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James F. Gallander

Ohio Agricultural Research and Development Center

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Featured researches published by James F. Gallander.

American Journal of Enology and Viticulture | 1988

Comparison of Seyval blanc Wine Aged in Barrels and Stainless Steel Tanks with Oak Chips

Karl L. Wilker; James F. Gallander

American Journal of Enology and Viticulture | 1983

Effect of pH and Sulfur Dioxide on the Rate of Malolactic Fermentation in Red Table Wines

Jim-Wen R. Liu; James F. Gallander

American Journal of Enology and Viticulture | 1987

Effect of American and French Oak Barrels on the Phenolic Composition and Sensory Quality of Seyval blanc Wines

James A. Jindra; James F. Gallander

American Journal of Enology and Viticulture | 1983

Effect of Grape Maturity on the Composition and Quality of Ohio Vidal Blanc Wines

James F. Gallander

American Journal of Enology and Viticulture | 1987

Effect of Juice Clarification on the Composition and Quality of Eastern US Table Wines

Jim-Wen R. Liu; James F. Gallander; Karl L. Wilker

Journal of Food Science | 2006

Methyl Anthranilate Content of Ohio Concord Grapes

Jim-Wen R. Liu; James F. Gallander

American Journal of Enology and Viticulture | 1982

Effect of Insoluble Solids on the Sulfur Dioxide Content and Rate of Malolactic Fermentation in White Table Wines

Jim-Wen R. Liu; James F. Gallander

American Journal of Enology and Viticulture | 1989

Comparison of Seyval blanc Wines Aged with Air- and Kiln-Dried American White Oak

Karl L. Wilker; James F. Gallander

Journal of Food Science | 1963

The chemical composition of maple sugar sand.

D. Robert Davis; James F. Gallander; John Hacskaylo; Wilbur A. Gould; C. O. Willits

Archive | 2000

2000 Ohio-Grape Wine Short Course

Roland Riesen; Henry Work; Phil Burton; Jim Yerkes; Tim DiPlacido; Nick Ferrante; Andrew Walker; Doniella Winchell; Thomas Henick-Kling; James F. Gallander; Todd Steiner; Tony Debevc; Pascal Durand; Leslie Weston; Fran Massaro; M. A. Ellis; O. Erincik; L. V. Madden; Dave Ferree; Arnie Esterer; Ron Barrett; David M. Scurlock; John C. Schmid; H. A. J. Hoitink; Matthew S. Krause; Randy Zondag; Roger N. Williams; Dan S. Fickle

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