James H. Tutt

First results from a next-generation off-plane X-ray diffraction grating

Future NASA X-ray spectroscopy missions will require high throughput, high resolving power grating spectrometers. Off-plane reflection gratings are capable of meeting the performance requirements needed to realize the scientific goals of these missions. We have identified a novel grating fabrication method that utilizes common lithographic and microfabrication techniques to produce the high fidelity groove profile necessary to achieve this performance. Application of this process has produced an initial pre-master that exhibits a radial (variable line spacing along the groove dimension), high density (> 6000 grooves/mm), laminar profile. This pre-master has been tested for diffraction efficiency at the BESSY II synchrotron light facility and diffracts up to 55 % of incident light into usable spectral orders. Furthermore, tests of spectral resolving power show that these gratings are capable of obtaining resolving powers well above 1300 (λ/Δλ) with limitations due to the test apparatus, not the gratings. Obtaining these results has provided confidence that this fabrication process is capable of producing off-plane reflection gratings for the next generation of X-ray observatories.

Mitigating radiation-induced charge transfer inefficiency in full-frame CCD applications by 'pumping' traps

The charge transfer efficiency of a CCD is based on the average level of signal lost per pixel over a number of transfers. This value can be used to directly compare the relative performances of different structures, increases in radiation damage or to quantify improvements in operating parameters. This number does not however give sufficient detail to mitigate for the actual signal loss/deference in either of the transfer directions that may be critical to measuring shapes to high accuracy, such as those required in astronomy applications (e.g. for Gaia’s astrometry or the galaxy distortion measurements for Euclid) based in the radiation environment of space. Pocket-pumping is an established technique for finding the location and activation levels of traps; however, a number of parameters in the process can also be explored to identify the trap species and location to sub-pixel accuracy. This information can be used in two ways to increase the sensitivity of a camera. Firstly, the clocking process can be optimised for the time constant of the majority of traps in each of the transfer directions, reducing deferred charge during read out. Secondly, a correction algorithm can be developed and employed during the post-processing of individual frames to move most of any deferred signal back into the charge packet it originated from. Here we present the trap-pumping techniques used to optimise the charge transfer efficiency of p- and n-channel e2v CCD204s and describe the use of trap-pumped images for on-orbit calibration and ground based image correction algorithms.

The Noise Performance of Electron-Multiplying Charge-Coupled Devices at X-ray Energies

Electron-multiplying charge-coupled devices (EM-CCDs) are used in low-light-level (L3) applications for detecting optical, ultraviolet, and near-infrared photons (10-1100 nm). The on-chip gain process is able to increase the detectability of any signal collected by the device through the multiplication of the signal before the output node. Thus, the effective readout noise can be reduced to subelectron levels, allowing the detection of single photons. However, this gain process introduces an additional noise component due to the stochastic nature of the multiplication. In optical applications, this additional noise has been characterized. The broadening of the detected peak is described by the excess noise factor. This factor tends to a value of √{2} at high gain (>; 100x). In X-ray applications, the situation is improved by the effect that Fano factor f has on the shot noise associated with X-ray photon detection (f ≈ 0.12 at X-ray energies). In this paper, the effect of the detection of X-ray photons in silicon is assessed both analytically and through a Monte Carlo model of the gain amplification process. The excess noise on the signal is predicted (termed the modified Fano factor) for photon detection in an EM-CCD at X-ray energies. A hypothesis is made that the modified Fano factor should tend to 1.115 at high levels of gain (>; 10x). In order to validate the predictions made, measurements were taken using an 55Fe source with Mn k-alpha X-ray energy of 5898 eV. These measurements allowed the hypothesis to be verified.

A study of electron-multiplying CCDs for use on the International X-ray Observatory off-plane x-ray grating spectrometer

CCDs are regularly used as imaging and spectroscopic devices on space telescopes at X-ray energies due to their high quantum efficiency and linearity across the energy range. The International X-ray Observatorys X-ray Grating Spectrometer will also look to make use of these devices across the energy band of 0.3 keV to 1 keV. At these energies, when photon counting, the charge generated in the silicon is close to the noise of the system. In order to be able to detect these low energy X-ray events, the system noise of the detector has to be minimised to have a sufficient signal-to-noise-ratio. By using an EM-CCD instead of a conventional CCD, any charge that is collected in the device can be multiplied before it is read out and as long as the EM-CCD is cool enough to adequately suppress the dark current, the signal-to-noise ratio of the device can be significantly increased, allowing soft X-ray events to be more easily detected. This paper will look into the use of EM-CCDs for the detection of low energy X-rays, in particular the effect that using these devices will have on the signal to noise ratio as well as any degradation in resolution and FWHM that may occur due to the additional shot noise on the signal caused by the charge packet amplification process.

Improving the spatial resolution of soft X-ray detection using an Electron-Multiplying Charge-Coupled Device

The Super Advanced X-ray Emission Spectrometer (SAXES) is an instrument at the Swiss Light Source designed for Resonant Inelastic X-ray Scattering with an energy resolution (E/ΔE) better than 12000 at 930 eV. Improvements to the instrument have been predicted that could allow the energy resolution to be improved by a factor of two. To achieve this, the spatial resolution of the detector (currently a Charge-Coupled Device, CCD) over which the energy spectrum is dispersed would have to be improved to better than 5 μm. X-ray photons with energies between a few hundred to a few thousand electron volts primarily interact within the field-free region of back-illuminated CCDs, where each photon forms an electron cloud that diffuses isotropically before reaching the depleted region close to the electrodes. Each photons electron cloud is likely to be detected as an event with signal split across multiple pixels. Analysing these split events using centroiding techniques allows the photons interaction position to be determined to a sub-pixel level. PolLux is a soft X-ray microspectroscopy endstation at the Swiss Light Source that can focus 200 eV to 1200 eV X-rays to a spot size of approximately 20 nm. Previous studies using data taken with a linear scan across the centre of a pixel in 3 μm steps predicted an improved resolution by applying centroiding techniques and using an Electron-Multiplying CCD (EM-CCD). In this study, a full 2D map of the centroiding accuracy in the pixel is presented, formed by rastering in two dimensions across the image plane in single micron steps. The improved spatial resolution from centroiding events in the EM-CCD in all areas of the pixel over the standard CCD is attributed to the improved signal to noise ratio provided by the multiplication register even at high pixel readout speeds (tens of MHz).

The Noise Performance of Electron-Multiplying Charge-Coupled Devices at Soft X-Ray Energy Values

The use of electron-multiplying charge-coupled devices (CCDs) for high-resolution soft X-ray spectroscopy has been proposed in previous studies, and the analysis that followed experimentally identified and verified a modified Fano factor for X-ray detection using an 55Fe X-ray source. However, further experiments with soft X-rays at 1000 eV were less successful, attributed to excessive split events. More recently, through the use of deep-depletion e2v CCD220 and on-chip binning, it has been possible to greatly reduce the number of split events, allowing the result for the modified Fano factor at soft X-ray energy values to be verified. This paper looks at the earlier attempt to verify the modified Fano factor at 1000 eV with e2v CCD97 and shows the issues created by splitting of the charge cloud between pixels. It then compares these earlier results with new data collected using e2v CCD220, investigating how split-event reduction allows the modified Fano factor to be verified for low-energy X-rays.

Line spread functions of blazed off-plane gratings operated in the Littrow mounting

Abstract. Future soft x-ray (10 to 50 Å) spectroscopy missions require higher effective areas and resolutions to perform critical science that cannot be done by instruments on current missions. An x-ray grating spectrometer employing off-plane reflection gratings would be capable of meeting these performance criteria. Off-plane gratings with blazed groove facets operating in the Littrow mounting can be used to achieve excellent throughput into orders achieving high resolutions. We have fabricated two off-plane gratings with blazed groove profiles via a technique that uses commonly available microfabrication processes, is easily scaled for mass production, and yields gratings customized for a given mission architecture. Both fabricated gratings were tested in the Littrow mounting at the Max Planck Institute for Extraterrestrial Physics (MPE) PANTER x-ray test facility to assess their performance. The line spread functions of diffracted orders were measured, and a maximum resolution of 800±20 is reported. In addition, we also observe evidence of a blaze effect from measurements of relative efficiencies of the diffracted orders.

Performance testing of an off-plane reflection grating and silicon pore optic spectrograph at PANTER

Abstract. An x-ray spectrograph consisting of aligned, radially ruled off-plane reflection gratings and silicon pore optics (SPO) was tested at the Max Planck Institute for Extraterrestrial Physics PANTER x-ray test facility. SPO is a test module for the proposed Arcus mission, which will also feature aligned off-plane reflection gratings. This test is the first time two off-plane gratings were actively aligned to each other and with an SPO to produce an overlapped spectrum. We report the performance of the complete spectrograph utilizing the aligned gratings module and plans for future development.

Developing a high-resolution x-ray imager using electron-multiplying (EM) CCDs

Applications at synchrotron facilities such as macromolecular crystallography and high energy X-ray diffraction require high resolution imaging detectors with high dynamic range and large surface area. Current systems can be split into two main categories: hybrid pixel detectors and scintillator-coupled Charge-Coupled Devices (CCDs). Whilst both have limitations, CCD-based systems (coupled to fibre-optics to increase imaging area) are often used in these applications due to their small pixels and the high resolution. Electron-Multiplication CCDs (EM-CCDs) are able to suppress the readout noise associated with increased readout speed offering a low noise, high speed detector solution. A previous pilot study using a small-area (8 mm × 8 mm) scintillator-coupled EM-CCD found that through high frame-rates, low noise and novel uses of photon-counting, resolution could be improved from over 80 μm to 25 μm at 2 fps. To further improve this detector system, high speed readout electronics can be used alongside a fibre-optic taper and EM-CCD to create a “best of both worlds” solution consisting of the high resolution of a CCD, along with the low noise, high speed (high dynamic range) and large effective area of pixel detectors. This paper details the developments in the study and discusses the latest results and their implication on the system design.

High-resolution soft x-ray spectrometry using the electron-multiplying charge-coupled device (EM-CCD)

The Electron-Multiplying Charge-Coupled Device (EM-CCD) shares a similar structure to the CCD except for the inclusion of a gain register that multiplies signal before the addition of read-noise, offering sub-electron effective readnoise at high frame-rates. EM-CCDs were proposed for the dispersive spectrometer on the International X-ray Observatory (IXO) to bring sub-300 eV X-rays above the noise, increasing the science yield. The high-speed, low-noise performance of the EMCCD brought added advantages of reduced dark current and stray-light per frame, reducing cooling and filtering requirements. To increase grating efficiency, several diffracted spectral orders were co-located so the inherent energy resolution of the detector was required for order separation. Although the spectral resolution of the EM-CCD is degraded by the gain process, it was shown that the EM-CCD could achieve the required separation. The RIXS spectrometer at the Advanced Resonant Spectroscopy beamline (ADRESS) of the Swiss Light Source (SLS) at the Paul Scherrer Institute currently uses a CCD, with charge spreading between pixels limiting the spatial resolution to 24 μm (FWHM). Through improving the spatial resolution below 5 μm alongside upgrading the grating, a factor of two energy resolution improvement could theoretically be made. With the high-speed, low-noise performance of the EM-CCD, photon-counting modes could allow the use of centroiding techniques to improve the resolution. Using various centroiding techniques, a spatial resolution of 2 μm (FWHM) has been achieved experimentally, demonstrating the benefits of this detector technology for soft X-ray spectrometry. This paper summarises the use of EM-CCDs from our first investigations for IXO through to our latest developments in ground-based testing for synchrotron-research and looks beyond to future possibilities.