John Frederick Bayne
Corning Inc.
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Featured researches published by John Frederick Bayne.
SID Symposium Digest of Technical Papers | 2010
Jamie T. Westbrook; John Frederick Bayne; Tim A. Roe; Jum Sik Kim; Po-Hua Su; Toshihiko Ono; Suresh T. Gulati
The biaxial strength using ring-on-ring (ROR) test and uniaxial strength using 4-point bend test (4PB) were measured for 13.3″ panels with substrate thicknesses ranging from 0.25 mm to 0.5 mm. The effect of thinning process was quantified by these data along with identifying break sources using fractography. Strain gages were used to convert failure load to strength.
SID Symposium Digest of Technical Papers | 2006
John D. Helfinstine; Suresh T. Gulati; T. A. Roe; John Frederick Bayne; Josef C. Lapp
The cylindrical bend test offers the unique advantage of stressing both the #1 and #4 surfaces along with their corresponding edges in a uniform manner thereby proofing all of the exposed surfaces to a prescribed stress value dictated by the radius of cylindrical bend fixture. Several LCD panels, comprised of Eagle 2000 and Code 1737 glasses with substrate thicknesses of 1.1 and 0.7 mm and with diagonal dimensions ranging from 5″ to 23″, were tested in the cylindrical bend fixture to stresses ranging from 34 MPa to 83 MPa. Failure modes, fracture origins and strain values on #4 surface and the edges were recorded. The stresses based on cylindrical bend theory were found to be in good agreement with those computed from measured strain components and/or mirror radius. The failure origins were observed both on #4 surface as well as on the edges depending on handling damage and the quality of edge finish. In general, edges appear to be weaker due to their i) inadequate finish and ii) greater vulnerability to handling damage during panel manufacturing.
Archive | 2011
John Frederick Bayne; James Joseph Price; Daniel Arthur Sternquist; Jaymin Amin
Archive | 2013
John Frederick Bayne; James William Brown; Albert Joseph Ii Michael; Siva Venkatachalam; Sujanto Widjaja
Archive | 2009
John Frederick Bayne; Yabei Gu; Glenn V. Morgan; Butchi Reddy Vaddi; Jamie T. Westbrook; Sujanto Widjaja
Archive | 2006
Keith J Becken; Stephan Lvovich Logunov; Aiyu Zhang; John Frederick Bayne
Archive | 2006
John Frederick Bayne; Jamie T. Westbrook; Sujanto Widjaja
Archive | 2016
John Frederick Bayne; Zhanjun Gao; Shandon Dee Hart; Guangli Hu; James Joseph Price; Chandan Kumar Saha
Archive | 2010
John Frederick Bayne
SID Symposium Digest of Technical Papers | 2012
Jamie T. Westbrook; John Frederick Bayne; Stephen H. Carley; K. Hemanth Vepakomma; Jum Sik Kim; Suresh T. Gulati