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Featured researches published by Jamie T. Westbrook.


SID Symposium Digest of Technical Papers | 2011

45.2: Two Point Bending of Thin Glass Substrate

Suresh T. Gulati; Jamie T. Westbrook; Stephen H. Carley; Hemanth Vepakomma; Toshihiko Ono

The two-point bend test has been used extensively for optical fiber strength and fatigue measurements. This paper extends the theory of 2-point bending to thin glass substrates. The key advantages of the 2-point bend test are 1) the simplicity of a test fixture and its operation, 2) the uniformity of a bend stress along the width of a substrate, 3) the inverse relationship between a bend stress and parallel plate spacing, and 4) the non-contact bending.


IEEE\/OSA Journal of Display Technology | 2013

Finite Element Analysis of Four-Point Bending of LCD Panels

K. H. Vepakomma; Jamie T. Westbrook; Stephen H. Carley; Jum Sik Kim

The four-point bend test is one of the most popular strength testing methods used to test LCD panels. Traditionally, a panel is assumed to be either a monolithic piece of glass or two independent pieces of glass sliding against each other. This paper uses finite element analysis to show that a panel behaves like a monolithic piece of glass in the epoxy region (near the edges) but behaves like two pieces of glass at the center. Assuming a panel to be a monolithic piece of glass may overpredict the stresses by a factor of two at the center. Similarly, assuming a panel to be two pieces of glass may underpredict the stresses by a factor of two at the edges. During four-point testing of a panel, the stresses are not uniform in the load-span region and so finite element analysis is required to obtain an accurate stress distribution.


IEEE\/OSA Journal of Display Technology | 2013

Finite Element Analysis of Ring-on-Ring Test on LCD Panels

K. H. Vepakomma; Jamie T. Westbrook; Stephen H. Carley; Jum Sik Kim

The ring-on-ring test is one of the most popular surface strength testing methods used to test LCD panels. This paper uses finite element analysis to show that a panel behaves like two independent pieces of glass during a ring-on-ring test. The epoxy region where the color filter and thin-film transistor (TFT) glasses are glued together does not affect the stress at the center. As LCD panels get thinner, the contribution of membrane stress increases significantly. Because the color filter and TFT glasses act independently, they experience maximum principal stresses within 15% of each other. For deflections greater than one-half (sometimes one-fourth) the glass thickness, the stresses are not uniform inside the load ring, requiring finite element analysis to obtain an accurate stress distribution.


SID Symposium Digest of Technical Papers | 2010

72.2: Strength Measurements of Thin AMLCD Panels

Jamie T. Westbrook; John Frederick Bayne; Tim A. Roe; Jum Sik Kim; Po-Hua Su; Toshihiko Ono; Suresh T. Gulati

The biaxial strength using ring-on-ring (ROR) test and uniaxial strength using 4-point bend test (4PB) were measured for 13.3″ panels with substrate thicknesses ranging from 0.25 mm to 0.5 mm. The effect of thinning process was quantified by these data along with identifying break sources using fractography. Strain gages were used to convert failure load to strength.


Archive | 2009

BEZEL PACKAGING FOR SEALED GLASS ASSEMBLIES AND A GLASS ASSEMBLY THEREFOR

John Frederick Bayne; Yabei Gu; Glenn V. Morgan; Butchi Reddy Vaddi; Jamie T. Westbrook; Sujanto Widjaja


Archive | 2006

Bezel packaging of frit-sealed OLED devices

John Frederick Bayne; Jamie T. Westbrook; Sujanto Widjaja


SID Symposium Digest of Technical Papers | 2012

73.3: Invited Paper: Four Point Bending of AMLCD Panel

Jamie T. Westbrook; John Frederick Bayne; Stephen H. Carley; K. Hemanth Vepakomma; Jum Sik Kim; Suresh T. Gulati


Journal of the American Ceramic Society | 2015

Nonbuckling Vertical Four‐Point Bend Setup for Measuring Edge Strength of Thin Glass

K. Hemanth Vepakomma; Stephen H. Carley; Jamie T. Westbrook; Glenn V. Morgan


Archive | 2018

Frit Sealing of OLED Displays

Robert Michael Morena; John Frederick Bayne; Jamie T. Westbrook; Sujanto Widjaja; Lu Zhang


SID Symposium Digest of Technical Papers | 2014

P-64: Eliminating Buckling in Vertical Four-Point Bend Testing

K. Hemanth Vepakomma; Stephen H. Carley; Jamie T. Westbrook; Glenn V. Morgan; Robert D. White

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