes, which were perpendicular to the crystal entrance surface, and by the (6 0 2), (7 0 2), and (8 0 4) planes which were rotated with respect to the (5 0 2) planes by angles up to 4.80°. The W Lγ transitions were dispersed by the (2 0 1) planes rotated from the (5 0 2) planes by 4.01°. The spectra from the five planes were simultaneously recorded on image plate detectors, and spectra were also recorded by scanning solid-state electronic detectors with narrow slits across the spectral lines. The metrology of the L and K shell spectra diffracted from multiple quartz planes enabled the detailed analysis of the detector spatial resolution and accurate measurement of the instrumental broadening produced by the various quartz diffraction planes. The W Lγ spectra had the highest instrumental resolving power, 1800, permitting for the first time the resolution of the blended Lγ4 (L1O2) and Lγ4 (L1O3) transitions. After subtracting the instrumental and detector contributions to the line widths, the remainder was assigned to the natural line widths. The measured widths of the O2 and O3 levels were 2.9 eV and 1.9 eV, respectively, and based on atomic code calculations these widths are attributed to the O2O3O4 and O3O4O5 super Coster–Kronig processes. This work demonstrates the ability to simultaneously record high resolution (<1 eV) L and K spectra to determine the line shapes of the heavy elements (e.g. W through Am) by using multiple planes of a single quartz crystal and to accurately measure the non-radiative super Coster–Kronig rates which are closely related to the energy level structure of the outer shells of the heavy elements.

Ultra-thin curved transmission crystals for high resolving power (up to E/ΔE = 6300) x-ray spectroscopy in the 6–13 keV energy range

Ultra-thin curved transmission crystals operating in the Cauchois spectrometer geometry were evaluated for the purpose of achieving high spectral resolution in the 6-13 keV x-ray energy range. The crystals were silicon (111) and sapphire R-cut wafers, each 18 μm thick, and a silicon (100) wafer of 50-μm thickness. The W Lα(1) spectral line at 8.398 keV from a laboratory source was used to evaluate the resolution. The highest crystal resolving power, E/ΔE=6300, was achieved by diffraction from the (33-1) planes of the Si(100) wafer that was cylindrically bent to a radius of curvature of 254 mm, where the (33-1) planes have an asymmetric angle of 13.26° from the normal of the crystal surface facing the x-ray source. This work demonstrates the ability to measure highly resolved line shapes of the K transitions of the elements Fe through Kr and the L transitions of the elements Gd through Th using a relatively compact spectrometer optical system and readily available thin commercial wafers. The intended application is as a diagnostic of laser-produced plasmas where the presence of multiple charged states and broadenings from high temperature and density requires high-resolution methods that are robust in a noisy source environment.

Transmission crystal x-ray spectrometer covering the 6 keV–18 keV energy range with E/ΔE = 1800 instrumental resolving powera)

A high-resolution x-ray spectrometer utilizing a thin quartz transmission crystal and covering the 6 keV-18 keV energy range has been developed and tested. The spectrometer consists of a cylindrically bent crystal in a vacuum housing. The crystal position and the range of Bragg angles that are incident on the crystal can be adjusted to record an ≈4 keV wide spectrum in the 6 keV-18 keV range. The spectrometer is of the Cauchois type and has a compact linear geometry that is convenient for deployment at laser-produced plasma, EBIT, and other x-ray sources. Test spectra of the W L and Mo K lines from laboratory sources have linewidths as small as 11 eV, approaching the natural widths, and instrumental resolving power as high as 1800. Techniques for enhancing the energy resolution are experimentally demonstrated.

Measurements and standards for bulk-explosives detection

Recent years have seen a dramatic expansion in the application of radiation and isotopes to security screening. This has been driven primarily by increased incidents involving improvised explosive devices as well as their ease of assembly and leveraged disruption of transportation and commerce. With global expenditures for security-screening systems in the hundreds of billions of dollars, there is a pressing need to develop, apply, and harmonize standards for x-ray and gamma-ray screening systems used to detect explosives and other contraband. The National Institute of Standards and Technology has been facilitating the development of standard measurement tools that can be used to gauge the technical performance (imaging quality) and radiation safety of systems used to screen luggage, persons, vehicles, cargo, and left-behind objects. After a review of this new suite of national standard test methods, test objects, and radiation-measurement protocols, we highlight some of the technical trends that are enhancing the revision of baseline standards. Finally we advocate a more intentional use of technical-performance standards by security stakeholders and outline the advantages this would accrue.

An objectively-analyzed method for measuring the useful penetration of x-ray imaging systems.

The ability to detect wires is an important capability of the cabinet x-ray imaging systems that are used in aviation security as well as the portable x-ray systems that are used by domestic law enforcement and military bomb squads. A number of national and international standards describe methods for testing this capability using the so called useful penetration test metric, where wires are imaged behind different thicknesses of blocking material. Presently, these tests are scored based on human judgments of wire visibility, which are inherently subjective. We propose a new method in which the useful penetration capabilities of an x-ray system are objectively evaluated by an image processing algorithm operating on digital images of a standard test object. The algorithm advantageously applies the Radon transform for curve parameter detection that reduces the problem of wire detection from two dimensions to one. The sensitivity of the wire detection method is adjustable and we demonstrate how the threshold parameter can be set to give agreement with human-judged results. The method was developed to be used in technical performance standards and is currently under ballot for inclusion in a US national aviation security standard.

Measurement of high-energy (10-60 keV) x-ray spectral line widths with eV accuracy.

A high resolution crystal spectrometer utilizing a crystal in transmission geometry has been developed and experimentally optimized to measure the widths of emission lines in the 10-60 keV energy range with eV accuracy. The spectrometer achieves high spectral resolution by utilizing crystal planes with small lattice spacings (down to 2d = 0.099 nm), a large crystal bending radius and Rowland circle diameter (965 mm), and an image plate detector with high spatial resolution (60 μm in the case of the Fuji TR image plate). High resolution W L-shell and K-shell laboratory test spectra in the 10-60 keV range and Ho K-shell spectra near 47 keV recorded at the LLNL Titan laser facility are presented. The Ho K-shell spectra are the highest resolution hard x-ray spectra recorded from a solid target irradiated by a high-intensity laser.

Studying the Statistics of Natural X-ray Pictures

In this article, we have studied and analyzed the statistics of both pristine and distorted bandpass X-ray images. In the past, we have shown that the statistics of natural, bandpass-filtered visible light (VL) pictures, commonly expressed by natural scene statistic (NSS) models, can be used to create remarkably powerful, perceptually relevant predictors of perceptual picture quality. We find that similar models can be developed that apply quite well to X-ray image data. We have also studied the potential of applying these statistical X-ray NSS models to the design of algorithms for automatic image quality prediction of X-ray images, such as might occur in security, medicine, and material inspection applications. As a demonstration of the discrimination power of these models, we devised an application of NSS models to an image modality classification task, whereby VL, X-ray, infrared, and millimeter-wave images can be effectively and automatically distinguished. Our study is conducted on a dataset of X-ray images made available by the National Institute of Standards and Technology.

The Metrology of a Rastered Spot of X Rays used in Security Screening.

In recent times, ionizing radiation has been used around the world to screen persons for non-medical purposes, namely to detect bulk explosives or other contraband hidden on the body including materials not registered by metal detectors. In contrast to conventional transmission or projection imaging, backscatter and forward-scatter systems employ a “flying spot” of x rays and large-area detectors. A small spot is rastered across an individual and the Compton scatter signal collected by these detectors is quickly integrated and assigned to a pixel value in an image corresponding to the transient location of the small flying spot. These systems have been controversial due in part to possible radiation health risks, and lack of independent and accurate measurements of radiation exposures to the subjects, bystanders, and operators of such systems. In this paper we will outline the techniques and instrumentation used at the National Institute of Standards and Technology (NIST) to accurately determine the incident air kerma from a swept beam of x rays. We discuss in detail the response of a large-area free-air ionization chamber under the unusual temporal and spatial radiation fields delivered by commercial scanning systems and report typical values for air kerma levels as well as estimates of air kerma rates.

Testing the Image Quality of Cabinet X-ray Systems for Security Screening: The Revised ASTM F792 Standard

ASTM F792, Standard Practice for Evaluating the Imaging Performance of Security X-ray Systems, provides test objects and methods for measuring the imaging performance of cabinet X-ray systems used at security checkpoints. The standard is widely used, with many thousands of ASTM F792 test objects utilized throughout the world. The last major revision of the standard was more than 15 years ago (2001), and since that time, several deficiencies have been noted when using the standard for testing modern systems employing multiple-view and multiple-energy configurations. Accordingly, the present work describes a new revision of the ASTM F792 standard realized as a trifurcation into three parts, each with its own separate test object and associated test method. The three parts of the standard are intended for routine testing, human-perception testing, and objective technical testing, and represent a major update to this venerable standard.

Multivariate Statistical Approach to Image Quality Tasks

Many existing Natural Scene Statistics-based no reference image quality assessment (NR IQA) algorithms employ univariate parametric distributions to capture the statistical inconsistencies of bandpass distorted image coefficients. Here we propose a multivariate model of natural image coefficients expressed in the bandpass spatial domain that has the potential to capture higher-order correlations that may be induced by the presence of distortions. We analyze how the parameters of the multivariate model are affected by different distortion types, and we show their ability to capture distortion-sensitive image quality information. We also demonstrate the violation of Gaussianity assumptions that occur when locally estimating the energies of distorted image coefficients. Thus we propose a generalized Gaussian-based local contrast estimator as a way to implement non-linear local gain control, that facilitates the accurate modeling of both pristine and distorted images. We integrate the novel approach of generalized contrast normalization with multivariate modeling of bandpass image coefficients into a holistic NR IQA model, which we refer to as multivariate generalized contrast normalization (MVGCN). We demonstrate the improved performance of MVGCN on quality relevant tasks on multiple imaging modalities, including visible light image quality prediction and task success prediction on distorted X-ray images.